{"id":"https://openalex.org/W4200579073","doi":"https://doi.org/10.1109/iccad51958.2021.9643532","title":"Performance-Aware Common-Centroid Placement and Routing of Transistor Arrays in Analog Circuits","display_name":"Performance-Aware Common-Centroid Placement and Routing of Transistor Arrays in Analog Circuits","publication_year":2021,"publication_date":"2021-11-01","ids":{"openalex":"https://openalex.org/W4200579073","doi":"https://doi.org/10.1109/iccad51958.2021.9643532"},"language":"en","primary_location":{"id":"doi:10.1109/iccad51958.2021.9643532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad51958.2021.9643532","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100732194","display_name":"Arvind Sharma","orcid":"https://orcid.org/0000-0002-9250-9642"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arvind K. Sharma","raw_affiliation_strings":["University of Minnesota, Minneapolis, MN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota, Minneapolis, MN","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063857392","display_name":"Meghna Madhusudan","orcid":"https://orcid.org/0000-0001-5101-2421"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Meghna Madhusudan","raw_affiliation_strings":["University of Minnesota, Minneapolis, MN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota, Minneapolis, MN","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053468539","display_name":"Steven M. Burns","orcid":"https://orcid.org/0000-0003-0248-5403"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steven M. Burns","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055160439","display_name":"Soner Yaldiz","orcid":"https://orcid.org/0000-0002-0715-0859"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soner Yaldiz","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028130545","display_name":"Parijat Mukherjee","orcid":"https://orcid.org/0000-0002-2532-7347"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Parijat Mukherjee","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059037025","display_name":"Ramesh Harjani","orcid":"https://orcid.org/0000-0001-7691-566X"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Harjani","raw_affiliation_strings":["University of Minnesota, Minneapolis, MN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota, Minneapolis, MN","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin S. Sapatnekar","raw_affiliation_strings":["University of Minnesota, Minneapolis, MN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota, Minneapolis, MN","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.291,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.97286384,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.7797174453735352},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.6365925073623657},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6073541045188904},{"id":"https://openalex.org/keywords/centroid","display_name":"Centroid","score":0.6071764826774597},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5416711568832397},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.523019015789032},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.5106297135353088},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.47022461891174316},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3637930154800415},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3509165048599243},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24743011593818665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21151000261306763},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1598941683769226},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1568702757358551},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10642418265342712}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.7797174453735352},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.6365925073623657},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6073541045188904},{"id":"https://openalex.org/C146599234","wikidata":"https://www.wikidata.org/wiki/Q511093","display_name":"Centroid","level":2,"score":0.6071764826774597},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5416711568832397},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.523019015789032},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.5106297135353088},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.47022461891174316},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3637930154800415},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3509165048599243},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24743011593818665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21151000261306763},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1598941683769226},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1568702757358551},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10642418265342712},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad51958.2021.9643532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad51958.2021.9643532","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1353427963","display_name":null,"funder_award_id":"N660011824048","funder_id":"https://openalex.org/F4320337532","funder_display_name":"Space and Naval Warfare Systems Command"}],"funders":[{"id":"https://openalex.org/F4320337532","display_name":"Space and Naval Warfare Systems Command","ror":"https://ror.org/000ztjy10"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1766933113","https://openalex.org/W1870293527","https://openalex.org/W2015090561","https://openalex.org/W2015428081","https://openalex.org/W2023202982","https://openalex.org/W2027568818","https://openalex.org/W2096760280","https://openalex.org/W2117648153","https://openalex.org/W2124222398","https://openalex.org/W2140281076","https://openalex.org/W2140823559","https://openalex.org/W2141369310","https://openalex.org/W2148808647","https://openalex.org/W2162005677","https://openalex.org/W2163883796","https://openalex.org/W2335894895","https://openalex.org/W2343400064","https://openalex.org/W2527129440","https://openalex.org/W2606983183","https://openalex.org/W2735093406","https://openalex.org/W2742997206","https://openalex.org/W3108107800","https://openalex.org/W3186013690","https://openalex.org/W6638060795","https://openalex.org/W6678716357","https://openalex.org/W6681144811"],"related_works":["https://openalex.org/W1905216755","https://openalex.org/W2117417104","https://openalex.org/W2534619547","https://openalex.org/W2381926679","https://openalex.org/W1923048618","https://openalex.org/W2104218257","https://openalex.org/W1990010037","https://openalex.org/W4255141013","https://openalex.org/W2198432996","https://openalex.org/W2027218961"],"abstract_inverted_index":{"The":[0,75],"common-centroid":[1],"(CC)":[2],"layout":[3,117],"style":[4],"is":[5],"widely":[6],"used":[7],"to":[8,94,106],"minimize":[9],"the":[10,43,97,101,111],"impact":[11],"of":[12,51,67,113],"variations":[13],"among":[14],"matched":[15],"devices":[16],"in":[17,71,86,110],"analog":[18],"blocks":[19],"such":[20],"as":[21],"current":[22],"mirror":[23],"banks":[24],"and":[25,36,58,62,82,119],"differential":[26],"pairs.":[27],"This":[28],"paper":[29],"presents":[30],"a":[31,87],"constructive,":[32],"performance-aware":[33],"CC":[34],"placement":[35],"routing":[37],"algorithm":[38],"for":[39],"transistor":[40],"arrays.":[41],"Specifically,":[42],"proposed":[44,76,102],"approach":[45,103],"maximizes":[46],"diffusion":[47,52],"sharing,":[48],"incorporates":[49],"length":[50],"(LOD)":[53],"based":[54],"stress-induced":[55],"performance":[56,109],"variations,":[57,115],"mitigates":[59],"resistive":[60],"parasitics":[61],"electromigration":[63],"(EM)":[64],"hotspots,":[65],"all":[66],"which":[68],"are":[69,78,104],"critical":[70],"modern":[72],"technology":[73],"nodes.":[74],"algorithms":[77],"validated":[79],"using":[80,100],"cell-":[81],"circuit-level":[83],"test":[84],"cases":[85],"commercial":[88],"12nm":[89],"FinFET":[90],"process.":[91],"As":[92],"compared":[93],"existing":[95],"works,":[96],"cells":[98],"generated":[99],"shown":[105],"provide":[107],"better":[108],"presence":[112],"systematic":[114],"LOD,":[116],"parasitics,":[118],"EM-induced":[120],"degradation.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}