{"id":"https://openalex.org/W2809062701","doi":"https://doi.org/10.1109/icait.2017.8388883","title":"Surface roughness effect on micropillar cavities","display_name":"Surface roughness effect on micropillar cavities","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2809062701","doi":"https://doi.org/10.1109/icait.2017.8388883","mag":"2809062701"},"language":"en","primary_location":{"id":"doi:10.1109/icait.2017.8388883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388883","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033709869","display_name":"Qiang Xu","orcid":"https://orcid.org/0000-0002-4720-7477"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Qiang Xu","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110656153","display_name":"Xiumin Xie","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiumin Xie","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022335660","display_name":"Bizhou Shen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bizhou Shen","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061850565","display_name":"Jian Chen","orcid":"https://orcid.org/0000-0001-6046-1966"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jian Chen","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000831687","display_name":"Qian Dai","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Qian Dai","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101745138","display_name":"Haizhi Song","orcid":"https://orcid.org/0000-0002-5527-0775"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hai-Zhi Song","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025977354","display_name":"Qiang Zhou","orcid":"https://orcid.org/0000-0001-7099-1995"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhou","raw_affiliation_strings":["School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5033709869"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21500933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"30","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7513867020606995},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.7048656940460205},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5976589918136597},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.5901322960853577},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.5874860286712646},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5654383897781372},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.5163256525993347},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.45019295811653137},{"id":"https://openalex.org/keywords/radius","display_name":"RADIUS","score":0.42926955223083496},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.13571101427078247},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09697428345680237}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7513867020606995},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.7048656940460205},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5976589918136597},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5901322960853577},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.5874860286712646},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5654383897781372},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.5163256525993347},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.45019295811653137},{"id":"https://openalex.org/C178635117","wikidata":"https://www.wikidata.org/wiki/Q747499","display_name":"RADIUS","level":2,"score":0.42926955223083496},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.13571101427078247},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09697428345680237},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icait.2017.8388883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388883","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1494105879","https://openalex.org/W1965217683","https://openalex.org/W2000652143","https://openalex.org/W2020424834","https://openalex.org/W2024622260","https://openalex.org/W2032039258","https://openalex.org/W2034180555","https://openalex.org/W2034673571","https://openalex.org/W2040148112","https://openalex.org/W2044046822","https://openalex.org/W2059440460","https://openalex.org/W2088327393","https://openalex.org/W2099274450","https://openalex.org/W2159994936","https://openalex.org/W2162123284","https://openalex.org/W2162390430","https://openalex.org/W2163931124","https://openalex.org/W2170005629","https://openalex.org/W2211540913","https://openalex.org/W2410492503","https://openalex.org/W2553777899","https://openalex.org/W2590450285","https://openalex.org/W4211100070"],"related_works":["https://openalex.org/W2386922414","https://openalex.org/W4313638943","https://openalex.org/W1966522691","https://openalex.org/W4304014137","https://openalex.org/W3034740403","https://openalex.org/W2032025132","https://openalex.org/W4297916609","https://openalex.org/W2349732462","https://openalex.org/W2783679862","https://openalex.org/W2106541163"],"abstract_inverted_index":{"Being":[0],"applied":[1],"in":[2,195],"many":[3],"fields":[4],"such":[5,43,107],"as":[6,138],"optoelectronics":[7],"and":[8,18,120,161],"quantum":[9],"information":[10],"processing,":[11],"micropillar":[12,63,93,200],"cavities":[13],"are":[14],"stepping":[15],"into":[16,79],"smaller":[17,19],"scales.":[20],"As":[21],"a":[22,62,80,97,101,139,150,189,199],"pillar":[23],"is":[24,72,87,96,145,171],"shrinking":[25],"to":[26,173,197],"sub-micrometer":[27],"size,":[28],"the":[29,40,47,69,76,88,91,117,121,126,129,135,158,165,168,176,184],"surface":[30,70,130,136,151],"roughness":[31,71,137,152],"induced":[32],"by":[33,57,74],"imperfect":[34],"fabrication":[35,185],"process":[36,186],"will":[37],"dramatically":[38],"influence":[39],"quality":[41],"of":[42,46,49,66,128,142,153,175],"cavity,":[44,94,108],"because":[45],"edge-scattering":[48],"cavity":[50,64,201],"modes.":[51],"Here,":[52],"we":[53,133],"investigated":[54],"this":[55],"effect":[56],"using":[58],"finite-difference-time-domain":[59],"methods.":[60],"For":[61,106],"consisting":[65],"distributed":[67],"Bragg-reflectors,":[68],"modeled":[73],"dividing":[75],"disk-shaped":[77],"layer":[78],"few":[81],"randomly":[82],"polygonal":[83],"layers.":[84],"One":[85],"example":[86],"investigation":[89],"on":[90],"InGaAsP/InP-air-aperture":[92],"which":[95,181],"promised":[98],"candidate":[99],"for":[100,113,157,164],"1.55-\u03bcm":[102],"quantum-dot":[103],"single-photon":[104],"source.":[105],"our":[109],"results":[110],"show":[111],"that":[112,148,183],"short":[114],"wavelength,":[115],"both":[116],"Q":[118,169],"factor":[119,170],"output":[122],"efficiency":[123],"decrease":[124],"with":[125,149,202],"increase":[127],"roughness.":[131],"Where,":[132],"define":[134],"relative":[140],"value":[141],"radius.":[143],"It":[144],"worth":[146],"noting":[147],"0.01,":[154],"~1.3":[155],"nm":[156,163],"InP":[159],"layers":[160],"~4.7":[162],"InGaAsP":[166],"layers,":[167],"close":[172],"90%":[174],"one":[177],"without":[178],"any":[179],"roughness,":[180],"suggests":[182],"should":[187],"satisfy":[188],"control":[190],"precision":[191],"at":[192],"nanometer":[193],"level,":[194],"order":[196],"make":[198],"good":[203],"quality.":[204]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}