{"id":"https://openalex.org/W2141794696","doi":"https://doi.org/10.1109/icassp.2013.6638109","title":"Soft-decision decoding with cell to cell interference removed signal in nand flash memory","display_name":"Soft-decision decoding with cell to cell interference removed signal in nand flash memory","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2141794696","doi":"https://doi.org/10.1109/icassp.2013.6638109","mag":"2141794696"},"language":"en","primary_location":{"id":"doi:10.1109/icassp.2013.6638109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2013.6638109","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Acoustics, Speech and Signal Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100654316","display_name":"Donghwan Lee","orcid":"https://orcid.org/0000-0002-3878-6876"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Dong-hwan Lee","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea#TAB#","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113491293","display_name":"Wonyong Sung","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wonyong Sung","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea#TAB#","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100654316"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":1.0874,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.81700855,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"2518","last_page":"2522"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.73506760597229},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6945661306381226},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.6471301317214966},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.604817271232605},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.60039222240448},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5938441753387451},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.5423324108123779},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.49388986825942993},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4740543067455292},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4648384749889374},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.4204220473766327},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36024922132492065},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3338441848754883},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.24128767848014832},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12274965643882751},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09283265471458435},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0925397276878357},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08134445548057556},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07362553477287292},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.07224321365356445}],"concepts":[{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.73506760597229},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6945661306381226},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.6471301317214966},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.604817271232605},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.60039222240448},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5938441753387451},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.5423324108123779},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.49388986825942993},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4740543067455292},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4648384749889374},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.4204220473766327},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36024922132492065},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3338441848754883},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.24128767848014832},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12274965643882751},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09283265471458435},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0925397276878357},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08134445548057556},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07362553477287292},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.07224321365356445},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icassp.2013.6638109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2013.6638109","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Acoustics, Speech and Signal Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1972127875","https://openalex.org/W1986285024","https://openalex.org/W1989717322","https://openalex.org/W2002129922","https://openalex.org/W2056055289","https://openalex.org/W2072742430","https://openalex.org/W2102837996","https://openalex.org/W2135257978","https://openalex.org/W2135288278","https://openalex.org/W2150938874","https://openalex.org/W6664502049"],"related_works":["https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2162027152","https://openalex.org/W2489439822","https://openalex.org/W4237143391","https://openalex.org/W2110991008","https://openalex.org/W2546663484","https://openalex.org/W2155822792","https://openalex.org/W2000201823","https://openalex.org/W2120144651"],"abstract_inverted_index":{"As":[0],"the":[1,7,42,56,98,102,143,149],"semiconductor":[2],"feature":[3],"size":[4],"continuously":[5],"decreases,":[6],"signal":[8,49,146],"integrity":[9],"of":[10,41,45,101,153],"MLC":[11,154],"(multi-level":[12],"cell)":[13],"NAND":[14,131,155],"flash":[15,132,156],"memory":[16],"becomes":[17],"degraded,":[18],"which":[19],"causes":[20],"increased":[21],"bit":[22,46],"error":[23,68,74,120,140],"rate":[24],"and":[25,80,106,134],"short":[26],"retention":[27,150],"time":[28,151],"limit.":[29],"Since":[30],"it":[31,135],"is":[32,39,127,136],"well":[33],"known":[34],"that":[35,138],"cell-to-cell":[36],"interference":[37,78],"(CCI)":[38],"one":[40],"major":[43],"sources":[44],"errors,":[47],"several":[48],"processing":[50],"solutions":[51],"to":[52,85,114,129],"mitigate":[53],"or":[54],"remove":[55],"CCI":[57,103,144],"have":[58],"been":[59],"developed.":[60],"Even":[61],"though":[62],"these":[63],"works":[64],"show":[65],"BER":[66],"(bit":[67],"rate)":[69],"performance":[70],"improvement":[71],"with":[72,142],"hard-decision":[73],"correction,":[75],"combining":[76],"an":[77],"canceller":[79],"soft-decision":[81,119,139],"decoding":[82],"still":[83],"needs":[84],"be":[86],"studied.":[87],"In":[88],"this":[89],"research,":[90],"we":[91],"derive":[92],"a":[93,109],"mathematical":[94],"formulation":[95],"for":[96,118],"computing":[97],"likelihood":[99],"function":[100],"removed":[104,145],"signal,":[105],"then":[107],"propose":[108],"conditional":[110],"LLR":[111],"(log-likelihood":[112],"ratio)":[113],"represent":[115],"soft-reliability":[116],"information":[117],"correction.":[121],"The":[122],"proposed":[123],"soft-information":[124],"computation":[125],"scheme":[126],"applied":[128],"simulated":[130],"memory,":[133],"demonstrated":[137],"correction":[141],"significantly":[147],"increases":[148],"limit":[152],"memory.":[157]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}