{"id":"https://openalex.org/W3005969365","doi":"https://doi.org/10.1109/icb45273.2019.8987306","title":"NIR-to-VIS Face Recognition via Embedding Relations and Coordinates of the Pairwise Features","display_name":"NIR-to-VIS Face Recognition via Embedding Relations and Coordinates of the Pairwise Features","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W3005969365","doi":"https://doi.org/10.1109/icb45273.2019.8987306","mag":"3005969365"},"language":"en","primary_location":{"id":"doi:10.1109/icb45273.2019.8987306","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icb45273.2019.8987306","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Biometrics (ICB)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010029584","display_name":"MyeongAh Cho","orcid":"https://orcid.org/0000-0001-9330-2785"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210101332","display_name":"Group Image (Poland)","ror":"https://ror.org/01fba6t94","country_code":"PL","type":"company","lineage":["https://openalex.org/I4210101332"]}],"countries":["KR","PL"],"is_corresponding":false,"raw_author_name":"MyeongAh Cho","raw_affiliation_strings":["Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","institution_ids":["https://openalex.org/I4210101332"]},{"raw_affiliation_string":"Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016450375","display_name":"Tae\u2010Young Chung","orcid":"https://orcid.org/0000-0002-7291-822X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210101332","display_name":"Group Image (Poland)","ror":"https://ror.org/01fba6t94","country_code":"PL","type":"company","lineage":["https://openalex.org/I4210101332"]}],"countries":["KR","PL"],"is_corresponding":false,"raw_author_name":"Tae-young Chung","raw_affiliation_strings":["Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","institution_ids":["https://openalex.org/I4210101332"]},{"raw_affiliation_string":"Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028212198","display_name":"Taeoh Kim","orcid":"https://orcid.org/0000-0001-7252-5525"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210101332","display_name":"Group Image (Poland)","ror":"https://ror.org/01fba6t94","country_code":"PL","type":"company","lineage":["https://openalex.org/I4210101332"]}],"countries":["KR","PL"],"is_corresponding":false,"raw_author_name":"Taeoh Kim","raw_affiliation_strings":["Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","institution_ids":["https://openalex.org/I4210101332"]},{"raw_affiliation_string":"Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015739530","display_name":"Sangyoun Lee","orcid":"https://orcid.org/0000-0003-0394-6777"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210101332","display_name":"Group Image (Poland)","ror":"https://ror.org/01fba6t94","country_code":"PL","type":"company","lineage":["https://openalex.org/I4210101332"]}],"countries":["KR","PL"],"is_corresponding":false,"raw_author_name":"Sangyoun Lee","raw_affiliation_strings":["Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering,Republic of Korea","institution_ids":["https://openalex.org/I4210101332"]},{"raw_affiliation_string":"Image and Video Pattern Recognition Laboratory School of Electrical and Electronic Engineering, Yonsei University, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8135,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.78249642,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10828","display_name":"Biometric Identification and Security","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7419351935386658},{"id":"https://openalex.org/keywords/facial-recognition-system","display_name":"Facial recognition system","score":0.7058430910110474},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6948573589324951},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6597109436988831},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.6543869376182556},{"id":"https://openalex.org/keywords/face","display_name":"Face (sociological concept)","score":0.6174554228782654},{"id":"https://openalex.org/keywords/invariant","display_name":"Invariant (physics)","score":0.6074380278587341},{"id":"https://openalex.org/keywords/pairwise-comparison","display_name":"Pairwise comparison","score":0.5789747834205627},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4332263469696045},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.43266212940216064},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.412122517824173},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.35475894808769226},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23292234539985657},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.18941211700439453}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7419351935386658},{"id":"https://openalex.org/C31510193","wikidata":"https://www.wikidata.org/wiki/Q1192553","display_name":"Facial recognition system","level":3,"score":0.7058430910110474},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6948573589324951},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6597109436988831},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.6543869376182556},{"id":"https://openalex.org/C2779304628","wikidata":"https://www.wikidata.org/wiki/Q3503480","display_name":"Face (sociological concept)","level":2,"score":0.6174554228782654},{"id":"https://openalex.org/C190470478","wikidata":"https://www.wikidata.org/wiki/Q2370229","display_name":"Invariant (physics)","level":2,"score":0.6074380278587341},{"id":"https://openalex.org/C184898388","wikidata":"https://www.wikidata.org/wiki/Q1435712","display_name":"Pairwise comparison","level":2,"score":0.5789747834205627},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4332263469696045},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.43266212940216064},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.412122517824173},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.35475894808769226},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23292234539985657},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.18941211700439453},{"id":"https://openalex.org/C37914503","wikidata":"https://www.wikidata.org/wiki/Q156495","display_name":"Mathematical physics","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icb45273.2019.8987306","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icb45273.2019.8987306","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Biometrics (ICB)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W1562230821","https://openalex.org/W1592934690","https://openalex.org/W1782590233","https://openalex.org/W2061273563","https://openalex.org/W2085810284","https://openalex.org/W2096733369","https://openalex.org/W2145287260","https://openalex.org/W2152788298","https://openalex.org/W2153288431","https://openalex.org/W2187089797","https://openalex.org/W2417434257","https://openalex.org/W2510111515","https://openalex.org/W2515770085","https://openalex.org/W2523746035","https://openalex.org/W2551624499","https://openalex.org/W2600537992","https://openalex.org/W2604145683","https://openalex.org/W2753407461","https://openalex.org/W2784163702","https://openalex.org/W2962793481","https://openalex.org/W2962898354","https://openalex.org/W2963403868","https://openalex.org/W2963460857","https://openalex.org/W2963466847","https://openalex.org/W2963600167","https://openalex.org/W2963623257","https://openalex.org/W2963777788","https://openalex.org/W2963809521","https://openalex.org/W2963907629","https://openalex.org/W2963963898","https://openalex.org/W2969985801","https://openalex.org/W3099206234","https://openalex.org/W3103152812","https://openalex.org/W4293478066","https://openalex.org/W4320013936","https://openalex.org/W4385245566","https://openalex.org/W6633630069","https://openalex.org/W6635370893","https://openalex.org/W6638046521","https://openalex.org/W6725456855","https://openalex.org/W6727794398","https://openalex.org/W6735711420","https://openalex.org/W6736298909","https://openalex.org/W6738893770","https://openalex.org/W6739901393","https://openalex.org/W6742741447","https://openalex.org/W6743905813","https://openalex.org/W6744109851","https://openalex.org/W6748010250","https://openalex.org/W6753441378","https://openalex.org/W6779669310","https://openalex.org/W6842019321"],"related_works":["https://openalex.org/W2487162673","https://openalex.org/W2793211469","https://openalex.org/W2949152769","https://openalex.org/W4372354731","https://openalex.org/W2807634898","https://openalex.org/W1692008701","https://openalex.org/W2942366970","https://openalex.org/W2597588799","https://openalex.org/W1968265719","https://openalex.org/W2985118265"],"abstract_inverted_index":{"NIR-to-VIS":[0],"face":[1,32,44,58,66,159],"recognition":[2,45,59,160],"is":[3,16,89],"identifying":[4],"faces":[5],"of":[6,30,70,73,198],"two":[7,23,78,204],"different":[8,24,79],"domains":[9],"by":[10],"extracting":[11],"domain-invariant":[12,91,119],"features.":[13],"However,":[14],"this":[15],"a":[17,49],"challenging":[18],"problem":[19],"due":[20],"to":[21,36,56,82,93,101,111,115,168,203],"the":[22,28,42,74,84,134,157,171,186],"domain":[25,38,80],"characteristics,":[26,81],"and":[27,130,150,194],"lack":[29],"NIR":[31],"dataset.":[33,174],"In":[34,99,121],"order":[35],"reduce":[37],"discrepancy":[39],"while":[40],"using":[41],"existing":[43],"models,":[46,161],"we":[47,189],"propose":[48],"'Relation":[50],"Module'":[51],"which":[52],"can":[53],"simply":[54],"add-on":[55,163],"any":[57],"models.":[60,206],"The":[61,175],"local":[62,87],"features":[63,88],"extracted":[64],"from":[65,109,156],"image":[67],"contain":[68],"information":[69,105],"each":[71],"component":[72],"face.":[75],"Based":[76],"on":[77],"use":[83,94],"relationships":[85],"between":[86],"more":[90],"than":[92],"it":[95,97],"as":[96,107],"is.":[98],"addition":[100],"these":[102],"relationships,":[103,129],"positional":[104,135],"such":[106],"distance":[108],"lips":[110],"chin":[112],"or":[113],"eye":[114],"eye,":[116],"also":[117],"provides":[118],"information.":[120,136],"our":[122,138,162],"Relation":[123,125],"Module,":[124],"Layer":[126,132],"implicitly":[127],"captures":[128],"Coordinates":[131],"models":[133],"Also,":[137],"proposed":[139,176,187],"Triplet":[140],"loss":[141],"with":[142,170,180],"conditional":[143],"margin":[144],"reduces":[145],"intra-class":[146],"variation":[147],"in":[148,152],"training,":[149],"resulting":[151],"additional":[153],"performance":[154],"improvements.Different":[155],"general":[158],"module":[164,177],"does":[165],"not":[166],"need":[167],"pre-train":[169],"large":[172],"scale":[173],"fine-tuned":[178],"only":[179],"CASIA":[181],"NIR-VIS":[182],"2.0":[183],"database.":[184],"With":[185],"module,":[188],"achieve":[190],"14.81%":[191],"rank-1":[192],"accuracy":[193],"15.47%":[195],"verification":[196],"rate":[197],"0.1%":[199],"FAR":[200],"improvements":[201],"compare":[202],"baseline":[205]},"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}