{"id":"https://openalex.org/W3160616384","doi":"https://doi.org/10.1109/icassp39728.2021.9413861","title":"Learning Sparsifying Transforms for Image Reconstruction in Electrical Impedance Tomography","display_name":"Learning Sparsifying Transforms for Image Reconstruction in Electrical Impedance Tomography","publication_year":2021,"publication_date":"2021-05-13","ids":{"openalex":"https://openalex.org/W3160616384","doi":"https://doi.org/10.1109/icassp39728.2021.9413861","mag":"3160616384"},"language":"en","primary_location":{"id":"doi:10.1109/icassp39728.2021.9413861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp39728.2021.9413861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICASSP 2021 - 2021 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081718067","display_name":"Kaiyi Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kaiyi Yang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033065397","display_name":"Narong Borijindargoon","orcid":"https://orcid.org/0000-0002-7663-1680"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Narong Borijindargoon","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022525550","display_name":"Eng\u2010Poh Ng","orcid":"https://orcid.org/0000-0002-1260-4552"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Boon Poh Ng","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101799762","display_name":"Saiprasad Ravishankar","orcid":"https://orcid.org/0000-0002-5792-5827"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saiprasad Ravishankar","raw_affiliation_strings":["Michigan State University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Michigan State University, USA","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024709593","display_name":"Bihan Wen","orcid":"https://orcid.org/0000-0002-6874-6453"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bihan Wen","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.407,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.44034655,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"114","issue":null,"first_page":"1405","last_page":"1409"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9522250294685364},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.7972935438156128},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.7026388645172119},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5862098932266235},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.5846686363220215},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5403113961219788},{"id":"https://openalex.org/keywords/regularization","display_name":"Regularization (linguistics)","score":0.5051260590553284},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4997060298919678},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49519625306129456},{"id":"https://openalex.org/keywords/reconstruction-algorithm","display_name":"Reconstruction algorithm","score":0.4490903615951538},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.44419485330581665},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39595139026641846},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20307478308677673},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20285123586654663},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10492292046546936}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9522250294685364},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.7972935438156128},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.7026388645172119},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5862098932266235},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.5846686363220215},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5403113961219788},{"id":"https://openalex.org/C2776135515","wikidata":"https://www.wikidata.org/wiki/Q17143721","display_name":"Regularization (linguistics)","level":2,"score":0.5051260590553284},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4997060298919678},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49519625306129456},{"id":"https://openalex.org/C2779898584","wikidata":"https://www.wikidata.org/wiki/Q7820109","display_name":"Reconstruction algorithm","level":3,"score":0.4490903615951538},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.44419485330581665},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39595139026641846},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20307478308677673},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20285123586654663},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10492292046546936},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icassp39728.2021.9413861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp39728.2021.9413861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICASSP 2021 - 2021 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1506932342","https://openalex.org/W1777984739","https://openalex.org/W1992844490","https://openalex.org/W1994097344","https://openalex.org/W1995190553","https://openalex.org/W1999518795","https://openalex.org/W2028349405","https://openalex.org/W2039506751","https://openalex.org/W2041556066","https://openalex.org/W2046778170","https://openalex.org/W2053510218","https://openalex.org/W2075157914","https://openalex.org/W2087768903","https://openalex.org/W2105711496","https://openalex.org/W2112890043","https://openalex.org/W2138838870","https://openalex.org/W2141039087","https://openalex.org/W2156062145","https://openalex.org/W2160547390","https://openalex.org/W2189938900","https://openalex.org/W2553857241","https://openalex.org/W2612783405","https://openalex.org/W2735337215","https://openalex.org/W2897807752","https://openalex.org/W2996952367","https://openalex.org/W3012209675","https://openalex.org/W6638305679","https://openalex.org/W6660475368","https://openalex.org/W7065563295"],"related_works":["https://openalex.org/W2553917976","https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W4239884404","https://openalex.org/W3160616384","https://openalex.org/W2000128178","https://openalex.org/W2537891456","https://openalex.org/W2902419700","https://openalex.org/W2089974647","https://openalex.org/W2093495347"],"abstract_inverted_index":{"Electrical":[0,85],"Impedance":[1,86],"Tomography":[2],"(EIT)":[3],"is":[4,23,135],"a":[5,18,62,67,104],"fast":[6],"and":[7,33,61,117,127],"non-invasive":[8],"imaging":[9],"technology":[10],"that":[11,131],"reconstructs":[12],"the":[13,46,71,79,91,114,119,132,152],"internal":[14],"electrical":[15],"properties":[16],"of":[17,48,81,95],"subject.":[19],"However,":[20],"its":[21],"functionality":[22],"limited":[24],"by":[25],"low":[26],"spatial":[27],"resolution":[28],"arising":[29],"from":[30],"an":[31],"ill-posed":[32],"ill-conditioned":[34],"inverse":[35],"problem.":[36],"Several":[37],"sparsity-promoting":[38],"regularization":[39],"methods":[40],"have":[41],"been":[42],"applied":[43],"to":[44,157],"improve":[45],"quality":[47],"EIT":[49,99,145],"image":[50,100],"reconstruction,":[51],"including":[52],"various":[53],"\u21130and":[54],"\u21131-based":[55],"analytical":[56],"models":[57],"(TV,":[58],"TwIST,":[59],"etc.),":[60],"patch-based":[63],"sparse":[64],"representation":[65],"via":[66],"learned":[68],"dictionary":[69],"(using":[70],"K-SVD":[72],"algorithm),":[73],"dubbed":[74,109],"CS-EIT.":[75,162],"To":[76],"further":[77],"exploit":[78],"potential":[80],"compressed":[82,106],"sensing":[83,107],"in":[84,128,155],"Tomography,":[87],"this":[88],"paper":[89],"incorporates":[90],"recent":[92],"novel":[93],"method":[94],"transform":[96,116],"learning":[97],"for":[98,142],"reconstruction.":[101],"We":[102,122],"propose":[103],"blind":[105],"algorithm,":[108],"TL-EIT,":[110],"which":[111],"simultaneously":[112],"optimizes":[113],"sparsifying":[115],"updates":[118],"reconstructed":[120],"image.":[121],"demonstrate":[123],"using":[124],"both":[125],"synthetic":[126],"vivo":[129],"data":[130],"proposed":[133],"TL-EIT":[134,149],"more":[136],"effective":[137],"than":[138],"other":[139,158],"sparsity-based":[140],"algorithms":[141,160],"reconstructing":[143],"high-quality":[144],"images.":[146],"In":[147],"addition,":[148],"also":[150],"accelerates":[151],"reconstruction":[153],"process":[154],"comparison":[156],"learning-based":[159],"like":[161]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}