{"id":"https://openalex.org/W4404031093","doi":"https://doi.org/10.1109/icccnt61001.2024.10725745","title":"Optimizing Automatic Test Case Generation Using Singular Value Decomposition Approach","display_name":"Optimizing Automatic Test Case Generation Using Singular Value Decomposition Approach","publication_year":2024,"publication_date":"2024-06-24","ids":{"openalex":"https://openalex.org/W4404031093","doi":"https://doi.org/10.1109/icccnt61001.2024.10725745"},"language":"en","primary_location":{"id":"doi:10.1109/icccnt61001.2024.10725745","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icccnt61001.2024.10725745","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042719748","display_name":"Manjubala Bisi","orcid":"https://orcid.org/0000-0002-9555-1520"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manjubala Bisi","raw_affiliation_strings":["National Institute of Technology,Department of Computer Science and Engineering,Warangal,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Computer Science and Engineering,Warangal,India","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101366411","display_name":"Aryan Srivastava","orcid":null},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aryan Srivastava","raw_affiliation_strings":["National Institute of Technology,Department of Computer Science and Engineering,Warangal,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Computer Science and Engineering,Warangal,India","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066742048","display_name":"Abhishek Verma","orcid":"https://orcid.org/0000-0002-3805-2506"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Abhishek Verma","raw_affiliation_strings":["National Institute of Technology,Department of Computer Science and Engineering,Warangal,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Computer Science and Engineering,Warangal,India","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079050544","display_name":"Aditya Kumar","orcid":"https://orcid.org/0000-0003-4185-4742"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aditya Kumar","raw_affiliation_strings":["National Institute of Technology,Department of Computer Science and Engineering,Warangal,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Computer Science and Engineering,Warangal,India","institution_ids":["https://openalex.org/I121750182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I121750182"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20546043,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.6244968175888062},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5483652949333191},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.5335147380828857},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.47378823161125183},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4659600853919983},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4107666611671448},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.29457515478134155},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1105947494506836},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.10059970617294312},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07035505771636963}],"concepts":[{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.6244968175888062},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5483652949333191},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.5335147380828857},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.47378823161125183},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4659600853919983},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4107666611671448},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29457515478134155},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1105947494506836},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.10059970617294312},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07035505771636963},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icccnt61001.2024.10725745","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icccnt61001.2024.10725745","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1599808047","https://openalex.org/W1971650562","https://openalex.org/W2027461913","https://openalex.org/W2040622444","https://openalex.org/W2098502158","https://openalex.org/W2126105956","https://openalex.org/W2147002252","https://openalex.org/W2283268937","https://openalex.org/W2306992465","https://openalex.org/W2531264786","https://openalex.org/W2586946380","https://openalex.org/W2745467889","https://openalex.org/W2749159177","https://openalex.org/W2908096502","https://openalex.org/W3200142270","https://openalex.org/W4291910516","https://openalex.org/W4399668074"],"related_works":["https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2131559056","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W3121932492","https://openalex.org/W4232638561","https://openalex.org/W2009690023","https://openalex.org/W2767970036"],"abstract_inverted_index":{"Test":[0],"case":[1,45,87],"generation":[2,46,88],"is":[3],"a":[4],"complex":[5],"problem":[6],"when":[7],"dealing":[8],"with":[9,16,53],"multiple":[10,83],"objectives,":[11,70],"which":[12],"hinders":[13],"search":[14],"efficiency":[15],"algorithms":[17],"like":[18],"DynaMOSA":[19],"in":[20,82,94,99],"the":[21,43,60,104],"EvoSuite":[22],"framework.":[23],"To":[24],"address":[25],"this":[26],"issue,":[27],"we":[28],"propose":[29],"SVD-DynaMOSA,":[30],"utilizing":[31],"Singular":[32],"Value":[33],"Decomposition":[34],"for":[35,64],"dimensionality":[36],"reduction.":[37],"This":[38],"approach":[39],"aims":[40],"to":[41,49],"optimize":[42],"test":[44,86,97],"process,":[47],"leading":[48],"improved":[50],"efficiency.":[51],"Experimentation":[52],"49":[54],"projects":[55],"and":[56,67],"110":[57],"classes":[58],"from":[59],"SF110":[61],"dataset,":[62],"selected":[63],"their":[65],"complexity":[66],"number":[68],"of":[69,106],"demonstrates":[71],"SVD-DynaMOSA\u2019s":[72],"superiority":[73],"over":[74],"DynaMOSA.":[75],"It":[76],"achieves":[77],"higher":[78],"or":[79],"comparable":[80],"coverage":[81],"metrics,":[84],"enhancing":[85],"performance":[89],"significantly.":[90],"SVD-DynaMOSA":[91],"shows":[92],"promise":[93],"producing":[95],"comprehensive":[96],"suites":[98],"practical":[100],"time":[101],"frames,":[102],"overcoming":[103],"limitations":[105],"current":[107],"methods.":[108]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}