{"id":"https://openalex.org/W2093702845","doi":"https://doi.org/10.1109/icassp.2014.6855115","title":"Non-uniform sampling and Gaussian process regression in transport of intensity phase imaging","display_name":"Non-uniform sampling and Gaussian process regression in transport of intensity phase imaging","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2093702845","doi":"https://doi.org/10.1109/icassp.2014.6855115","mag":"2093702845"},"language":"en","primary_location":{"id":"doi:10.1109/icassp.2014.6855115","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2014.6855115","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015639414","display_name":"Jingshan Zhong","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["SG","US"],"is_corresponding":true,"raw_author_name":"Zhong Jingshan","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053363056","display_name":"Rene A. Claus","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rene A. Claus","raw_affiliation_strings":["Applied Science and Technology, University of California, Berkeley","Applied Science and Technology, University of California, Berkeley, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Applied Science and Technology, University of California, Berkeley","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Applied Science and Technology, University of California, Berkeley, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082613025","display_name":"Justin Dauwels","orcid":"https://orcid.org/0000-0002-4390-1568"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Justin Dauwels","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013887346","display_name":"Lei Tian","orcid":"https://orcid.org/0000-0002-1316-4456"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lei Tian","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013394127","display_name":"Laura Waller","orcid":"https://orcid.org/0000-0003-1243-2356"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laura Waller","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences, University of California, Berkeley","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5015639414"],"corresponding_institution_ids":["https://openalex.org/I172675005","https://openalex.org/I95457486"],"apc_list":null,"apc_paid":null,"fwci":0.2179,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60201022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"77","issue":null,"first_page":"7784","last_page":"7788"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.637365460395813},{"id":"https://openalex.org/keywords/intensity","display_name":"Intensity (physics)","score":0.6280799508094788},{"id":"https://openalex.org/keywords/kriging","display_name":"Kriging","score":0.587070643901825},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5189699530601501},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.5186523795127869},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.5104542970657349},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5054681301116943},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5041259527206421},{"id":"https://openalex.org/keywords/gaussian-noise","display_name":"Gaussian noise","score":0.4124411940574646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4087991714477539},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.36202001571655273},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.32802581787109375},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2977452874183655},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2965559959411621},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2230066955089569},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.17120307683944702}],"concepts":[{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.637365460395813},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.6280799508094788},{"id":"https://openalex.org/C81692654","wikidata":"https://www.wikidata.org/wiki/Q225926","display_name":"Kriging","level":2,"score":0.587070643901825},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5189699530601501},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.5186523795127869},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.5104542970657349},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5054681301116943},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5041259527206421},{"id":"https://openalex.org/C4199805","wikidata":"https://www.wikidata.org/wiki/Q2725903","display_name":"Gaussian noise","level":2,"score":0.4124411940574646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4087991714477539},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.36202001571655273},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.32802581787109375},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2977452874183655},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2965559959411621},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2230066955089569},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.17120307683944702},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icassp.2014.6855115","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2014.6855115","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.706.9141","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.706.9141","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.dauwels.com/Papers/GP%20TIE%20ICASSP.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W360867074","https://openalex.org/W1746819321","https://openalex.org/W1941181464","https://openalex.org/W1947092456","https://openalex.org/W1967211915","https://openalex.org/W1978467032","https://openalex.org/W1988760876","https://openalex.org/W1990975024","https://openalex.org/W1998609274","https://openalex.org/W2001118182","https://openalex.org/W2013131996","https://openalex.org/W2018044251","https://openalex.org/W2021503537","https://openalex.org/W2037475910","https://openalex.org/W2040583022","https://openalex.org/W2055129569","https://openalex.org/W2091775960","https://openalex.org/W2137467792","https://openalex.org/W2150823344","https://openalex.org/W2155950906","https://openalex.org/W4211049957","https://openalex.org/W4246688718"],"related_works":["https://openalex.org/W566010457","https://openalex.org/W2600092203","https://openalex.org/W4293503520","https://openalex.org/W4300066510","https://openalex.org/W2056958800","https://openalex.org/W2803685231","https://openalex.org/W3134152097","https://openalex.org/W4311388919","https://openalex.org/W2966696655","https://openalex.org/W2115519811"],"abstract_inverted_index":{"Gaussian":[0,110],"process":[1],"(GP)":[2],"regression":[3,7,59],"is":[4,101],"a":[5,28,126],"nonparametric":[6],"method":[8,100,115],"that":[9,20,80],"can":[10,24,89],"be":[11,25,90,104],"used":[12],"to":[13,27,56,60,103,136],"predict":[14],"continuous":[15],"quantities.":[16],"Here,":[17],"we":[18,53],"show":[19,131],"the":[21,44,62,67,94,114,119],"same":[22],"technique":[23],"applied":[26],"class":[29],"of":[30,37,46,69,109,121],"phase":[31,84,120],"imaging":[32],"techniques":[33],"based":[34],"on":[35],"measurements":[36],"intensity":[38,47,64],"at":[39],"multiple":[40],"propagation":[41,70,74],"distances,":[42],"i.e.":[43],"transport":[45],"equation":[48],"(TIE).":[49],"In":[50],"this":[51],"paper,":[52],"demonstrate":[54],"how":[55],"apply":[57],"GP":[58,96],"estimate":[61],"first":[63],"derivative":[65],"along":[66],"direction":[68],"and":[71,130],"incorporate":[72],"non-uniform":[73],"distance":[75],"sampling.":[76],"The":[77,99],"low-frequency":[78],"artifacts":[79],"often":[81],"occur":[82],"in":[83,125],"recovery":[85],"using":[86],"traditional":[87],"methods":[88],"significantly":[91],"suppressed":[92],"by":[93,117],"proposed":[95],"TIE":[97,138],"method.":[98],"shown":[102],"stable":[105],"with":[106],"moderate":[107],"amounts":[108],"noise.":[111],"We":[112],"validate":[113],"experimentally":[116],"recovering":[118],"human":[122],"cheek":[123],"cells":[124],"bright":[127],"field":[128],"microscope":[129],"better":[132],"performance":[133],"as":[134],"compared":[135],"other":[137],"reconstruction":[139],"methods.":[140]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}