{"id":"https://openalex.org/W2152641030","doi":"https://doi.org/10.1109/icarcv.2010.5707432","title":"A comparative study of local feature extraction for age estimation","display_name":"A comparative study of local feature extraction for age estimation","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2152641030","doi":"https://doi.org/10.1109/icarcv.2010.5707432","mag":"2152641030"},"language":"en","primary_location":{"id":"doi:10.1109/icarcv.2010.5707432","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icarcv.2010.5707432","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Conference on Control Automation Robotics & Vision","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040628398","display_name":"Sung\u2010Eun Choi","orcid":"https://orcid.org/0000-0002-6955-658X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sung Eun Choi","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067372505","display_name":"Youn Joo Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youn Joo Lee","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110054999","display_name":"Sung Joo Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung Joo Lee","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083173630","display_name":"Kang Ryoung Park","orcid":"https://orcid.org/0000-0002-1214-9510"},"institutions":[{"id":"https://openalex.org/I901242617","display_name":"Zimmer Biomet (Switzerland)","ror":"https://ror.org/050g10a24","country_code":"CH","type":"company","lineage":["https://openalex.org/I4210115238","https://openalex.org/I901242617"]},{"id":"https://openalex.org/I205490536","display_name":"Dongguk University","ror":"https://ror.org/057q6n778","country_code":"KR","type":"education","lineage":["https://openalex.org/I205490536"]}],"countries":["CH","KR"],"is_corresponding":false,"raw_author_name":"Kang Ryoung Park","raw_affiliation_strings":["Division of Electronics and Electrical Engineering, Biometrics Engineering Research Center, Dongguk University, South Korea","Division of Electronics and Electrical Engineering, Dongguk University, Biometrics Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Electrical Engineering, Biometrics Engineering Research Center, Dongguk University, South Korea","institution_ids":["https://openalex.org/I205490536"]},{"raw_affiliation_string":"Division of Electronics and Electrical Engineering, Dongguk University, Biometrics Engineering Research Center","institution_ids":["https://openalex.org/I205490536","https://openalex.org/I901242617"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069195373","display_name":"Jaihie Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaihie Kim","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Yonsei University, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Biometrics Engineering Research Center","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5040628398"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.9561,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.78789648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1280","last_page":"1284"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10775","display_name":"Generative Adversarial Networks and Image Synthesis","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6915313005447388},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6699365377426147},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6309294700622559},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5995227098464966},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.536559522151947},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5123168230056763},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.510178804397583},{"id":"https://openalex.org/keywords/daubechies-wavelet","display_name":"Daubechies wavelet","score":0.48567283153533936},{"id":"https://openalex.org/keywords/haar-wavelet","display_name":"Haar wavelet","score":0.46996161341667175},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4365922510623932},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4221528470516205},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.4125158190727234},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.40368831157684326}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6915313005447388},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6699365377426147},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6309294700622559},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5995227098464966},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.536559522151947},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5123168230056763},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.510178804397583},{"id":"https://openalex.org/C2779855323","wikidata":"https://www.wikidata.org/wiki/Q1172774","display_name":"Daubechies wavelet","level":5,"score":0.48567283153533936},{"id":"https://openalex.org/C2780423554","wikidata":"https://www.wikidata.org/wiki/Q766198","display_name":"Haar wavelet","level":5,"score":0.46996161341667175},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4365922510623932},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4221528470516205},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.4125158190727234},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.40368831157684326},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icarcv.2010.5707432","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icarcv.2010.5707432","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Conference on Control Automation Robotics & Vision","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1499007313","https://openalex.org/W1556392566","https://openalex.org/W2017143202","https://openalex.org/W2032454342","https://openalex.org/W2039140324","https://openalex.org/W2073351001","https://openalex.org/W2106488920","https://openalex.org/W2118755929","https://openalex.org/W2139150520","https://openalex.org/W2147278565","https://openalex.org/W2152826865","https://openalex.org/W2153635508","https://openalex.org/W2163626514","https://openalex.org/W2167793923","https://openalex.org/W2170854557","https://openalex.org/W3120421331","https://openalex.org/W4206519171","https://openalex.org/W6633389602","https://openalex.org/W6684569143"],"related_works":["https://openalex.org/W2014395068","https://openalex.org/W2017302281","https://openalex.org/W2041246122","https://openalex.org/W2075963752","https://openalex.org/W2890138326","https://openalex.org/W2942471066","https://openalex.org/W2088158554","https://openalex.org/W1908930637","https://openalex.org/W2090493506","https://openalex.org/W2935275583"],"abstract_inverted_index":{"Many":[0],"age":[1,19,30,75,112,171,198],"estimation":[2,31,76,172,199],"methods":[3,127],"have":[4],"been":[5],"proposed":[6],"for":[7,74,165,196],"various":[8,123],"applications":[9],"such":[10,89],"as":[11,90],"Age":[12],"Specific":[13],"Human":[14],"Computer":[15],"Interaction":[16],"(ASHCI)":[17],"system,":[18],"simulation":[20],"system":[21],"and":[22,61,92,118,143,157,169,182,200],"so":[23],"on.":[24],"Because":[25],"the":[26,29,36,39,95,119,134],"performance":[27,205],"of":[28,136],"is":[32,46,82,100,173],"greatly":[33],"affected":[34],"by":[35,175],"aging":[37,40,50,184],"feature,":[38],"feature":[41],"extraction":[42,126],"from":[43],"facial":[44],"images":[45],"very":[47],"important.":[48],"The":[49,186],"features":[51,88,99,106,125,168,192],"used":[52,73,109,195],"in":[53,77],"previous":[54,78,103],"works":[55],"can":[56,193],"be":[57,194],"divided":[58],"into":[59],"global":[60,65],"local":[62,87,98,105,124,167,191],"features.":[63],"As":[64],"features,":[66],"Active":[67],"Appearance":[68],"Models":[69],"(AAM)":[70],"was":[71],"mainly":[72],"works.":[79],"However,":[80],"AAM":[81],"not":[83,129],"enough":[84],"to":[85,110],"represent":[86],"wrinkle":[91],"skin.":[93],"Therefore,":[94],"research":[96],"about":[97,122],"required.":[101],"In":[102,131],"works,":[104],"were":[107,128],"generally":[108],"determine":[111],"group":[113],"rather":[114],"than":[115,206],"detailed":[116,170,197],"age,":[117],"comparative":[120],"studies":[121],"conducted.":[130],"this":[132],"paper,":[133],"performances":[135],"sobel":[137],"filter,":[138],"difference":[139],"image":[140],"between":[141],"original":[142],"smoothed":[144],"image,":[145],"ideal":[146],"high":[147,152],"pass":[148,153],"filter":[149,154],"(IHPF),":[150],"gaussian":[151],"(GHPF),":[155],"Haar":[156],"Daubechies":[158],"discrete":[159],"wavelet":[160],"transform":[161],"(DWT)":[162],"are":[163],"compared":[164],"extracting":[166],"performed":[174],"Support":[176],"Vector":[177],"Regression":[178],"(SVR)":[179],"on":[180],"BERC":[181],"PAL":[183],"database.":[185],"experimental":[187],"results":[188],"show":[189],"that":[190],"GHPF":[201],"gives":[202],"a":[203],"better":[204],"other":[207],"methods.":[208]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}