{"id":"https://openalex.org/W4416430003","doi":"https://doi.org/10.1109/iccad66269.2025.11240917","title":"Self-Error Detection and Correction Techniques for Reliable and Efficient Selector-Only Memory","display_name":"Self-Error Detection and Correction Techniques for Reliable and Efficient Selector-Only Memory","publication_year":2025,"publication_date":"2025-10-26","ids":{"openalex":"https://openalex.org/W4416430003","doi":"https://doi.org/10.1109/iccad66269.2025.11240917"},"language":null,"primary_location":{"id":"doi:10.1109/iccad66269.2025.11240917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad66269.2025.11240917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049063762","display_name":"Hyunjun Lee","orcid":"https://orcid.org/0000-0002-0808-2376"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunjun Lee","raw_affiliation_strings":["Yonsei University,Department of System Semiconductor Engineering,Seoul,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of System Semiconductor Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026627679","display_name":"Joon-Sung Yang","orcid":"https://orcid.org/0000-0002-1502-5353"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210160791","display_name":"Yonsei University Health System","ror":"https://ror.org/04sze3c15","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Sung Yang","raw_affiliation_strings":["Yonsei University,Department of System Semiconductor Engineering,Seoul,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of System Semiconductor Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966","https://openalex.org/I4210160791"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.42114256,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.7081000208854675,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.7081000208854675,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.13220000267028809,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.07249999791383743,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6603999733924866},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6499999761581421},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5659999847412109},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.42829999327659607},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4196999967098236},{"id":"https://openalex.org/keywords/memory-errors","display_name":"Memory errors","score":0.3700999915599823},{"id":"https://openalex.org/keywords/dynamic-random-access-memory","display_name":"Dynamic random-access memory","score":0.32739999890327454}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7829999923706055},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6603999733924866},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6499999761581421},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5659999847412109},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.42829999327659607},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4196999967098236},{"id":"https://openalex.org/C119907115","wikidata":"https://www.wikidata.org/wiki/Q6815725","display_name":"Memory errors","level":3,"score":0.3700999915599823},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3596999943256378},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.32739999890327454},{"id":"https://openalex.org/C2779304628","wikidata":"https://www.wikidata.org/wiki/Q3503480","display_name":"Face (sociological concept)","level":2,"score":0.3149000108242035},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.3125999867916107},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.30219998955726624},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.2976999878883362},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2856999933719635},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.28220000863075256},{"id":"https://openalex.org/C59656382","wikidata":"https://www.wikidata.org/wiki/Q191536","display_name":"Conjunction (astronomy)","level":2,"score":0.2775000035762787},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2651999890804291},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.26249998807907104}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad66269.2025.11240917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad66269.2025.11240917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2010202670","https://openalex.org/W2091988614","https://openalex.org/W2201220957","https://openalex.org/W2204664557","https://openalex.org/W2614464719","https://openalex.org/W3103991664","https://openalex.org/W4317603229","https://openalex.org/W4317793345","https://openalex.org/W4323793902","https://openalex.org/W4327930439","https://openalex.org/W4385223682","https://openalex.org/W4389105003","https://openalex.org/W4391250471","https://openalex.org/W4391594508","https://openalex.org/W4391594689","https://openalex.org/W4391622548","https://openalex.org/W4396949290","https://openalex.org/W4401880335"],"related_works":[],"abstract_inverted_index":{"Storage":[0],"class":[1],"memory":[2,17,33,63],"(SCM)":[3],"has":[4,38,77],"been":[5,78],"proposed":[6],"as":[7,41,61,80,147],"a":[8,42,81,160],"solution":[9],"to":[10,59,113,120,181,206],"bridge":[11],"the":[12,25,86,105,165,171,183,201,208],"performance":[13],"gap":[14],"between":[15],"main":[16],"and":[18,110,130,136,229],"storage":[19],"in":[20,100,234],"data-intensive":[21],"applications.":[22],"To":[23],"overcome":[24],"limitations":[26],"of":[27,89,127,168,185],"prior":[28],"technologies":[29],"like":[30],"3D":[31],"cross-point":[32],"(3DXP),":[34],"Selector-Only":[35],"Memory":[36],"(SOM)":[37],"recently":[39],"emerged":[40],"promising":[43],"candidate":[44],"for":[45,139],"next-generation":[46],"SCM.":[47],"However,":[48],"SOM":[49],"devices":[50],"face":[51],"various":[52,66,217],"reliability":[53],"challenges":[54],"that":[55,84,133,220],"limit":[56],"their":[57],"ability":[58],"function":[60],"ideal":[62],"devices.":[64],"Among":[65],"non-ideal":[67],"characteristics,":[68],"threshold":[69],"voltage":[70],"(Vth)":[71],"drift,":[72],"which":[73,199],"increases":[74],"Vthover":[75],"time,":[76],"identified":[79],"critical":[82],"issue":[83],"raises":[85],"error":[87,116,148,223],"rate":[88],"SOM.":[90,169],"Moreover,":[91],"device":[92],"variation":[93],"caused":[94],"by":[95,188],"immature":[96],"manufacturing":[97],"processes":[98],"results":[99,212],"Vthdiscrepancies":[101],"across":[102,213],"devices,":[103],"reducing":[104],"read":[106,162,197],"window":[107],"margin":[108],"(RWM)":[109],"thus":[111],"contributing":[112],"an":[114,174,194],"increased":[115],"rate.":[117],"In":[118],"response":[119],"these":[121],"issues,":[122],"we":[123],"propose":[124],"Securer,":[125],"consisting":[126],"self-error":[128],"detection":[129],"correction":[131,149,238],"techniques":[132],"inherently":[134],"detect":[135],"correct":[137,207],"errors":[138,158],"SOM,":[140],"without":[141],"relying":[142],"on":[143],"external":[144],"methods":[145],"such":[146],"codes":[150],"(ECC).":[151],"The":[152],"first":[153],"technique":[154],"effectively":[155],"identifies":[156],"all":[157],"through":[159],"dual-polarity":[161],"operation,":[163,198],"leveraging":[164],"unique":[166],"features":[167],"For":[170],"second":[172],"technique,":[173],"analytical":[175],"drift":[176],"estimation":[177],"model":[178],"is":[179,204],"introduced":[180],"estimate":[182],"magnitude":[184],"Vthdrift":[186],"experienced":[187],"erroneous":[189],"cells.":[190],"Using":[191],"this":[192],"information,":[193],"adaptive":[195],"error-aware":[196],"tracks":[200],"drifted":[202],"Vth,":[203],"employed":[205],"detected":[209],"errors.":[210],"Experimental":[211],"real":[214],"workloads":[215],"from":[216],"applications":[218],"demonstrate":[219],"Securer":[221],"achieves":[222],"rates":[224],"below":[225],"10\u221213without":[226],"significant":[227],"overhead,":[228],"confirm":[230],"error-free":[231],"data":[232],"integrity":[233],"conjunction":[235],"with":[236],"single-error":[237],"code.":[239]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-11-20T00:00:00"}