{"id":"https://openalex.org/W3147433721","doi":"https://doi.org/10.1109/iccad.2008.4681534","title":"Reliable system design: Models, metrics and design techniques","display_name":"Reliable system design: Models, metrics and design techniques","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W3147433721","doi":"https://doi.org/10.1109/iccad.2008.4681534","mag":"3147433721"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2008.4681534","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2008.4681534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Stanford Univ., Stanford, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford Univ., Stanford, CA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067802693","display_name":"Ravishankar K. Iyer","orcid":"https://orcid.org/0000-0003-2245-3038"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ravishankar K. Iyer","raw_affiliation_strings":["Univ. of Illinois, Urbana-Champaign, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Illinois, Urbana-Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036851432","display_name":"Kishor S. Trivedi","orcid":"https://orcid.org/0000-0001-7396-6330"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kishor Trivedi","raw_affiliation_strings":["Duke Univ., Durham, NC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Duke Univ., Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067753561","display_name":"James Tschanz","orcid":"https://orcid.org/0000-0003-0317-4332"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James W. Tschanz","raw_affiliation_strings":["Intel Corp., Hillsboro, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, OR","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"xi","last_page":"xi"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7517627477645874},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7044240832328796},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6926141977310181},{"id":"https://openalex.org/keywords/systems-design","display_name":"Systems design","score":0.4823445677757263},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4583122432231903},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.45234596729278564},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.4161866307258606},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2591816782951355},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.21423882246017456},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20292958617210388}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7517627477645874},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7044240832328796},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6926141977310181},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.4823445677757263},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4583122432231903},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.45234596729278564},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.4161866307258606},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2591816782951355},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.21423882246017456},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20292958617210388},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2008.4681534","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2008.4681534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W1607054433","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Design":[0],"of":[1,36,91],"reliable":[2,75],"systems":[3,47,96],"meeting":[4],"stringent":[5],"quality,":[6],"reliability,":[7],"and":[8,59,71,78,82,108,115,121],"availability":[9],"requirements":[10,117],"is":[11],"becoming":[12],"increasingly":[13],"difficult":[14],"in":[15,118],"advanced":[16],"technologies.":[17],"The":[18],"current":[19],"design":[20],"paradigm,":[21],"which":[22],"assumes":[23],"that":[24],"no":[25],"gate":[26],"or":[27],"interconnect":[28],"will":[29,67,86,124],"ever":[30],"operate":[31],"incorrectly":[32],"within":[33],"the":[34],"lifetime":[35],"a":[37,88],"product,":[38],"must":[39,48],"change":[40],"to":[41],"cope":[42],"with":[43,51,97],"this":[44],"situation.":[45],"Future":[46],"be":[49,126],"designed":[50],"built-in":[52],"mechanisms":[53],"for":[54,73,80,93,99],"failure":[55,103],"tolerance,":[56],"prediction,":[57,104],"detection":[58],"recovery":[60],"during":[61],"normal":[62],"system":[63],"operation.":[64],"This":[65],"tutorial":[66],"focus":[68],"on":[69],"models":[70],"metrics":[72],"designing":[74],"systems,":[76,85,120],"algorithms":[77],"tools":[79],"modeling":[81],"evaluating":[83],"such":[84,95],"discuss":[87],"broad":[89],"spectrum":[90],"techniques":[92],"building":[94],"support":[98],"concurrent":[100],"error":[101,105],"detection,":[102],"correction,":[106],"recovery,":[107],"self-repair.":[109],"Complex":[110],"interplay":[111],"between":[112],"power,":[113],"performance":[114],"reliability":[116],"future":[119],"associated":[122],"constraints":[123],"also":[125],"discussed.":[127]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}