{"id":"https://openalex.org/W4250959541","doi":"https://doi.org/10.1109/iccad.2007.4397359","title":"Combining static and dynamic defect-tolerance techniques for nanoscale memory systems","display_name":"Combining static and dynamic defect-tolerance techniques for nanoscale memory systems","publication_year":2007,"publication_date":"2007-11-01","ids":{"openalex":"https://openalex.org/W4250959541","doi":"https://doi.org/10.1109/iccad.2007.4397359"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2007.4397359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2007.4397359","pdf_url":null,"source":{"id":"https://openalex.org/S4210177401","display_name":"Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design","issn_l":"1092-3152","issn":["1092-3152","1558-2434"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077149716","display_name":"Susmit Biswas","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Susmit Biswas","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367358","display_name":"Gang Wang","orcid":"https://orcid.org/0000-0002-2288-3807"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gang Wang","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000231774","display_name":"Ryan Kastner","orcid":"https://orcid.org/0000-0001-9062-5570"},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan Kastner","raw_affiliation_strings":["University of California, Davis, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Davis, CA, USA","institution_ids":["https://openalex.org/I84218800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083979678","display_name":"Frederic T. Chong","orcid":"https://orcid.org/0000-0001-9282-4645"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Frederic T. Chong","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041175788","display_name":"Tzvetan S. Metodi","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tzvetan S. Metodi","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0777,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.81256702,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"773","last_page":"778"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7924385070800781},{"id":"https://openalex.org/keywords/bloom-filter","display_name":"Bloom filter","score":0.6131764054298401},{"id":"https://openalex.org/keywords/byte","display_name":"Byte","score":0.6110173463821411},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5767521858215332},{"id":"https://openalex.org/keywords/bootstrapping","display_name":"Bootstrapping (finance)","score":0.5207600593566895},{"id":"https://openalex.org/keywords/bch-code","display_name":"BCH code","score":0.475841760635376},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.463443785905838},{"id":"https://openalex.org/keywords/virtual-memory","display_name":"Virtual memory","score":0.4613964259624481},{"id":"https://openalex.org/keywords/dynamic-random-access-memory","display_name":"Dynamic random-access memory","score":0.4276352524757385},{"id":"https://openalex.org/keywords/memory-management","display_name":"Memory management","score":0.4263591468334198},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.36071884632110596},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3225324749946594},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.31790876388549805},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.24233397841453552}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7924385070800781},{"id":"https://openalex.org/C147224247","wikidata":"https://www.wikidata.org/wiki/Q885373","display_name":"Bloom filter","level":2,"score":0.6131764054298401},{"id":"https://openalex.org/C43364308","wikidata":"https://www.wikidata.org/wiki/Q8799","display_name":"Byte","level":2,"score":0.6110173463821411},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5767521858215332},{"id":"https://openalex.org/C207609745","wikidata":"https://www.wikidata.org/wiki/Q4944086","display_name":"Bootstrapping (finance)","level":2,"score":0.5207600593566895},{"id":"https://openalex.org/C42276685","wikidata":"https://www.wikidata.org/wiki/Q795705","display_name":"BCH code","level":3,"score":0.475841760635376},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.463443785905838},{"id":"https://openalex.org/C76399640","wikidata":"https://www.wikidata.org/wiki/Q189401","display_name":"Virtual memory","level":4,"score":0.4613964259624481},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.4276352524757385},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.4263591468334198},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.36071884632110596},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3225324749946594},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.31790876388549805},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.24233397841453552},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2007.4397359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2007.4397359","pdf_url":null,"source":{"id":"https://openalex.org/S4210177401","display_name":"Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design","issn_l":"1092-3152","issn":["1092-3152","1558-2434"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2052207834","https://openalex.org/W2087364765","https://openalex.org/W2114231460","https://openalex.org/W2123845384","https://openalex.org/W2136293553","https://openalex.org/W2139506349","https://openalex.org/W2153472456","https://openalex.org/W2153551298","https://openalex.org/W2154344146","https://openalex.org/W2155043144","https://openalex.org/W2156317949","https://openalex.org/W2169855483","https://openalex.org/W2497735908","https://openalex.org/W2999817033","https://openalex.org/W4229813013","https://openalex.org/W4232100597","https://openalex.org/W4234033339","https://openalex.org/W4239366183","https://openalex.org/W6677002304"],"related_works":["https://openalex.org/W1976766385","https://openalex.org/W2407165745","https://openalex.org/W2078640694","https://openalex.org/W261562921","https://openalex.org/W2026822084","https://openalex.org/W1421493983","https://openalex.org/W4243333834","https://openalex.org/W1698699620","https://openalex.org/W71081774","https://openalex.org/W2138847"],"abstract_inverted_index":{"Nanoscale":[0],"technology":[1],"promises":[2],"dramatically":[3],"increased":[4],"device":[5],"density,":[6],"but":[7,102],"also":[8],"decreased":[9],"reliability.":[10],"With":[11],"bit":[12],"error":[13,66,118],"rates":[14],"projected":[15],"to":[16,36],"be":[17,92],"as":[18,20,50,52],"high":[19],"10%,":[21],"designing":[22],"a":[23,29,38,62,73,110,114,122,128],"usable":[24],"nanoscale":[25],"memory":[26,55,129],"system":[27],"poses":[28],"significant":[30],"challenge.":[31],"In":[32],"particular,":[33],"we":[34,126],"need":[35],"bootstrap":[37],"sea":[39],"of":[40,64,80,116,131],"unreliable":[41],"bits":[42],"into":[43],"contiguous":[44],"address":[45],"ranges":[46],"which":[47,77],"are":[48,106],"preferably":[49],"large":[51],"4K-byte":[53,136],"virtual":[54],"pages.":[56],"We":[57],"accomplish":[58],"this":[59],"bootstrapping":[60],"through":[61],"combination":[63,115],"dynamic":[65],"correction":[67,119],"codes":[68,120],"within":[69],"32-bit":[70],"blocks":[71],"and":[72,121,133,140],"static":[74],"defect":[75,89,104,124],"map":[76],"tracks":[78],"usability":[79],"these":[81],"blocks.":[82],"The":[83],"key":[84],"insight":[85],"is":[86],"that":[87,103],"statically-determined":[88],"locations":[90],"can":[91],"much":[93],"more":[94],"powerful":[95],"than":[96],"dynamically":[97],"correcting":[98],"for":[99,135],"unknown":[100],"locations,":[101],"maps":[105],"only":[107],"practical":[108],"at":[109,138],"coarse":[111],"granularity.":[112],"Using":[113],"BCH":[117],"Bloom-Filter-based":[123],"map,":[125],"achieve":[127],"efficiency":[130],"60%":[132],"13%":[134],"pages":[137],"1%":[139],"10%":[141],"bit-error":[142],"rates,":[143],"respectively.":[144]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}