{"id":"https://openalex.org/W2796063152","doi":"https://doi.org/10.1109/iccad.2017.8329993","title":"Front-end-of-line attacks in split manufacturing","display_name":"Front-end-of-line attacks in split manufacturing","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2796063152","doi":"https://doi.org/10.1109/iccad.2017.8329993","mag":"2796063152"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2017.8329993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2017.8329993","pdf_url":null,"source":{"id":"https://openalex.org/S4363608376","display_name":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100373840","display_name":"Yujie Wang","orcid":"https://orcid.org/0000-0003-0646-4183"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujie Wang","raw_affiliation_strings":["College of Electronic Information and Optical Engineering, Nankai University","Institute of Computing Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Optical Engineering, Nankai University","institution_ids":["https://openalex.org/I205237279"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102842505","display_name":"Tri Cao","orcid":"https://orcid.org/0000-0001-7865-8476"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tri Cao","raw_affiliation_strings":["Department of Electrical Engineering, The University of Texas at Dallas"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The University of Texas at Dallas","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103246390","display_name":"Jiang Hu","orcid":"https://orcid.org/0000-0003-1157-7799"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiang Hu","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Texas A&M University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A&M University","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059126377","display_name":"Jeyavijayan Rajendran","orcid":"https://orcid.org/0000-0003-3687-3746"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeyavijayan Rajendran","raw_affiliation_strings":["Department of Electrical Engineering, The University of Texas at Dallas"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The University of Texas at Dallas","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9562000036239624,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/back-end-of-line","display_name":"Back end of line","score":0.6924161911010742},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.6201847791671753},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5770122408866882},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5479292273521423},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5445388555526733},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5301055908203125},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5060595870018005},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.434972882270813},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36754027009010315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2906652092933655},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2413470447063446},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15025758743286133},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11921510100364685},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10140901803970337},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07318416237831116},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07277536392211914}],"concepts":[{"id":"https://openalex.org/C2776628375","wikidata":"https://www.wikidata.org/wiki/Q4839229","display_name":"Back end of line","level":3,"score":0.6924161911010742},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.6201847791671753},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5770122408866882},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5479292273521423},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5445388555526733},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5301055908203125},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5060595870018005},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.434972882270813},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36754027009010315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2906652092933655},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2413470447063446},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15025758743286133},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11921510100364685},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10140901803970337},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07318416237831116},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07277536392211914},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2017.8329993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2017.8329993","pdf_url":null,"source":{"id":"https://openalex.org/S4363608376","display_name":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1482046022","https://openalex.org/W1524250393","https://openalex.org/W1547478380","https://openalex.org/W1583151409","https://openalex.org/W1782800369","https://openalex.org/W1952517978","https://openalex.org/W1976955200","https://openalex.org/W1982691824","https://openalex.org/W1992964615","https://openalex.org/W2063615695","https://openalex.org/W2064066670","https://openalex.org/W2064541558","https://openalex.org/W2092545762","https://openalex.org/W2093405763","https://openalex.org/W2099101940","https://openalex.org/W2101234009","https://openalex.org/W2105714044","https://openalex.org/W2120000030","https://openalex.org/W2140904634","https://openalex.org/W2142135738","https://openalex.org/W2217880151","https://openalex.org/W2230953395","https://openalex.org/W2404942596","https://openalex.org/W2533892336","https://openalex.org/W2534787757","https://openalex.org/W3141282712","https://openalex.org/W4234937017","https://openalex.org/W4245595491","https://openalex.org/W6641116602","https://openalex.org/W6666668887","https://openalex.org/W6675354045","https://openalex.org/W6728764218","https://openalex.org/W6728781822"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W4400235630","https://openalex.org/W3215142653","https://openalex.org/W2147569518","https://openalex.org/W1487051936","https://openalex.org/W2889312630"],"abstract_inverted_index":{"By":[0],"splitting":[1],"the":[2,16,32,77],"manufacturing":[3],"of":[4,34,85],"integrated":[5],"circuits":[6],"into":[7],"back-end-of-line":[8],"(BEOL)":[9],"and":[10,66],"front-end-of-line":[11],"(FEOL)":[12],"at":[13,38],"different":[14],"foundries,":[15],"vulnerabilities":[17],"to":[18],"attacks":[19,37,53,79],"by":[20,56,90],"a":[21,47,67],"untrusted":[22,39,58],"foundry":[23],"is":[24,88],"considerably":[25],"alleviated.":[26],"Most":[27],"previous":[28],"works":[29],"focus":[30],"on":[31,92],"scenario":[33],"only":[35],"BEOL":[36,59],"FEOL":[40,52,78],"foundries.":[41],"In":[42],"this":[43],"work,":[44],"we":[45],"study":[46],"largely":[48],"unexplored":[49],"scenario,":[50],"where":[51],"are":[54,72,80],"launched":[55],"an":[57],"foundry.":[60],"A":[61],"geometric":[62],"pattern":[63],"match":[64],"attack":[65,70],"machine":[68],"learningbased":[69],"technique":[71],"investigated.":[73],"Defense":[74],"techniques":[75,87],"against":[76],"also":[81],"discussed.":[82],"The":[83],"effectiveness":[84],"these":[86],"demonstrated":[89],"experiments":[91],"benchmark":[93],"circuits.":[94]},"counts_by_year":[{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}