{"id":"https://openalex.org/W3214395308","doi":"https://doi.org/10.1109/icccnt51525.2021.9579930","title":"Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver","display_name":"Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver","publication_year":2021,"publication_date":"2021-07-06","ids":{"openalex":"https://openalex.org/W3214395308","doi":"https://doi.org/10.1109/icccnt51525.2021.9579930","mag":"3214395308"},"language":"en","primary_location":{"id":"doi:10.1109/icccnt51525.2021.9579930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icccnt51525.2021.9579930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 12th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017015695","display_name":"P Partha Koundinya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"P Partha Koundinya","raw_affiliation_strings":["SRM University - AP, Amaravati, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"SRM University - AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045298324","display_name":"Sai Krishna Reddy Y","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sai Krishna Reddy Y","raw_affiliation_strings":["SRM University - AP, Amaravati, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"SRM University - AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028886602","display_name":"V Mani Deepak","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V Mani Deepak","raw_affiliation_strings":["SRM University - AP, Amaravati, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"SRM University - AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044282137","display_name":"K Rutwesh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K Rutwesh","raw_affiliation_strings":["SRM University - AP, Amaravati, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"SRM University - AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070847867","display_name":"Anuj Deshpande","orcid":"https://orcid.org/0000-0002-7415-1691"},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anuj Deshpande","raw_affiliation_strings":["SRM University - AP, Amaravati, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"SRM University - AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5017015695"],"corresponding_institution_ids":["https://openalex.org/I4210131147"],"apc_list":null,"apc_paid":null,"fwci":0.2959,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.62928171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.5981805920600891},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5786470174789429},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5739491581916809},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5710065960884094},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5212336778640747},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.46323463320732117},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.433277428150177},{"id":"https://openalex.org/keywords/maximum-satisfiability-problem","display_name":"Maximum satisfiability problem","score":0.43200162053108215},{"id":"https://openalex.org/keywords/solver","display_name":"Solver","score":0.42383572459220886},{"id":"https://openalex.org/keywords/boolean-function","display_name":"Boolean function","score":0.3831466734409332},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3430842161178589},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2835696339607239},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.25945040583610535},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.16504305601119995},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0833912193775177}],"concepts":[{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.5981805920600891},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5786470174789429},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5739491581916809},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5710065960884094},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5212336778640747},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.46323463320732117},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.433277428150177},{"id":"https://openalex.org/C111797529","wikidata":"https://www.wikidata.org/wiki/Q17080584","display_name":"Maximum satisfiability problem","level":3,"score":0.43200162053108215},{"id":"https://openalex.org/C2778770139","wikidata":"https://www.wikidata.org/wiki/Q1966904","display_name":"Solver","level":2,"score":0.42383572459220886},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.3831466734409332},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3430842161178589},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2835696339607239},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.25945040583610535},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.16504305601119995},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0833912193775177},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icccnt51525.2021.9579930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icccnt51525.2021.9579930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 12th International Conference on Computing Communication and Networking Technologies (ICCCNT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W346138648","https://openalex.org/W646410877","https://openalex.org/W1518705996","https://openalex.org/W1554885925","https://openalex.org/W1563130775","https://openalex.org/W1906914439","https://openalex.org/W1923495615","https://openalex.org/W1983484856","https://openalex.org/W2036265926","https://openalex.org/W2044560939","https://openalex.org/W2057361103","https://openalex.org/W2062897452","https://openalex.org/W2076109986","https://openalex.org/W2107881637","https://openalex.org/W2142785340","https://openalex.org/W2143934828","https://openalex.org/W2157533144","https://openalex.org/W2496887343","https://openalex.org/W2560525892","https://openalex.org/W2601621997","https://openalex.org/W2888957887","https://openalex.org/W2919963965","https://openalex.org/W2992368780","https://openalex.org/W3022590788","https://openalex.org/W3145128584","https://openalex.org/W3174056719","https://openalex.org/W4246219036","https://openalex.org/W4302458519","https://openalex.org/W6640050670"],"related_works":["https://openalex.org/W2301405299","https://openalex.org/W2117563988","https://openalex.org/W4285605366","https://openalex.org/W2120257283","https://openalex.org/W2118943303","https://openalex.org/W3150741540","https://openalex.org/W2132684947","https://openalex.org/W4253759203","https://openalex.org/W2085380335","https://openalex.org/W2913446198"],"abstract_inverted_index":{"The":[0,21,102,117,157],"detection":[1,23,142],"of":[2,14,30,47,54,57,61,91,104,132,143],"a":[3,11,28,83,88],"stuck-at":[4,149],"fault":[5,22],"in":[6,44,164,169],"the":[7,45,48,52,55,59,70,124,141],"digital":[8],"circuit":[9],"requires":[10],"specific":[12],"set":[13],"inputs,":[15],"commonly":[16],"known":[17],"as":[18,145,147],"test":[19,62,125],"inputs.":[20],"problem":[24,107],"is":[25,82,135,138],"NP-complete,":[26],"with":[27,77,87,110],"complexity":[29,90],"at":[31],"least":[32],"<tex":[33,37,94],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[34,38,95,99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$O(2^{n})$</tex>":[35],"for":[36,127,140],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$n$</tex>":[39],"faults.":[40],"With":[41],"an":[42],"increase":[43],"size":[46],"circuit,":[49],"and":[50,114],"consequently":[51],"possibility":[53],"number":[56],"faults,":[58,150],"generation":[60],"inputs":[63],"becomes":[64],"computationally":[65],"challenging.":[66],"We":[67],"have":[68],"used":[69],"Boolean":[71],"satisfiability":[72],"(SAT)":[73],"algorithm":[74,86,113],"to":[75,122,155],"deal":[76],"such":[78],"complexity.":[79],"MiniSAT":[80,111],"2.2":[81,112],"well-known":[84],"SAT":[85,106],"computational":[89],"less":[92],"than":[93],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$O$</tex>":[96],"(1.3":[97],"<sup":[98],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">n</sup>":[100],").":[101],"result":[103],"this":[105,133],"was":[108],"obtained":[109,119],"python":[115],"platform.":[116],"results":[118],"were":[120],"analyzed":[121],"determine":[123],"sets":[126],"combinational":[128],"circuits.":[129],"Another":[130],"advantage":[131],"method":[134,158],"that":[136],"it":[137],"helpful":[139],"single":[144],"well":[146],"multiple-simultaneous":[148],"which":[151],"are":[152],"even":[153],"harder":[154],"detect.":[156],"has":[159],"been":[160],"developed":[161],"by":[162],"keeping":[163],"mind":[165],"its":[166],"possible":[167],"application":[168],"biological":[170],"circuits,":[171],"like":[172],"detecting":[173],"genetic":[174],"mutations.":[175]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}