{"id":"https://openalex.org/W4404031056","doi":"https://doi.org/10.1109/icccnt61001.2024.10724842","title":"A Reliable and Soft Error Tolerant 12T Radiation Hardened SRAM Cell for Aerospace Applications","display_name":"A Reliable and Soft Error Tolerant 12T Radiation Hardened SRAM Cell for Aerospace Applications","publication_year":2024,"publication_date":"2024-06-24","ids":{"openalex":"https://openalex.org/W4404031056","doi":"https://doi.org/10.1109/icccnt61001.2024.10724842"},"language":"en","primary_location":{"id":"doi:10.1109/icccnt61001.2024.10724842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icccnt61001.2024.10724842","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013438160","display_name":"Soumya Sengupta","orcid":"https://orcid.org/0000-0003-2653-2059"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Soumya Sengupta","raw_affiliation_strings":["NIT Roukela,Department of Electronics and Communication Engineering,Odisha,India,769008"],"affiliations":[{"raw_affiliation_string":"NIT Roukela,Department of Electronics and Communication Engineering,Odisha,India,769008","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010973984","display_name":"Arjun Singh Yadav","orcid":"https://orcid.org/0000-0003-3594-7846"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Arjun Singh Yadav","raw_affiliation_strings":["NIT Roukela,Department of Electronics and Communication Engineering,Odisha,India,769008"],"affiliations":[{"raw_affiliation_string":"NIT Roukela,Department of Electronics and Communication Engineering,Odisha,India,769008","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5013438160"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4449,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64368123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9453999996185303,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7968580722808838},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.6967443227767944},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5611509084701538},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5261597037315369},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.522388756275177},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4598252773284912},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39373713731765747},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29674482345581055},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2036728858947754},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19334912300109863},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.19135704636573792},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.10544911026954651}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7968580722808838},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.6967443227767944},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5611509084701538},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5261597037315369},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.522388756275177},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4598252773284912},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39373713731765747},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29674482345581055},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2036728858947754},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19334912300109863},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.19135704636573792},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.10544911026954651}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icccnt61001.2024.10724842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icccnt61001.2024.10724842","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2033453286","https://openalex.org/W2083113486","https://openalex.org/W2084581976","https://openalex.org/W2150025103","https://openalex.org/W2156124136","https://openalex.org/W2494978579","https://openalex.org/W2897553417","https://openalex.org/W2996327265","https://openalex.org/W3112339708","https://openalex.org/W4293208627","https://openalex.org/W4388696008"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W2102538861","https://openalex.org/W2620706469","https://openalex.org/W1500230652","https://openalex.org/W3208260600"],"abstract_inverted_index":{"In":[0,51],"today\u2019s":[1],"state-of-the-art":[2],"VLSI":[3],"circuits,":[4],"the":[5,12,22,35,40,87,95,169,193],"SRAMs":[6],"covers":[7],"a":[8,54,132,196],"greater":[9],"part":[10],"of":[11,37,42,134,195],"chip":[13],"area.":[14],"As":[15],"technology":[16,49,130],"scales":[17],"down":[18],"and":[19,72,78,91,110,116,155,179],"moves":[20],"into":[21],"nanometer":[23],"regime,":[24],"memory":[25],"storage":[26],"elements":[27],"like":[28],"SRAM":[29,62,142],"cells":[30],"are":[31],"mostly":[32],"affected":[33],"by":[34,93],"impact":[36],"radiation.":[38],"Therefore,":[39],"rate":[41],"soft":[43,56],"error":[44,57],"generation":[45],"is":[46,64,73],"enhanced":[47],"with":[48,86],"scaling.":[50],"this":[52],"work,":[53],"reliable":[55],"tolerant":[58,70],"12":[59],"transistor":[60],"RTSC-12T":[61,82,139],"cell":[63,141,171],"proposed":[65,81,170],"that":[66],"provides":[67],"good":[68],"radiation":[69],"capability":[71],"completely":[74],"immune":[75],"to":[76],"SEU":[77,117],"SEMNU.":[79],"The":[80,120,137],"has":[83,122],"been":[84,123],"compared":[85],"existing":[88],"RHD12T,":[89],"QUCCE12T":[90,164,178],"EDP12T":[92,154,186],"considering":[94],"design":[96],"metrics":[97],"such":[98],"as":[99],"read":[100],"delay,":[101,103],"write":[102,159],"Static":[104],"Noise":[105],"Margin,":[106],"critical":[107],"charge,":[108],"static":[109,175],"dynamic":[111,182],"power":[112,176,183],"consumption,":[113],"total":[114],"area":[115],"occurrence":[118],"probability.":[119],"simulation":[121],"performed":[124],"in":[125],"UMC":[126],"65":[127],"nm":[128],"CMOS":[129],"at":[131,192],"temperature":[133],"$27^{\\circ}":[135],"\\mathrm{C}$.":[136],"Proposed":[138],"single":[140],"exhibits":[143],"$1.25":[144],"\\mathrm{x}":[145],"/":[146],"1.19":[147],"\\mathrm{x}$":[148],"shorter":[149],"$\\mathrm{T}_{R":[150],"A}$":[151],"than":[152,162,177,184],"RHD12T/":[153,163],"1.37x/":[156],"1.03x":[157],"lower":[158,174,181,198],"ability":[160],"($\\mathrm{T}_{{wA}}$)":[161],"$\\text{@}V_{D":[165],"D}=1":[166],"\\mathrm{V}$.":[167],"Also,":[168],"consumes":[172],"1.28x":[173],"1.2x/1.32x":[180],"QUCCE12T/":[185],"respectively.":[187],"However,":[188],"these":[189],"gains":[190],"come":[191],"expense":[194],"slightly":[197],"WSNM.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-10-10T00:00:00"}