{"id":"https://openalex.org/W4241433978","doi":"https://doi.org/10.1109/iccad.2005.1560100","title":"DiCER: distributed and cost-effective redundancy for variation tolerance","display_name":"DiCER: distributed and cost-effective redundancy for variation tolerance","publication_year":2005,"publication_date":"2005-12-22","ids":{"openalex":"https://openalex.org/W4241433978","doi":"https://doi.org/10.1109/iccad.2005.1560100"},"language":"en","primary_location":{"id":"doi:10.1109/iccad.2005.1560100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2005.1560100","pdf_url":null,"source":{"id":"https://openalex.org/S4363608058","display_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100599890","display_name":"Di Wu","orcid":"https://orcid.org/0000-0002-4753-8161"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Di Wu","raw_affiliation_strings":["Department of Computer Science, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014776616","display_name":"G. Venkataraman","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Venkataraman","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100326930","display_name":"Jiang Hu","orcid":"https://orcid.org/0000-0003-4243-8767"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiang Hu","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072626743","display_name":"Quiyang Li","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Quiyang Li","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039721027","display_name":"R. Mahapatra","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Mahapatra","raw_affiliation_strings":["Department of Computer Science, Texas A and M University, College Station, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5447,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70425476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"393","last_page":"397"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8379258513450623},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6187956929206848},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6182153820991516},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5857462286949158},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5380721688270569},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4331413507461548},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4189344048500061},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3872532844543457},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.367186963558197},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3121901750564575},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19899192452430725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1772179901599884},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17233771085739136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09164106845855713}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8379258513450623},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6187956929206848},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6182153820991516},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5857462286949158},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5380721688270569},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4331413507461548},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4189344048500061},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3872532844543457},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.367186963558197},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3121901750564575},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19899192452430725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1772179901599884},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17233771085739136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09164106845855713},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccad.2005.1560100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccad.2005.1560100","pdf_url":null,"source":{"id":"https://openalex.org/S4363608058","display_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1984954427","https://openalex.org/W1984960541","https://openalex.org/W2002982872","https://openalex.org/W2006589289","https://openalex.org/W2085394932","https://openalex.org/W2094806828","https://openalex.org/W2110687226","https://openalex.org/W2115468286","https://openalex.org/W2115554176","https://openalex.org/W2126986464","https://openalex.org/W2131909792","https://openalex.org/W2154347669","https://openalex.org/W2159221249","https://openalex.org/W2165081508","https://openalex.org/W2312852230","https://openalex.org/W4231119589","https://openalex.org/W4232019485","https://openalex.org/W4237955880","https://openalex.org/W4250899749","https://openalex.org/W4255547381","https://openalex.org/W6651062404","https://openalex.org/W6676505589","https://openalex.org/W6678675210","https://openalex.org/W6681143310","https://openalex.org/W6682384967"],"related_works":["https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W2158463942","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W2036953450","https://openalex.org/W4300955944","https://openalex.org/W2170004886"],"abstract_inverted_index":{"Increasingly":[0],"prominent":[1],"variational":[2],"effects":[3],"impose":[4],"imminent":[5],"threat":[6],"to":[7,61,84,105],"the":[8],"progress":[9],"of":[10],"VLSI":[11],"technology.":[12],"This":[13],"work":[14],"explores":[15],"redundancy,":[16],"which":[17,71],"is":[18,28,52,82],"a":[19,48],"well-known":[20],"fault":[21],"tolerance":[22],"technique,":[23],"for":[24,54],"variation":[25],"tolerance.":[26],"It":[27],"observed":[29],"that":[30,96],"delay":[31,67],"variability":[32],"can":[33,99],"be":[34],"reduced":[35],"by":[36,74],"making":[37],"redundant":[38],"paths":[39],"distributed":[40,56],"or":[41],"less":[42],"correlated.":[43],"Based":[44],"on":[45,92,111,117,119],"this":[46],"observation,":[47],"gate":[49,75,79],"splitting":[50],"methodology":[51],"proposed":[53],"achieving":[55],"redundancy.":[57],"We":[58],"show":[59,95],"how":[60],"avoid":[62],"short":[63],"circuit":[64],"and":[65,114],"estimate":[66],"in":[68],"dual-driver":[69],"nets":[70],"are":[72],"caused":[73],"splitting.":[76],"A":[77],"spin-off":[78],"placement":[80],"heuristic":[81],"developed":[83],"minimize":[85],"redundancy":[86],"cost.":[87],"Monte":[88],"Carlo":[89],"simulation":[90],"results":[91],"benchmark":[93],"circuits":[94],"our":[97],"method":[98],"improve":[100],"timing":[101],"yield":[102],"from":[103],"59%":[104],"72%":[106],"with":[107],"only":[108],"03%":[109],"increase":[110,116],"cell":[112],"area":[113],"2.2%":[115],"wirelength":[118],"average.":[120]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}