{"id":"https://openalex.org/W4235221304","doi":"https://doi.org/10.1109/iccad.2008.4681642","title":"Statistical path selection for at-speed test","display_name":"Statistical path selection for at-speed test","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W4235221304","doi":"https://doi.org/10.1109/iccad.2008.4681642"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2008.4681642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2008.4681642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005648967","display_name":"Vladimir Zolotov","orcid":"https://orcid.org/0000-0002-3971-1163"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Vladimir Zolotov","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030156276","display_name":"Jinjun Xiong","orcid":"https://orcid.org/0000-0002-2620-4859"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jinjun Xiong","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057859196","display_name":"Hanif Fatemi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hanif Fatemi","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113681098","display_name":"Chandu Visweswariah","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandu Visweswariah","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005648967"],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":2.37512625,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.93738394,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"624","last_page":"631"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.7010005712509155},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6483911275863647},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.611330509185791},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6070745587348938},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.544679582118988},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5431773066520691},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.4976840317249298},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4873226583003998},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.47065961360931396},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4644119441509247},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3066257834434509},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22790604829788208},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17307642102241516},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12979915738105774},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09984606504440308},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07597771286964417}],"concepts":[{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.7010005712509155},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6483911275863647},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.611330509185791},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6070745587348938},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.544679582118988},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5431773066520691},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.4976840317249298},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4873226583003998},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.47065961360931396},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4644119441509247},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3066257834434509},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22790604829788208},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17307642102241516},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12979915738105774},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09984606504440308},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07597771286964417},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2008.4681642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2008.4681642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1595368737","https://openalex.org/W2102127226","https://openalex.org/W2115483211","https://openalex.org/W2126564504","https://openalex.org/W2127513491","https://openalex.org/W2156306402","https://openalex.org/W2163262735","https://openalex.org/W4231005419","https://openalex.org/W4236674018","https://openalex.org/W6641884055","https://openalex.org/W6678664461"],"related_works":["https://openalex.org/W2058965144","https://openalex.org/W2164382479","https://openalex.org/W2146343568","https://openalex.org/W98480971","https://openalex.org/W2150291671","https://openalex.org/W2013643406","https://openalex.org/W2027972911","https://openalex.org/W2157978810","https://openalex.org/W2597809628","https://openalex.org/W3046370962"],"abstract_inverted_index":{"Process":[0],"variations":[1],"make":[2],"at-speed":[3,83],"testing":[4],"significantly":[5],"more":[6],"difficult.":[7],"They":[8],"cause":[9],"subtle":[10],"delay":[11],"changes":[12],"that":[13,64],"are":[14,80,100],"distributed":[15],"rather":[16],"than":[17],"the":[18,39,43,69,108],"localized":[19],"nature":[20],"of":[21,38,45,73,129],"a":[22,60,118,127],"traditional":[23],"fault":[24],"model.":[25],"Due":[26],"to":[27,51],"parametric":[28],"variations,":[29],"different":[30,36],"paths":[31,47,79,95],"can":[32,123],"be":[33,49,124],"critical":[34],"in":[35,126],"parts":[37],"process":[40,54],"space,":[41],"and":[42,66,94],"union":[44],"such":[46],"must":[48],"tested":[50],"obtain":[52],"good":[53],"space":[55],"coverage.":[56],"This":[57],"paper":[58],"proposes":[59],"novel":[61],"branch-and-bound":[62],"algorithm":[63],"elegantly":[65],"efficiently":[67],"solves":[68],"hitherto":[70],"open":[71],"problem":[72],"statistical":[74],"path":[75,109],"tracing.":[76],"The":[77],"resulting":[78],"used":[81],"for":[82,117],"structural":[84],"testing.":[85],"A":[86],"new":[87],"Test":[88],"Quality":[89],"Metric":[90],"(TQM)":[91],"is":[92,112],"proposed":[93],"which":[96],"maximize":[97],"this":[98],"metric":[99],"selected.":[101],"After":[102],"chip":[103,121],"timing":[104],"has":[105],"been":[106],"performed,":[107],"selection":[110,116],"procedure":[111],"extremely":[113],"efficient.":[114],"Path":[115],"multi-million":[119],"gate":[120],"design":[122],"completed":[125],"matter":[128],"seconds.":[130]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}