{"id":"https://openalex.org/W4404030365","doi":"https://doi.org/10.1109/icccnt61001.2024.10725550","title":"Advanced Low-Power SRAM Design Techniques at 16nm Node: Combining Multi-Threshold Voltage, MOSFET Stacking, and Body Biasing","display_name":"Advanced Low-Power SRAM Design Techniques at 16nm Node: Combining Multi-Threshold Voltage, MOSFET Stacking, and Body Biasing","publication_year":2024,"publication_date":"2024-06-24","ids":{"openalex":"https://openalex.org/W4404030365","doi":"https://doi.org/10.1109/icccnt61001.2024.10725550"},"language":"en","primary_location":{"id":"doi:10.1109/icccnt61001.2024.10725550","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icccnt61001.2024.10725550","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091151406","display_name":"Rahul Sharma","orcid":"https://orcid.org/0000-0002-2440-5286"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rahul Sharma","raw_affiliation_strings":["National Institute of Technology,Department of Electronics and Communication Engineering,Warangal,Telangana,India,506004"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Electronics and Communication Engineering,Warangal,Telangana,India,506004","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051604825","display_name":"Prakash Kodali","orcid":"https://orcid.org/0000-0001-9009-7325"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Prakash Kodali","raw_affiliation_strings":["National Institute of Technology,Department of Electronics and Communication Engineering,Warangal,Telangana,India,506004"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Technology,Department of Electronics and Communication Engineering,Warangal,Telangana,India,506004","institution_ids":["https://openalex.org/I121750182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I121750182"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stacking","display_name":"Stacking","score":0.7726258635520935},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.7053921818733215},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.683340847492218},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6807511448860168},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6707645654678345},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6209660172462463},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5249954462051392},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44913119077682495},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4454635679721832},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.42658936977386475},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4213330149650574},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38879773020744324},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3841957449913025},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.24409863352775574},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22892791032791138},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1893283724784851}],"concepts":[{"id":"https://openalex.org/C33347731","wikidata":"https://www.wikidata.org/wiki/Q285210","display_name":"Stacking","level":2,"score":0.7726258635520935},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.7053921818733215},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.683340847492218},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6807511448860168},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6707645654678345},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6209660172462463},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5249954462051392},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44913119077682495},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4454635679721832},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42658936977386475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4213330149650574},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38879773020744324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3841957449913025},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.24409863352775574},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22892791032791138},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1893283724784851},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icccnt61001.2024.10725550","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icccnt61001.2024.10725550","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1753784006","https://openalex.org/W2000777538","https://openalex.org/W2004965314","https://openalex.org/W2127628206","https://openalex.org/W2306324408","https://openalex.org/W2326541585","https://openalex.org/W2344542627","https://openalex.org/W2594184919","https://openalex.org/W2609881373","https://openalex.org/W2735913833","https://openalex.org/W2804691385","https://openalex.org/W2899871389","https://openalex.org/W2951246649","https://openalex.org/W2996327265","https://openalex.org/W3093589727","https://openalex.org/W4206230113","https://openalex.org/W4283812833"],"related_works":["https://openalex.org/W2053448087","https://openalex.org/W1977042749","https://openalex.org/W2542162669","https://openalex.org/W2042881279","https://openalex.org/W2121451436","https://openalex.org/W2115248544","https://openalex.org/W1608296848","https://openalex.org/W2975003965","https://openalex.org/W2049062674","https://openalex.org/W2492111440"],"abstract_inverted_index":{"Low":[0],"power":[1,40,71,79,107],"SRAM":[2,25,75,99,104],"is":[3],"indispensable":[4],"for":[5,85],"a":[6,59,63],"multitude":[7],"of":[8,66],"applications,":[9],"spanning":[10],"embedded":[11],"systems,":[12],"systems-on-chip":[13],"(SoC),":[14],"and":[15,38,52,62,109],"wireless":[16],"electronic":[17],"devices.":[18],"This":[19],"paper":[20],"unveils":[21],"an":[22],"advanced":[23],"10T":[24,98],"cell":[26,76,100],"optimized":[27,97],"with":[28],"16nm":[29],"CMOS":[30],"technology,":[31],"meticulously":[32],"designed":[33],"to":[34,69],"curtail":[35],"both":[36],"static":[37],"dynamic":[39],"consumption.":[41],"Employing":[42],"sophisticated":[43],"techniques":[44],"such":[45],"as":[46],"body":[47],"biasing,":[48],"multiple":[49],"threshold":[50],"voltages,":[51],"MOSFET":[53],"stacking,":[54],"this":[55,96],"design":[56],"also":[57],"incorporates":[58],"control":[60],"signal":[61],"VDD":[64],"supply":[65],"0.8":[67],"volts":[68],"maximize":[70],"efficiency.":[72],"The":[73],"resultant":[74],"showcases":[77],"remarkable":[78],"savings,":[80],"rendering":[81],"it":[82],"exceptionally":[83],"suitable":[84],"power-sensitive":[86],"applications.":[87],"Comprehensive":[88],"simulations":[89],"conducted":[90],"via":[91],"Cadence":[92],"tools":[93],"highlight":[94],"that":[95],"significantly":[101],"surpasses":[102],"conventional":[103],"designs":[105],"in":[106],"efficiency":[108],"performance.":[110]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}