{"id":"https://openalex.org/W2150860197","doi":"https://doi.org/10.1109/iccd.2003.1240953","title":"Aggressive test power reduction through test stimuli transformation","display_name":"Aggressive test power reduction through test stimuli transformation","publication_year":2004,"publication_date":"2004-05-06","ids":{"openalex":"https://openalex.org/W2150860197","doi":"https://doi.org/10.1109/iccd.2003.1240953","mag":"2150860197"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2003.1240953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2003.1240953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 21st International Conference on Computer Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"O. Sinanoglu","raw_affiliation_strings":["Computer Science and Engineering Department, University of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006811625","display_name":"Alex Orailo\u011flu","orcid":"https://orcid.org/0000-0002-6104-3923"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Orailoglu","raw_affiliation_strings":["Computer Science and Engineering Department, University of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059987567"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":1.3165,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.80751664,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"47","issue":null,"first_page":"542","last_page":"547"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8934394121170044},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6177175641059875},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.6058405041694641},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6006818413734436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5815776586532593},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.5562729239463806},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5496693849563599},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5299381017684937},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4876193106174469},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.454422265291214},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.44661420583724976},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4432429075241089},{"id":"https://openalex.org/keywords/chain","display_name":"Chain (unit)","score":0.42755287885665894},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42028820514678955},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3258858323097229},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.26334938406944275},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.20018407702445984},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1952836811542511},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18981924653053284},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1015438437461853},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09323528409004211},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.0744962990283966}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8934394121170044},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6177175641059875},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.6058405041694641},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6006818413734436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5815776586532593},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.5562729239463806},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5496693849563599},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5299381017684937},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4876193106174469},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.454422265291214},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.44661420583724976},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4432429075241089},{"id":"https://openalex.org/C199185054","wikidata":"https://www.wikidata.org/wiki/Q552299","display_name":"Chain (unit)","level":2,"score":0.42755287885665894},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42028820514678955},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3258858323097229},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.26334938406944275},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.20018407702445984},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1952836811542511},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18981924653053284},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1015438437461853},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09323528409004211},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0744962990283966},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2003.1240953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2003.1240953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 21st International Conference on Computer Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1606262091","https://openalex.org/W1660272255","https://openalex.org/W2079150276","https://openalex.org/W2080510479","https://openalex.org/W2102168889","https://openalex.org/W2106303764","https://openalex.org/W2126641963","https://openalex.org/W2130439920","https://openalex.org/W2135622428","https://openalex.org/W2139356796","https://openalex.org/W2148192475","https://openalex.org/W2169839635","https://openalex.org/W2587271961","https://openalex.org/W6636974747","https://openalex.org/W6670351470","https://openalex.org/W6678830865"],"related_works":["https://openalex.org/W2074302528","https://openalex.org/W2147986372","https://openalex.org/W3088373974","https://openalex.org/W2019719714","https://openalex.org/W1979305473","https://openalex.org/W3109020709","https://openalex.org/W2044021627","https://openalex.org/W2154314512","https://openalex.org/W2134369540","https://openalex.org/W1981498177"],"abstract_inverted_index":{"Excessive":[0],"switching":[1],"activity":[2],"during":[3],"shift":[4],"cycles":[5],"in":[6],"scan-based":[7],"cores":[8],"imposes":[9],"considerable":[10],"test":[11,19,67,82,86,103,108],"power":[12,98],"challenges.":[13],"To":[14],"ensure":[15],"rapid":[16],"and":[17,105],"reliable":[18],"of":[20,62,81],"SOCs,":[21],"we":[22,74],"propose":[23],"a":[24,53,79],"scan":[25,38,45,48,63,90],"chain":[26,39,49,64,91],"modification":[27],"methodology":[28],"that":[29,96],"transforms":[30],"the":[31,37,60,114],"stimuli":[32,68,87],"to":[33,36,58],"be":[34,111],"inserted":[35],"through":[40,88],"logic":[41],"gate":[42],"insertion":[43],"between":[44],"cells,":[46],"reducing":[47],"transitions.":[50],"We":[51],"introduce":[52],"novel":[54],"matrix":[55],"band":[56],"algebra":[57],"formulate":[59],"impact":[61],"modifications":[65],"on":[66,71],"transformations.":[69],"Based":[70],"this":[72],"analysis,":[73],"develop":[75],"algorithms":[76],"for":[77,102,107],"transforming":[78],"set":[80],"vectors":[83,104],"into":[84],"power-optimal":[85],"cost-effective":[89],"modifications.":[92],"Experimental":[93],"results":[94],"show":[95],"scan-in":[97],"reductions":[99],"exceeding":[100],"90%":[101],"99.5%":[106],"cubes":[109],"can":[110],"attained":[112],"by":[113],"proposed":[115],"methodology.":[116]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}