{"id":"https://openalex.org/W2128900728","doi":"https://doi.org/10.1109/icassp.2008.4517886","title":"Computation as estimation: Estimation-theoretic IC design improves robustness and reduces power consumption","display_name":"Computation as estimation: Estimation-theoretic IC design improves robustness and reduces power consumption","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2128900728","doi":"https://doi.org/10.1109/icassp.2008.4517886","mag":"2128900728"},"language":"en","primary_location":{"id":"doi:10.1109/icassp.2008.4517886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2008.4517886","pdf_url":null,"source":{"id":"https://openalex.org/S4210167542","display_name":"Proceedings of the ... IEEE International Conference on Acoustics, Speech, and Signal Processing","issn_l":"1520-6149","issn":["1520-6149","2379-190X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Acoustics, Speech and Signal Processing","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059216527","display_name":"Sriram Narayanan","orcid":"https://orcid.org/0000-0002-6484-2800"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I183874917","display_name":"Urbana University","ror":"https://ror.org/04kp3hw27","country_code":"US","type":"education","lineage":["https://openalex.org/I183874917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sriram Narayanan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL","institution_ids":["https://openalex.org/I183874917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013420358","display_name":"Girish V. Varatkar","orcid":"https://orcid.org/0009-0000-4504-0717"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I183874917","display_name":"Urbana University","ror":"https://ror.org/04kp3hw27","country_code":"US","type":"education","lineage":["https://openalex.org/I183874917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Girish V. Varatkar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL","institution_ids":["https://openalex.org/I183874917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105462806","display_name":"Douglas L. Jones","orcid":"https://orcid.org/0000-0002-7817-7629"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I183874917","display_name":"Urbana University","ror":"https://ror.org/04kp3hw27","country_code":"US","type":"education","lineage":["https://openalex.org/I183874917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Douglas L. Jones","raw_affiliation_strings":["Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL","institution_ids":["https://openalex.org/I183874917"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057014407","display_name":"Naresh R. Shanbhag","orcid":"https://orcid.org/0000-0002-4323-9164"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I183874917","display_name":"Urbana University","ror":"https://ror.org/04kp3hw27","country_code":"US","type":"education","lineage":["https://openalex.org/I183874917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Naresh R. Shanbhag","raw_affiliation_strings":["Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, UIUC, Urbana-Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL","institution_ids":["https://openalex.org/I183874917"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1421","last_page":"1424"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.834928035736084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6966333389282227},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.6335641145706177},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6242552995681763},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.6148564219474792},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5658182501792908},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.4769767224788666},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.423788458108902},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.41320565342903137},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3314782977104187},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1686190962791443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1346309781074524}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.834928035736084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6966333389282227},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.6335641145706177},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6242552995681763},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6148564219474792},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5658182501792908},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.4769767224788666},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.423788458108902},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.41320565342903137},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3314782977104187},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1686190962791443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1346309781074524},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icassp.2008.4517886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icassp.2008.4517886","pdf_url":null,"source":{"id":"https://openalex.org/S4210167542","display_name":"Proceedings of the ... IEEE International Conference on Acoustics, Speech, and Signal Processing","issn_l":"1520-6149","issn":["1520-6149","2379-190X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Acoustics, Speech and Signal Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6499999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1584394396","https://openalex.org/W1997834106","https://openalex.org/W2017521824","https://openalex.org/W2115722171","https://openalex.org/W2121856707","https://openalex.org/W2154168135","https://openalex.org/W2489822048","https://openalex.org/W2533576730","https://openalex.org/W2591999308","https://openalex.org/W4236140030","https://openalex.org/W6634899865"],"related_works":["https://openalex.org/W3154990682","https://openalex.org/W2560201613","https://openalex.org/W2171975302","https://openalex.org/W2022352247","https://openalex.org/W4312219546","https://openalex.org/W2377538627","https://openalex.org/W2107220315","https://openalex.org/W2770593030","https://openalex.org/W2154044472","https://openalex.org/W4210772589"],"abstract_inverted_index":{"Modern":[0],"integrated":[1],"circuits":[2],"(ICs)":[3],"are":[4],"designed":[5],"as":[6,10,39],"massively":[7],"parallel":[8],"systems":[9],"a":[11,62],"consequence":[12],"of":[13,24,73,83],"diminishing":[14],"silicon":[15],"feature":[16],"sizes.":[17],"This":[18],"has":[19],"adversely":[20],"impacted":[21],"reliability":[22],"because":[23],"increased":[25],"errors":[26,38],"due":[27],"to":[28,41,48],"process":[29],"and":[30,33,54,90],"environmental":[31],"variations,":[32],"particle":[34],"hits.":[35],"Viewing":[36],"hardware":[37],"analogous":[40],"measurement":[42],"or":[43],"system":[44,91],"noise":[45],"allows":[46],"us":[47],"borrow":[49],"results":[50],"from":[51],"estimation":[52],"theory":[53],"extend":[55],"Moore's":[56],"law.":[57],"The":[58],"estimation-theoretic":[59],"framework":[60,85],"provides":[61],"design":[63],"optimization":[64],"formalization":[65],"that":[66,80],"enables":[67],"power/reliability":[68],"trade-off":[69],"in":[70],"broad":[71],"classes":[72],"applications.":[74],"Two":[75],"applications":[76],"described":[77],"here":[78],"show":[79],"specific":[81],"instantiations":[82],"the":[84],"yield":[86],"significant":[87],"power":[88],"savings":[89],"reliability.":[92]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}