{"id":"https://openalex.org/W2998296300","doi":"https://doi.org/10.1109/iccad45719.2019.8942081","title":"A Statistical Timing Model for Low Voltage Design Considering Process Variation","display_name":"A Statistical Timing Model for Low Voltage Design Considering Process Variation","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W2998296300","doi":"https://doi.org/10.1109/iccad45719.2019.8942081","mag":"2998296300"},"language":"en","primary_location":{"id":"doi:10.1109/iccad45719.2019.8942081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad45719.2019.8942081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046599843","display_name":"Peng Cao","orcid":"https://orcid.org/0000-0003-2039-9031"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Cao","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100320722","display_name":"Zhiyuan Liu","orcid":"https://orcid.org/0000-0002-6331-0810"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Liu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034476875","display_name":"Jiangping Wu","orcid":"https://orcid.org/0000-0001-9126-5490"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangping Wu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089487764","display_name":"Jingjing Guo","orcid":"https://orcid.org/0000-0002-1031-9416"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingjing Guo","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101499715","display_name":"Longxing Shi","orcid":"https://orcid.org/0000-0002-0629-7154"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longxing Shi","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7468298673629761},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5896457433700562},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5513201355934143},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5478907227516174},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5315130949020386},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.527417778968811},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5195329785346985},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4796874225139618},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4636844992637634},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.45833924412727356},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4471912980079651},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.44104519486427307},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42723825573921204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42262911796569824},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.4117993116378784},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3995954096317291},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2999565899372101},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25290030241012573},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14817437529563904},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1467631757259369},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13264569640159607}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7468298673629761},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5896457433700562},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5513201355934143},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5478907227516174},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5315130949020386},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.527417778968811},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5195329785346985},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4796874225139618},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4636844992637634},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.45833924412727356},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4471912980079651},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.44104519486427307},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42723825573921204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42262911796569824},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.4117993116378784},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3995954096317291},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2999565899372101},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25290030241012573},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14817437529563904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1467631757259369},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13264569640159607},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad45719.2019.8942081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad45719.2019.8942081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7200000286102295,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1530625153","https://openalex.org/W1557691383","https://openalex.org/W1699495354","https://openalex.org/W1979462621","https://openalex.org/W1997782294","https://openalex.org/W1998525920","https://openalex.org/W2028438462","https://openalex.org/W2030257954","https://openalex.org/W2044350388","https://openalex.org/W2061521364","https://openalex.org/W2070623495","https://openalex.org/W2130038216","https://openalex.org/W2135880741","https://openalex.org/W2168159483","https://openalex.org/W2176629069","https://openalex.org/W2342528869","https://openalex.org/W2401766047","https://openalex.org/W2798600617","https://openalex.org/W4239145761"],"related_works":["https://openalex.org/W2525077515","https://openalex.org/W4249541960","https://openalex.org/W2107551409","https://openalex.org/W2118152793","https://openalex.org/W2141625582","https://openalex.org/W3092420867","https://openalex.org/W2115729972","https://openalex.org/W4388000032","https://openalex.org/W2042032654","https://openalex.org/W2968761826"],"abstract_inverted_index":{"Near-threshold":[0],"voltage":[1,42,53,62,187],"(NTV)":[2],"design":[3,37],"suffers":[4],"severe":[5],"challenge":[6],"due":[7],"to":[8,30,46],"the":[9,32,39,50,59,88,92,100,107,114,178,193,197,215,221],"dramatic":[10],"increase":[11],"in":[12,99,162,218],"performance":[13],"uncertainty":[14],"introduced":[15],"by":[16,58,105],"process":[17,176],"variation.":[18],"This":[19],"paper":[20],"proposes":[21],"an":[22],"analytical":[23],"approach":[24],"based":[25],"on":[26],"Log-Normal":[27],"(LN)":[28],"distribution":[29],"characterize":[31],"statistical":[33,82,94,123,163],"delay":[34,203,232],"for":[35,69,127,145,196,214],"NTV":[36],"considering":[38,106],"dominant":[40],"threshold":[41,52,61],"variation":[43,54],"from":[44],"gate-level":[45],"circuit-level.":[47],"At":[48,79],"gate-level,":[49],"multivariable":[51],"issue":[55],"is":[56,85,148,154,233],"solved":[57],"equivalent":[60,65],"method":[63,68],"and":[64,75,139,199,209,230,239],"drain":[66],"current":[67],"generic":[70],"gates":[71,98],"with":[72,102,131,157,189],"stack":[73],"topology":[74],"parallel":[76],"topology,":[77],"respectively.":[78,211,241],"circuit-level,":[80],"a":[81,122,172],"timing":[83,124,165],"model":[84,125],"proposed":[86,179],"as":[87,213],"linear":[89],"combination":[90],"of":[91,96,116,134,201,225],"independent":[93],"delays":[95],"all":[97],"path":[101,130,147],"step":[103],"input":[104],"varied":[108],"correlation":[109],"between":[110],"adjacent":[111],"gates.":[112],"To":[113],"best":[115],"our":[117],"knowledge,":[118],"we":[119],"firstly":[120],"propose":[121],"analytically":[126],"practical":[128,216],"circuit":[129],"physical":[132],"insights":[133],"supply":[135,186],"voltage,":[136],"transistor":[137],"size,":[138],"load":[140],"capacitance.":[141],"The":[142],"characterization":[143],"effort":[144],"each":[146],"only":[149],"one-time":[150],"SPICE":[151],"simulation,":[152],"which":[153],"negligible":[155],"compared":[156,188],"Monte":[158],"Carlo":[159],"(MC)":[160],"simulation":[161],"static":[164],"analysis":[166],"(SSTA)":[167],"methods.":[168],"Experimental":[169],"results":[170],"under":[171],"commercial":[173],"28-nm":[174],"CMOS":[175],"show":[177],"models":[180],"have":[181],"high":[182],"accuracy":[183],"at":[184],"low":[185],"MC":[190],"simulations,":[191],"where":[192],"modeling":[194,223],"errors":[195,224],"mean":[198],"variance":[200],"gate":[202],"can":[204],"be":[205],"limited":[206],"within":[207],"1.54%":[208],"11.2%,":[210],"Moreover,":[212],"paths":[217],"ITC'99":[219],"benchmark,":[220],"maximum":[222,231],"mean,":[226],"variance,":[227],"minimum":[228],"delay,":[229],"less":[234],"than":[235],"3.04%,":[236],"11.40%,":[237],"4.50%,":[238],"2.87%,":[240]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}