{"id":"https://openalex.org/W4242171773","doi":"https://doi.org/10.1109/iccad.2005.1560154","title":"Expression of Concern: Reducing pessimism in RLC delay estimation using an accurate analytical frequency dependent model for inductance","display_name":"Expression of Concern: Reducing pessimism in RLC delay estimation using an accurate analytical frequency dependent model for inductance","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W4242171773","doi":"https://doi.org/10.1109/iccad.2005.1560154"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2005.1560154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2005.1560154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111789913","display_name":"Mosin Mondal","orcid":null},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Mondal","raw_affiliation_strings":["Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA","Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057380866","display_name":"Yehia Massoud","orcid":"https://orcid.org/0000-0002-6701-0639"},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Massoud","raw_affiliation_strings":["Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA","Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I74775410"],"apc_list":null,"apc_paid":null,"fwci":7.0221,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.97763896,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.8736818432807922},{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.846301794052124},{"id":"https://openalex.org/keywords/pessimism","display_name":"Pessimism","score":0.7065767049789429},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.616872251033783},{"id":"https://openalex.org/keywords/multivibrator","display_name":"Multivibrator","score":0.4804919958114624},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46828266978263855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4482835829257965},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20937669277191162},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16537317633628845},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.12112462520599365}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.8736818432807922},{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.846301794052124},{"id":"https://openalex.org/C9992130","wikidata":"https://www.wikidata.org/wiki/Q484954","display_name":"Pessimism","level":2,"score":0.7065767049789429},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.616872251033783},{"id":"https://openalex.org/C198537423","wikidata":"https://www.wikidata.org/wiki/Q259838","display_name":"Multivibrator","level":3,"score":0.4804919958114624},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46828266978263855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4482835829257965},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20937669277191162},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16537317633628845},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.12112462520599365},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2005.1560154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2005.1560154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2026188268","https://openalex.org/W2031538835","https://openalex.org/W2071467620","https://openalex.org/W2075891646","https://openalex.org/W2097246805","https://openalex.org/W2099744220","https://openalex.org/W2105635940","https://openalex.org/W2107915259","https://openalex.org/W2131345780","https://openalex.org/W2157763958","https://openalex.org/W2160428624","https://openalex.org/W2167478831","https://openalex.org/W2567262142","https://openalex.org/W4205259921","https://openalex.org/W4230545336","https://openalex.org/W4240630201","https://openalex.org/W4247380242"],"related_works":["https://openalex.org/W2045825909","https://openalex.org/W2366528284","https://openalex.org/W2367958769","https://openalex.org/W2088179597","https://openalex.org/W2347686112","https://openalex.org/W2389120046","https://openalex.org/W2105517597","https://openalex.org/W1549949180","https://openalex.org/W1970844660","https://openalex.org/W2547002293"],"abstract_inverted_index":{"The":[0],"increasing":[1],"demand":[2],"for":[3,14],"high":[4,52],"performance":[5],"ICs":[6],"and":[7,108,111],"system":[8,122],"on":[9],"chip":[10,18],"necessitates":[11],"reliable":[12],"methodologies":[13],"reducing":[15],"pessimism":[16,41],"in":[17,42],"design.":[19],"In":[20],"this":[21],"paper,":[22],"we":[23,76],"investigate":[24],"how":[25],"the":[26,34,40,43,56],"frequency":[27,57,82],"dependence":[28,58],"of":[29,45,59,68,81,96],"loop":[30,84],"self":[31,85],"inductance":[32,60,86],"affects":[33],"RLC":[35,46,73],"delay.":[36],"We":[37,100],"show":[38],"that":[39,87,102,117],"estimation":[44],"propagation":[47],"delay":[48,74,115],"could":[49],"be":[50,89],"as":[51,53],"30%":[54],"if":[55],"is":[61,105],"not":[62],"considered":[63],"properly.":[64],"As":[65],"a":[66,93],"means":[67],"efficiently":[69],"computing":[70],"less":[71],"pessimistic":[72],"values,":[75],"present":[77],"an":[78],"analytical":[79],"model":[80,92],"dependent":[83],"can":[88],"applied":[90],"to":[91,119],"wide":[94],"range":[95],"real":[97],"design":[98],"scenarios.":[99],"demonstrate":[101],"our":[103],"approach":[104],"computationally":[106],"efficient":[107],"produces":[109],"accurate":[110],"realistic":[112],"(less":[113],"pessimistic)":[114],"values":[116],"lead":[118],"significantly":[120],"improved":[121],"performance.":[123]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}