{"id":"https://openalex.org/W2809397721","doi":"https://doi.org/10.1109/icait.2017.8388886","title":"Fault location in distribution network based on discrete Fr\u00e9chet distance algorithm","display_name":"Fault location in distribution network based on discrete Fr\u00e9chet distance algorithm","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2809397721","doi":"https://doi.org/10.1109/icait.2017.8388886","mag":"2809397721"},"language":"en","primary_location":{"id":"doi:10.1109/icait.2017.8388886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388886","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064187303","display_name":"S. Hou","orcid":"https://orcid.org/0000-0003-4272-3373"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sizu Hou","raw_affiliation_strings":["Department of Electronics and Communication Engineering, North China Electric Power University, Baoding, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, North China Electric Power University, Baoding, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102590980","display_name":"Siyu Han","orcid":null},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyu Han","raw_affiliation_strings":["Department of Electronics and Communication Engineering, North China Electric Power University, Baoding, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, North China Electric Power University, Baoding, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I153473198"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.34213984,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"44","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12707","display_name":"Vehicle License Plate Recognition","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14276","display_name":"Power Systems and Technologies","score":0.9624000191688538,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6985570192337036},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.697675883769989},{"id":"https://openalex.org/keywords/euclidean-distance","display_name":"Euclidean distance","score":0.6416339874267578},{"id":"https://openalex.org/keywords/hausdorff-distance","display_name":"Hausdorff distance","score":0.6120864152908325},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.585018515586853},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49079760909080505},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4785493016242981},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.46865314245224},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4280781149864197},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42477312684059143},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19235041737556458},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.163301020860672}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6985570192337036},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.697675883769989},{"id":"https://openalex.org/C120174047","wikidata":"https://www.wikidata.org/wiki/Q847073","display_name":"Euclidean distance","level":2,"score":0.6416339874267578},{"id":"https://openalex.org/C141898687","wikidata":"https://www.wikidata.org/wiki/Q1501997","display_name":"Hausdorff distance","level":2,"score":0.6120864152908325},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.585018515586853},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49079760909080505},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4785493016242981},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.46865314245224},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4280781149864197},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42477312684059143},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19235041737556458},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.163301020860672},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icait.2017.8388886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388886","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W285144265","https://openalex.org/W1982151082","https://openalex.org/W2043127917","https://openalex.org/W2050303752","https://openalex.org/W2122005371","https://openalex.org/W2404164773"],"related_works":["https://openalex.org/W2136359393","https://openalex.org/W3125779006","https://openalex.org/W4383558899","https://openalex.org/W2019538911","https://openalex.org/W2467200550","https://openalex.org/W1996805379","https://openalex.org/W2300277393","https://openalex.org/W4234584818","https://openalex.org/W2809929944","https://openalex.org/W4312786632"],"abstract_inverted_index":{"With":[0],"the":[1,6,15,24,27,31,40,49,63,75,80,93,108,112,117,122,135,138,141],"development":[2,41],"of":[3,17,26,42,74,92,102,116,124,137],"power":[4,7],"system,":[5],"sector":[8],"is":[9,59,86,97],"more":[10,12],"and":[11,57,83,114,119],"demanding":[13],"on":[14,107,128],"reliability":[16],"distribution":[18,44],"network":[19,45],"fault":[20,33,50,70,105,125,142],"location.":[21,71],"We":[22],"analyze":[23],"shortcomings":[25],"algorithms":[28],"used":[29],"in":[30,140],"existing":[32,43],"location":[34,51,113,126,143],"system.":[35,144],"In":[36],"addition,":[37],"combined":[38],"with":[39,79],"automation,":[46],"we":[47],"transformed":[48],"into":[52],"a":[53,100],"similarity":[54],"curve":[55],"question":[56],"it":[58],"proposed":[60],"to":[61,68],"use":[62],"discrete":[64,76,94,129],"Fr\u00e9chet":[65,77,95,130],"distance":[66,78,82,85,96,131],"algorithm":[67,139],"perform":[69],"The":[72,90],"comparison":[73],"Hausdorff":[81],"euclidean":[84],"proved":[87],"by":[88,110],"simulation.":[89],"superiority":[91],"proved.":[98],"Simulate":[99],"variety":[101],"metal":[103],"ground":[104],"type":[106],"project":[109],"changing":[111],"direction":[115],"coil":[118],"then":[120],"achieve":[121],"function":[123],"based":[127],"algorithm.":[132],"It":[133],"proves":[134],"feasibility":[136]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}