{"id":"https://openalex.org/W2107154364","doi":"https://doi.org/10.1109/icarcv.2004.1469003","title":"X-ray image segmentation using wavelet method","display_name":"X-ray image segmentation using wavelet method","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2107154364","doi":"https://doi.org/10.1109/icarcv.2004.1469003","mag":"2107154364"},"language":"en","primary_location":{"id":"doi:10.1109/icarcv.2004.1469003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icarcv.2004.1469003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICARCV 2004 8th Control, Automation, Robotics and Vision Conference, 2004.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100617364","display_name":"Xin Wang","orcid":"https://orcid.org/0000-0002-5854-5287"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"X. Wang","raw_affiliation_strings":["Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore"],"affiliations":[{"raw_affiliation_string":"Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077569949","display_name":"Brian Stephen Wong","orcid":"https://orcid.org/0000-0003-3690-1057"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"B.S. Wong","raw_affiliation_strings":["Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore"],"affiliations":[{"raw_affiliation_string":"Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081478168","display_name":"Weimin Bai","orcid":"https://orcid.org/0000-0003-1503-5188"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"W.M. Bai","raw_affiliation_strings":["Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore"],"affiliations":[{"raw_affiliation_string":"Robotics research Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Mech. & Production Eng., Nanyang Technol. Univ., , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049430407","display_name":"Chen Guan Tui","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C.G. Tui","raw_affiliation_strings":["Republic of Singapore Air Force, Singapore","Republic of Singapore Air Force"],"affiliations":[{"raw_affiliation_string":"Republic of Singapore Air Force, Singapore","institution_ids":[]},{"raw_affiliation_string":"Republic of Singapore Air Force","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100617364"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.8812,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76689991,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"1129","last_page":"1133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.8578126430511475},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7509682178497314},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.6924145221710205},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.6793833374977112},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.6259458065032959},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6211085319519043},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5611492991447449},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5528209805488586},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5470779538154602},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.4936760365962982},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4898919463157654},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.44602879881858826},{"id":"https://openalex.org/keywords/radiographic-testing","display_name":"Radiographic testing","score":0.4338718354701996},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.3629875183105469},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.34584730863571167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11147212982177734},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05251690745353699}],"concepts":[{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.8578126430511475},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7509682178497314},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.6924145221710205},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.6793833374977112},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.6259458065032959},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6211085319519043},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5611492991447449},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5528209805488586},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5470779538154602},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.4936760365962982},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4898919463157654},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.44602879881858826},{"id":"https://openalex.org/C102758585","wikidata":"https://www.wikidata.org/wiki/Q649912","display_name":"Radiographic testing","level":3,"score":0.4338718354701996},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.3629875183105469},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.34584730863571167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11147212982177734},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05251690745353699},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icarcv.2004.1469003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icarcv.2004.1469003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICARCV 2004 8th Control, Automation, Robotics and Vision Conference, 2004.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W64421947","https://openalex.org/W2004217976","https://openalex.org/W2058333183","https://openalex.org/W2062024414","https://openalex.org/W2125527601","https://openalex.org/W2132984323","https://openalex.org/W2146842127","https://openalex.org/W2152328854","https://openalex.org/W4214540058","https://openalex.org/W4255272544","https://openalex.org/W6602604322"],"related_works":["https://openalex.org/W2050699221","https://openalex.org/W2155191322","https://openalex.org/W1499455855","https://openalex.org/W2148060698","https://openalex.org/W1991875450","https://openalex.org/W2367709627","https://openalex.org/W2561554841","https://openalex.org/W4237712972","https://openalex.org/W2509252529","https://openalex.org/W2376178232"],"abstract_inverted_index":{"The":[0],"X-ray":[1,60,68],"radiographic":[2,85,93],"testing":[3,14],"method":[4,15,57],"is":[5,21,41,154],"often":[6],"used":[7,22],"for":[8,23,122],"detecting":[9],"defects":[10,45,90],"as":[11],"a":[12,36,116],"non-destructive":[13],"(NDT).":[16],"In":[17,62,95],"many":[18],"cases,":[19],"NDT":[20],"aircraft":[24],"components,":[25],"welds,":[26],"etc.":[27],"Hence,":[28],"the":[29,67,81,84,92,96,104,110,123,127,139],"backgrounds":[30],"are":[31,129],"always":[32],"more":[33],"complex":[34],"than":[35],"piece":[37],"of":[38,83,98,112,118,141,151],"steel.":[39],"It":[40],"difficult":[42],"to":[43,58,75,79,103,120,134],"detect":[44],"using":[46],"conventional":[47],"image":[48,77],"processing":[49],"methods,":[50],"in":[51],"this":[52],"paper,":[53],"we":[54,70,88,108],"apply":[55],"wavelet":[56,73,105,113,142],"segment":[59],"images.":[61],"our":[63],"algorithms,":[64],"after":[65],"obtaining":[66],"image,":[69],"firstly":[71],"use":[72],"thresholding":[74],"reduce":[76],"noise":[78,133],"improve":[80],"quality":[82],"image.":[86,94],"Then":[87],"extract":[89,135],"from":[91,132],"process":[97],"extracting":[99],"edge":[100,136],"features,":[101],"according":[102],"multi-scale":[106],"character,":[107],"integrate":[109],"coefficients":[111],"transforms":[114],"on":[115],"series":[117],"scales":[119],"look":[121],"best":[124],"scale":[125],"where":[126],"edges":[128],"well":[130],"discriminated":[131],"features.":[137],"With":[138],"help":[140],"algorithm,":[143],"an":[144],"objective":[145],"and":[146],"fast":[147],"computer":[148],"based":[149],"evaluation":[150],"defect":[152],"indications":[153],"possible.":[155]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}