{"id":"https://openalex.org/W4252310117","doi":"https://doi.org/10.1109/iccad.2013.6691148","title":"An IDDQ-based source driver IC design-for-test technique","display_name":"An IDDQ-based source driver IC design-for-test technique","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W4252310117","doi":"https://doi.org/10.1109/iccad.2013.6691148"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2013.6691148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2013.6691148","pdf_url":null,"source":{"id":"https://openalex.org/S4363608415","display_name":"2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042526715","display_name":"Shun-Min Lin","orcid":"https://orcid.org/0009-0007-3831-0855"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"S.-S. Lin","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055551811","display_name":"Changjung Kao","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"C.-L. Kao","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000511725","display_name":"J.-L. Huang","orcid":"https://orcid.org/0009-0008-0948-4597"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"J.-L. Huang","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054539996","display_name":"C.-C. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I875649924","display_name":"Himax (Taiwan)","ror":"https://ror.org/00xk9wg94","country_code":"TW","type":"company","lineage":["https://openalex.org/I875649924"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"C.-C. Lee","raw_affiliation_strings":["Himax Inc., Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Himax Inc., Taiwan","institution_ids":["https://openalex.org/I875649924"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088255324","display_name":"X.-L. Huang","orcid":"https://orcid.org/0009-0007-3730-7048"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"X.-L. Huang","raw_affiliation_strings":["Industrial Technology Research Institute, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.36745887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"393","last_page":"398"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.9826087951660156},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.8129851818084717},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8108813762664795},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6608707904815674},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.5054724216461182},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49296116828918457},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4852980971336365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47092097997665405},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4416438639163971},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42096543312072754},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.42042413353919983},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3497426509857178},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3489993214607239},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.25179699063301086},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14334481954574585},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.11224627494812012}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9826087951660156},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.8129851818084717},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8108813762664795},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6608707904815674},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.5054724216461182},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49296116828918457},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4852980971336365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47092097997665405},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4416438639163971},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42096543312072754},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.42042413353919983},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3497426509857178},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3489993214607239},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.25179699063301086},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14334481954574585},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.11224627494812012},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2013.6691148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2013.6691148","pdf_url":null,"source":{"id":"https://openalex.org/S4363608415","display_name":"2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2055671939","https://openalex.org/W2059635202","https://openalex.org/W2078715866","https://openalex.org/W2114490939","https://openalex.org/W2115705137","https://openalex.org/W2118479677","https://openalex.org/W2128726980","https://openalex.org/W2139800612","https://openalex.org/W2148481133","https://openalex.org/W2160322785","https://openalex.org/W6681551440"],"related_works":["https://openalex.org/W2082317094","https://openalex.org/W2519630662","https://openalex.org/W3109183876","https://openalex.org/W4252310117","https://openalex.org/W2059274721","https://openalex.org/W2392813436","https://openalex.org/W1975544287","https://openalex.org/W2124826473","https://openalex.org/W4230966676","https://openalex.org/W2567189449"],"abstract_inverted_index":{"Testing":[0],"flat":[1],"panel":[2],"display":[3],"source":[4],"driver":[5],"ICs":[6],"is":[7,14,20],"a":[8],"costly":[9],"process;":[10],"the":[11,15,33,39,46,52,57,70,73],"root":[12],"cause":[13],"internal":[16],"DAC":[17,40],"array":[18],"which":[19],"functionally":[21],"tested.":[22],"This":[23],"paper":[24],"proposes":[25],"an":[26],"IDDQ-based":[27],"design-for-test":[28],"(DFT)":[29],"technique":[30,49,75],"to":[31,43,68],"detect":[32],"open":[34,78],"and":[35,55,79],"short":[36,80],"faults":[37],"inside":[38],"array.":[41],"Compared":[42],"previous":[44],"methods,":[45],"proposed":[47,74],"DFT":[48],"substantially":[50],"improves":[51],"IDDQ":[53],"testability":[54],"reduces":[56],"number":[58],"of":[59,72],"required":[60],"analog":[61],"measurements.":[62],"Spice":[63],"simulation":[64],"results":[65],"are":[66],"presented":[67],"validate":[69],"effectiveness":[71],"in":[76],"detecting":[77],"defects.":[81]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}