{"id":"https://openalex.org/W4416429530","doi":"https://doi.org/10.1109/iccad66269.2025.11240874","title":"CIMTester: An Agile Golden-Result-Free BIST Compiler for Robust Compute-In-Memory","display_name":"CIMTester: An Agile Golden-Result-Free BIST Compiler for Robust Compute-In-Memory","publication_year":2025,"publication_date":"2025-10-26","ids":{"openalex":"https://openalex.org/W4416429530","doi":"https://doi.org/10.1109/iccad66269.2025.11240874"},"language":null,"primary_location":{"id":"doi:10.1109/iccad66269.2025.11240874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad66269.2025.11240874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100314793","display_name":"Wenjie Ren","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenjie Ren","raw_affiliation_strings":["Peking University,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Meng Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Wu","raw_affiliation_strings":["Peking University,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100365307","display_name":"Mingxuan Li","orcid":"https://orcid.org/0009-0008-1235-147X"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxuan Li","raw_affiliation_strings":["Peking University,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100748535","display_name":"Peiyu Chen","orcid":"https://orcid.org/0000-0001-5629-8625"},"institutions":[{"id":"https://openalex.org/I4210137766","display_name":"Institute for Advanced Study","ror":"https://ror.org/03xg85719","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210137766"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Peiyu Chen","raw_affiliation_strings":["Advanced Institute of Informative Technology of Peking University,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"Advanced Institute of Informative Technology of Peking University,Hangzhou,China","institution_ids":["https://openalex.org/I4210137766"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088551028","display_name":"Tianyu Jia","orcid":"https://orcid.org/0000-0002-4570-4613"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyu Jia","raw_affiliation_strings":["Peking University,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":null,"display_name":"Le Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Le Ye","raw_affiliation_strings":["Peking University,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100314793"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39530004,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.06939999759197235,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.053599998354911804,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5916000008583069},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5867999792098999},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.524399995803833},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41280001401901245},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.39660000801086426},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.38440001010894775},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.37619999051094055}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.684499979019165},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5916000008583069},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5867999792098999},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.524399995803833},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47209998965263367},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41280001401901245},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.39660000801086426},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.38440001010894775},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.37619999051094055},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.351500004529953},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.32519999146461487},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32199999690055847},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.31929999589920044},{"id":"https://openalex.org/C200833197","wikidata":"https://www.wikidata.org/wiki/Q333707","display_name":"Compile time","level":3,"score":0.31380000710487366},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.29350000619888306},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.2815999984741211},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.27950000762939453},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.2732999920845032},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.25690001249313354}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad66269.2025.11240874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad66269.2025.11240874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W2484810508","https://openalex.org/W2981537656","https://openalex.org/W3038585068","https://openalex.org/W3115575231","https://openalex.org/W3134526034","https://openalex.org/W3209590936","https://openalex.org/W4221038786","https://openalex.org/W4226363228","https://openalex.org/W4295549163","https://openalex.org/W4312611881","https://openalex.org/W4360605969","https://openalex.org/W4379115844","https://openalex.org/W4386108348","https://openalex.org/W4388666846","https://openalex.org/W4392746069","https://openalex.org/W4392746496","https://openalex.org/W4396918370","https://openalex.org/W4401568162","https://openalex.org/W4404564564","https://openalex.org/W4409282663","https://openalex.org/W4409285593"],"related_works":[],"abstract_inverted_index":{"Digital":[0],"compute-in-memory":[1],"(DCIM)":[2],"is":[3],"playing":[4],"an":[5],"increasingly":[6],"vital":[7],"role":[8],"in":[9,27,97],"efficient":[10],"AI":[11],"computing":[12],"due":[13],"to":[14,67,84,86,115,131,161],"its":[15],"significant":[16],"efficiency":[17],"advantages.":[18],"However,":[19],"the":[20,112,116,154],"combination":[21],"of":[22,119,128,135,148],"memory":[23,38],"and":[24,39,47,71,91,95,110,139,144],"computation":[25],"logics":[26],"DCIM":[28,81,92,151],"presents":[29],"challenges":[30],"for":[31,43],"testing,":[32],"including":[33],"extra":[34],"coupling":[35],"fault":[36,49,140,163],"between":[37],"logic,":[40],"high":[41],"overhead":[42,70],"golden":[44],"result":[45],"generation":[46],"indirect":[48],"location.":[50],"In":[51,75],"this":[52],"paper,":[53],"we":[54,77],"present":[55,78],"a":[56,62,80,146],"golden-result-free":[57],"BIST":[58,65,82,103,108,129,156],"structure":[59,109],"together":[60],"with":[61,153,165],"computation-coupled":[63],"CIM":[64],"algorithm":[66],"reduce":[68],"testing":[69],"improve":[72],"test":[73,89,120,137],"coverage.":[74,141],"addition,":[76],"CIMTester,":[79],"compiler":[83],"adapt":[85],"swiftly":[87],"changing":[88],"requirements":[90],"macro":[93],"sizes":[94],"numbers":[96],"chips.":[98],"The":[99],"template-based":[100],"generator":[101],"generates":[102],"RTL":[104],"based":[105],"on":[106],"proposed":[107],"modifies":[111],"templates":[113],"according":[114],"architecture":[117],"parameters":[118],"chip.":[121],"CIMTester\u2019s":[122],"iterator":[123],"analyzes":[124],"diverse":[125],"sharing":[126],"strategy":[127],"components":[130],"satisfy":[132],"user":[133],"specifications":[134],"area,":[136],"time":[138],"We":[142],"implemented":[143],"evaluated":[145],"series":[147],"TSMC":[149],"22nm":[150],"macros":[152],"generated":[155],"circuits,":[157],"which":[158],"achieves":[159],"up":[160],"99.48%":[162],"coverage":[164],"only":[166],"less":[167],"than":[168],"2.44%":[169],"area":[170],"overhead.":[171]},"counts_by_year":[],"updated_date":"2026-03-25T23:56:10.502304","created_date":"2025-11-20T00:00:00"}