{"id":"https://openalex.org/W2109850224","doi":"https://doi.org/10.1109/iccd.2003.1240927","title":"A method to find don't care values in test sequences for sequential circuits","display_name":"A method to find don't care values in test sequences for sequential circuits","publication_year":2004,"publication_date":"2004-05-06","ids":{"openalex":"https://openalex.org/W2109850224","doi":"https://doi.org/10.1109/iccd.2003.1240927","mag":"2109850224"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2003.1240927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2003.1240927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 21st International Conference on Computer Design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080764382","display_name":"Yoshinobu Higami","orcid":"https://orcid.org/0000-0002-2909-6777"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Higami","raw_affiliation_strings":["Department of Computer Science, Ehime University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ehime University, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083317982","display_name":"S. Kobayashi","orcid":"https://orcid.org/0009-0003-6241-9114"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S.Y. Kobayashi","raw_affiliation_strings":["Department of Computer Science, Ehime University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ehime University, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110073346","display_name":"Yuzo Takamatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takamatsu","raw_affiliation_strings":["Department of Computer Science, Ehime University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ehime University, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kajihara","raw_affiliation_strings":["Department of Computer Sciences and Electronics, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences and Electronics, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"I. Pomeranz","raw_affiliation_strings":["School of Electrical and Computer Eng., Purdue University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Eng., Purdue University, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.206,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.40885822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"397","last_page":"399"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7912032604217529},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.7520138025283813},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.6678102016448975},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6590375304222107},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5842387676239014},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5714396238327026},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5669600367546082},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4237421154975891},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.35459282994270325},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.33912768959999084},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.29819393157958984},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26915112137794495},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17127051949501038},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07957291603088379}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7912032604217529},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.7520138025283813},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.6678102016448975},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6590375304222107},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5842387676239014},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5714396238327026},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5669600367546082},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4237421154975891},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.35459282994270325},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.33912768959999084},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.29819393157958984},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26915112137794495},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17127051949501038},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07957291603088379},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2003.1240927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2003.1240927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 21st International Conference on Computer Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1483294133","https://openalex.org/W2090855754","https://openalex.org/W2128144345","https://openalex.org/W2135931142","https://openalex.org/W4230576944","https://openalex.org/W4230587734","https://openalex.org/W4238901649"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W2021253405","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2117873690","https://openalex.org/W3141249762","https://openalex.org/W2137555930","https://openalex.org/W2157154381","https://openalex.org/W4253743993"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2,11,15,19,26,33],"method":[3,31],"to":[4],"find":[5],"don't":[6],"care":[7],"(X)":[8],"values":[9],"in":[10],"test":[12,22,34,46],"sequence":[13,23,35],"for":[14],"sequential":[16,27],"circuit.":[17],"Given":[18],"fully":[20],"specified":[21],"generated":[24],"by":[25],"ATPG,":[28],"the":[29,44],"proposed":[30],"produces":[32],"containing":[36],"Xs":[37],"without":[38],"losing":[39],"stuck-at":[40],"fault":[41],"coverage":[42],"of":[43],"original":[45],"sequence.":[47]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}