{"id":"https://openalex.org/W3143430367","doi":"https://doi.org/10.1109/iccad.2011.6105330","title":"Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated","display_name":"Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W3143430367","doi":"https://doi.org/10.1109/iccad.2011.6105330","mag":"3143430367"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2011.6105330","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2011.6105330","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114194191","display_name":"Hai Wei","orcid":"https://orcid.org/0000-0002-9045-7113"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hai Wei","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023023644","display_name":"Jie Zhang","orcid":"https://orcid.org/0000-0001-7821-4808"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jie Zhang","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007216982","display_name":"Lan Wei","orcid":"https://orcid.org/0000-0002-7430-8767"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lan Wei","raw_affiliation_strings":["Microsystems Technology Laboratories, Massachusetts Institute of Technology, MA, USA"],"affiliations":[{"raw_affiliation_string":"Microsystems Technology Laboratories, Massachusetts Institute of Technology, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037285672","display_name":"Nishant Patil","orcid":"https://orcid.org/0000-0001-6620-0038"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nishant Patil","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102160002","display_name":"Albert Lin","orcid":"https://orcid.org/0009-0008-2069-443X"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Albert Lin","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061843047","display_name":"Max M. Shulaker","orcid":"https://orcid.org/0000-0003-2237-193X"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Max M. Shulaker","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115601812","display_name":"Hongyu Chen","orcid":"https://orcid.org/0000-0002-5325-9249"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hong-Yu Chen","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059975258","display_name":"H.\u2010S. Philip Wong","orcid":"https://orcid.org/0000-0002-0096-1472"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.-S. Philip Wong","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Stanford University, Stanford, CA, US"],"affiliations":[{"raw_affiliation_string":"Stanford University, Stanford, CA, US","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5114194191"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":0.4673,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.6448557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"7","issue":null,"first_page":"227","last_page":"230"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7806153297424316},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.7134345173835754},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6008358001708984},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.47406357526779175},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46472078561782837},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.4318038821220398},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.4285314083099365},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4125481843948364},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.3516119122505188},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.34006965160369873},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2525833249092102},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2008368968963623},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1823672354221344},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.17025187611579895},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14606371521949768}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7806153297424316},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.7134345173835754},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6008358001708984},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.47406357526779175},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46472078561782837},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.4318038821220398},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.4285314083099365},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4125481843948364},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.3516119122505188},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.34006965160369873},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2525833249092102},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2008368968963623},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1823672354221344},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.17025187611579895},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14606371521949768},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2011.6105330","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2011.6105330","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.699999988079071}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W620352841","https://openalex.org/W1603422789","https://openalex.org/W1964189680","https://openalex.org/W1986980084","https://openalex.org/W1996608645","https://openalex.org/W2018747769","https://openalex.org/W2024507796","https://openalex.org/W2025458527","https://openalex.org/W2032324308","https://openalex.org/W2041052413","https://openalex.org/W2043079665","https://openalex.org/W2048358430","https://openalex.org/W2071974310","https://openalex.org/W2077144591","https://openalex.org/W2089427056","https://openalex.org/W2100890870","https://openalex.org/W2109385701","https://openalex.org/W2113336541","https://openalex.org/W2119092150","https://openalex.org/W2120657398","https://openalex.org/W2124674816","https://openalex.org/W2128753706","https://openalex.org/W2129545516","https://openalex.org/W2135117395","https://openalex.org/W2135518576","https://openalex.org/W2137930988","https://openalex.org/W2138085193","https://openalex.org/W2139676734","https://openalex.org/W2140288260","https://openalex.org/W2147516461","https://openalex.org/W2160007566","https://openalex.org/W2162520031","https://openalex.org/W2163874178","https://openalex.org/W2165098121","https://openalex.org/W2166852565","https://openalex.org/W3147650139","https://openalex.org/W4239355800","https://openalex.org/W6636268624","https://openalex.org/W6656426520"],"related_works":["https://openalex.org/W2570275273","https://openalex.org/W2134640991","https://openalex.org/W3027318491","https://openalex.org/W101478184","https://openalex.org/W2317479535","https://openalex.org/W1579695216","https://openalex.org/W1976161475","https://openalex.org/W1986774039","https://openalex.org/W3124581103","https://openalex.org/W2146902916"],"abstract_inverted_index":{"Carbon":[0],"Nanotube":[1],"Field-Effect":[2],"Transistors":[3],"(CNFETs)":[4],"are":[5,19,59],"excellent":[6],"candidates":[7],"for":[8],"designing":[9],"highly":[10,21],"energy-efficient":[11],"future":[12],"digital":[13,32],"systems.":[14],"However,":[15],"carbon":[16],"nanotubes":[17],"(CNTs)":[18],"inherently":[20],"subject":[22],"to":[23,29],"imperfections":[24],"that":[25],"pose":[26],"major":[27],"obstacles":[28],"robust":[30],"CNFET":[31,43],"VLSI.":[33],"This":[34],"paper":[35,58,73],"summarizes":[36],"commonly":[37],"raised":[38],"questions":[39,54,77],"and":[40],"concerns":[41],"about":[42],"technology":[44],"through":[45],"a":[46],"series":[47],"of":[48,70,81],"frequently":[49,75],"asked":[50,76],"questions.":[51],"The":[52],"specific":[53],"addressed":[55],"in":[56,64,78],"this":[57],"motivated":[60],"by":[61],"recent":[62],"advances":[63],"the":[65,68,79,82],"field":[66],"since":[67],"publication":[69],"our":[71],"earlier":[72],"on":[74],"Proceedings":[80],"2009":[83],"Design":[84],"Automation":[85],"Conference.":[86]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}