{"id":"https://openalex.org/W4388280170","doi":"https://doi.org/10.1109/icbase59196.2023.10303229","title":"Intelligent electronic information equipment maintenance and testing system based on general test instruments","display_name":"Intelligent electronic information equipment maintenance and testing system based on general test instruments","publication_year":2023,"publication_date":"2023-08-25","ids":{"openalex":"https://openalex.org/W4388280170","doi":"https://doi.org/10.1109/icbase59196.2023.10303229"},"language":"en","primary_location":{"id":"doi:10.1109/icbase59196.2023.10303229","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icbase59196.2023.10303229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 4th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075905329","display_name":"Qiang Gao","orcid":"https://orcid.org/0000-0001-7860-6692"},"institutions":[{"id":"https://openalex.org/I4210142464","display_name":"FORCE Technology (Norway)","ror":"https://ror.org/04rccsv84","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210087957","https://openalex.org/I4210142464"]}],"countries":["NO"],"is_corresponding":true,"raw_author_name":"Qiang Gao","raw_affiliation_strings":["Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","Department of Information Applicationline, Army Armoured Force Academy, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","institution_ids":["https://openalex.org/I4210142464"]},{"raw_affiliation_string":"Department of Information Applicationline, Army Armoured Force Academy, Changchun, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006197777","display_name":"Minglei Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142464","display_name":"FORCE Technology (Norway)","ror":"https://ror.org/04rccsv84","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210087957","https://openalex.org/I4210142464"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Minglei Zhang","raw_affiliation_strings":["Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","Department of Information Applicationline, Army Armoured Force Academy, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","institution_ids":["https://openalex.org/I4210142464"]},{"raw_affiliation_string":"Department of Information Applicationline, Army Armoured Force Academy, Changchun, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100524708","display_name":"Deyi Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142464","display_name":"FORCE Technology (Norway)","ror":"https://ror.org/04rccsv84","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210087957","https://openalex.org/I4210142464"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Deyi Sun","raw_affiliation_strings":["Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","Department of Information Applicationline, Army Armoured Force Academy, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Army Armoured Force Academy,Department of Information Applicationline,Changchun,China","institution_ids":["https://openalex.org/I4210142464"]},{"raw_affiliation_string":"Department of Information Applicationline, Army Armoured Force Academy, Changchun, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5075905329"],"corresponding_institution_ids":["https://openalex.org/I4210142464"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17207582,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":null,"first_page":"216","last_page":"220"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","score":0.9693999886512756,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.9567999839782715,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.577166736125946},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5378605127334595},{"id":"https://openalex.org/keywords/personalization","display_name":"Personalization","score":0.4858784079551697},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.4568932056427002},{"id":"https://openalex.org/keywords/electronic-equipment","display_name":"Electronic equipment","score":0.43128451704978943},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4234238266944885},{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.41624343395233154},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3610694408416748},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3053974509239197},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.14344412088394165},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.07504978775978088}],"concepts":[{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.577166736125946},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5378605127334595},{"id":"https://openalex.org/C183003079","wikidata":"https://www.wikidata.org/wiki/Q1000371","display_name":"Personalization","level":2,"score":0.4858784079551697},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.4568932056427002},{"id":"https://openalex.org/C2989044035","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronic equipment","level":2,"score":0.43128451704978943},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4234238266944885},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.41624343395233154},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3610694408416748},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3053974509239197},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.14344412088394165},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.07504978775978088},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icbase59196.2023.10303229","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icbase59196.2023.10303229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 4th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2990875860"],"related_works":["https://openalex.org/W1995271078","https://openalex.org/W1987309108","https://openalex.org/W2113104568","https://openalex.org/W2377615409","https://openalex.org/W2024082119","https://openalex.org/W4313258939","https://openalex.org/W3095521286","https://openalex.org/W2184521093","https://openalex.org/W2334152010","https://openalex.org/W2141040213"],"abstract_inverted_index":{"This":[0],"paper":[1],"mainly":[2],"aims":[3],"at":[4],"the":[5,31,57,75],"problems":[6],"such":[7],"as":[8],"poor":[9],"compatibility":[10,81],"and":[11,20,23,26,29,45,79],"universality":[12],"of":[13,41,59,82],"current":[14],"electronic":[15,52,83],"information":[16,53,84],"equipment":[17,22,35,54],"(equipment)":[18],"maintenance":[19,48,77],"testing":[21,49,78],"weak":[24],"customization":[25],"expansion":[27],"ability,":[28],"changes":[30],"previous":[32],"\"one-to-one\"":[33],"special":[34],"development":[36],"mode":[37,58],"for":[38,51],"specific":[39],"types":[40],"equipment.":[42,85],"An":[43],"intelligent":[44,76],"open":[46,64],"general":[47],"system":[50],"based":[55],"on":[56],"\"universal":[60],"test":[61,65],"instrument":[62],"+":[63,67],"planning":[66],"broad":[68],"spectrum":[69],"adapter\"":[70],"is":[71],"proposed":[72],"to":[73],"realize":[74],"universal":[80]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}