{"id":"https://openalex.org/W4390693662","doi":"https://doi.org/10.1109/iccais59597.2023.10382337","title":"Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing","display_name":"Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing","publication_year":2023,"publication_date":"2023-11-27","ids":{"openalex":"https://openalex.org/W4390693662","doi":"https://doi.org/10.1109/iccais59597.2023.10382337"},"language":"en","primary_location":{"id":"doi:10.1109/iccais59597.2023.10382337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccais59597.2023.10382337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 12th International Conference on Control, Automation and Information Sciences (ICCAIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007491919","display_name":"Quang Vuong Pham","orcid":"https://orcid.org/0000-0002-3819-6016"},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":true,"raw_author_name":"Quang Vuong Pham","raw_affiliation_strings":["Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093697280","display_name":"Manh Duy Ngo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Manh Duy Ngo","raw_affiliation_strings":["Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071888128","display_name":"S. Hoang","orcid":"https://orcid.org/0009-0009-3177-3990"},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Sy Phuong Hoang","raw_affiliation_strings":["Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111892023","display_name":"Phuong Huy Nguyen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Phuong Huy Nguyen","raw_affiliation_strings":["Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100767450","display_name":"Duc Minh Le","orcid":"https://orcid.org/0000-0002-5607-8849"},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Duc Minh Le","raw_affiliation_strings":["Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Intelligent Communication System Laboratory (ICSLab),Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006138404","display_name":"Van Su Luong","orcid":"https://orcid.org/0000-0003-2061-7406"},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Van Su Luong","raw_affiliation_strings":["Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054379203","display_name":"Minhhuy Le","orcid":"https://orcid.org/0000-0001-6152-6215"},"institutions":[{"id":"https://openalex.org/I4210124651","display_name":"Phenikaa University","ror":"https://ror.org/03anxx281","country_code":"VN","type":"education","lineage":["https://openalex.org/I4210124651"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Minhhuy Le","raw_affiliation_strings":["Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116"],"affiliations":[{"raw_affiliation_string":"Phenikaa University,Faculty of Electrical and Electronic Engineering,Hanoi,Vietnam,12116","institution_ids":["https://openalex.org/I4210124651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5007491919"],"corresponding_institution_ids":["https://openalex.org/I4210124651"],"apc_list":null,"apc_paid":null,"fwci":0.2567,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52269214,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"28","last_page":"33"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10736","display_name":"Hydrogen embrittlement and corrosion behaviors in metals","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7729630470275879},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.7140640616416931},{"id":"https://openalex.org/keywords/lift","display_name":"Lift (data mining)","score":0.6473461389541626},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5528506636619568},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5282285213470459},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.4575989842414856},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4328819513320923},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.4319365620613098},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.4316040873527527},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.42812156677246094},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3817688822746277},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16822639107704163},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15577903389930725},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14803853631019592},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1293106973171234},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12909704446792603}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7729630470275879},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.7140640616416931},{"id":"https://openalex.org/C139002025","wikidata":"https://www.wikidata.org/wiki/Q3001212","display_name":"Lift (data mining)","level":2,"score":0.6473461389541626},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5528506636619568},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5282285213470459},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.4575989842414856},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4328819513320923},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.4319365620613098},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.4316040873527527},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.42812156677246094},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3817688822746277},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16822639107704163},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15577903389930725},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14803853631019592},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1293106973171234},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12909704446792603},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccais59597.2023.10382337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccais59597.2023.10382337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 12th International Conference on Control, Automation and Information Sciences (ICCAIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320337495","display_name":"Technology Development","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1640702227","https://openalex.org/W1964438555","https://openalex.org/W1976805286","https://openalex.org/W2000246877","https://openalex.org/W2139724650","https://openalex.org/W2176246355","https://openalex.org/W2176950688","https://openalex.org/W2327105598","https://openalex.org/W2561546628","https://openalex.org/W2616799910","https://openalex.org/W2795484455","https://openalex.org/W2884001105","https://openalex.org/W3183733091","https://openalex.org/W3214325366","https://openalex.org/W4280577272","https://openalex.org/W4288083766","https://openalex.org/W4384158648"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2325202533","https://openalex.org/W2029993380","https://openalex.org/W2357774020","https://openalex.org/W1883189948"],"abstract_inverted_index":{"The":[0],"Pulse":[1],"Eddy":[2],"Current":[3],"(PEC)":[4],"technique":[5],"represents":[6],"an":[7,78],"innovative":[8],"approach":[9,57],"within":[10,134],"the":[11,22,113,127,135,151],"field":[12],"of":[13,25,115,137,150,153],"eddy":[14],"current":[15],"testing":[16],"(ECT),":[17],"primarily":[18],"employed":[19],"to":[20,47,66,140,169],"assess":[21],"structural":[23],"integrity":[24],"engineering":[26],"components.":[27],"However,":[28],"this":[29,50,106],"method":[30],"typically":[31],"encounters":[32],"challenges":[33],"stemming":[34],"from":[35,166],"variations":[36,164],"in":[37,117],"lift-off":[38,102,163],"distances":[39],"and":[40,69,84,96,146,155],"necessitates":[41],"a":[42,55,118,144],"manual":[43],"calibration":[44],"procedure":[45],"prior":[46],"operation.":[48],"In":[49],"research":[51],"paper,":[52],"we":[53,108],"introduce":[54],"novel":[56],"for":[58,90],"thickness":[59,72,98,116,132,152],"measurement":[60,114],"that":[61,126],"leverages":[62],"deep":[63],"learning":[64,92],"techniques":[65],"enable":[67],"automatic":[68],"highly":[70],"precise":[71],"assessment.":[73],"Our":[74,123],"proposed":[75],"solution":[76],"encompasses":[77],"Auto-Encoder":[79],"model,":[80],"incorporating":[81],"convolutional":[82],"layers":[83],"long":[85],"short-term":[86],"memory":[87],"layers,":[88],"designed":[89],"effectively":[91],"raw":[93],"PEC":[94,128],"signals":[95],"predicting":[97],"values":[99,133],"across":[100],"varying":[101],"conditions.":[103],"To":[104],"validate":[105],"approach,":[107],"conducted":[109],"experiments":[110],"focusing":[111],"on":[112],"Mild":[119],"Carbon":[120],"Steel":[121],"specimen.":[122],"results":[124],"demonstrate":[125],"system":[129],"successfully":[130],"predicts":[131],"range":[136],"1":[138],"mm":[139,168],"10":[141],"mm,":[142,157],"exhibiting":[143],"mean":[145],"standard":[147],"deviation":[148],"error":[149],"0.026":[154],"0.038":[156],"respectively,":[158],"even":[159],"when":[160],"confronted":[161],"with":[162],"ranging":[165],"0.5":[167],"2.0":[170],"mm.":[171]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-04-11T08:14:18.477133","created_date":"2025-10-10T00:00:00"}