{"id":"https://openalex.org/W2809371101","doi":"https://doi.org/10.1109/icait.2017.8388819","title":"Quantitative analysis on the main elements in glass with laser-induced breakdown spectroscopy","display_name":"Quantitative analysis on the main elements in glass with laser-induced breakdown spectroscopy","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2809371101","doi":"https://doi.org/10.1109/icait.2017.8388819","mag":"2809371101"},"language":"en","primary_location":{"id":"doi:10.1109/icait.2017.8388819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388819","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037405278","display_name":"Dai Gege","orcid":null},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dai Gege","raw_affiliation_strings":["College of Optical and Electronic Technology, China Jiliang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Optical and Electronic Technology, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"last","author":{"id":null,"display_name":"Chen Huacai","orcid":null},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Huacai","raw_affiliation_strings":["College of Optical and Electronic Technology, China Jiliang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Optical and Electronic Technology, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5037405278"],"corresponding_institution_ids":["https://openalex.org/I55538621"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25555603,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"40","issue":null,"first_page":"10","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11212","display_name":"Cultural Heritage Materials Analysis","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/1204","display_name":"Archeology"},"field":{"id":"https://openalex.org/fields/12","display_name":"Arts and Humanities"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10180","display_name":"Analytical chemistry methods development","score":0.9805999994277954,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-induced-breakdown-spectroscopy","display_name":"Laser-induced breakdown spectroscopy","score":0.9476864337921143},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6348831653594971},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.6132838129997253},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.6096794009208679},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6091604828834534},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5989936590194702},{"id":"https://openalex.org/keywords/spectrometer","display_name":"Spectrometer","score":0.5809991955757141},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5727748274803162},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.44629982113838196},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.36906498670578003},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.18443232774734497},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11872771382331848},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11654806137084961}],"concepts":[{"id":"https://openalex.org/C50497907","wikidata":"https://www.wikidata.org/wiki/Q2654990","display_name":"Laser-induced breakdown spectroscopy","level":3,"score":0.9476864337921143},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6348831653594971},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.6132838129997253},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.6096794009208679},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6091604828834534},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5989936590194702},{"id":"https://openalex.org/C33390570","wikidata":"https://www.wikidata.org/wiki/Q188463","display_name":"Spectrometer","level":2,"score":0.5809991955757141},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5727748274803162},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.44629982113838196},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36906498670578003},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.18443232774734497},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11872771382331848},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11654806137084961},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icait.2017.8388819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icait.2017.8388819","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th International Conference on Advanced Infocomm Technology (ICAIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1970664896","https://openalex.org/W2055043018","https://openalex.org/W2082392050","https://openalex.org/W2142391467","https://openalex.org/W2321241614","https://openalex.org/W2322791816","https://openalex.org/W2327013171","https://openalex.org/W2363980806","https://openalex.org/W2468882202"],"related_works":["https://openalex.org/W4361273630","https://openalex.org/W3185493346","https://openalex.org/W2099182329","https://openalex.org/W2092212339","https://openalex.org/W2120541567","https://openalex.org/W2477801230","https://openalex.org/W2381174698","https://openalex.org/W4320803271","https://openalex.org/W3007819143","https://openalex.org/W2031320968"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"the":[3,25,39,51,59,64,68,79,85,92,113,141,145],"major":[4],"elements":[5,70,80],"Si":[6,71,81,95,116],"and":[7,35,72,82,96,103,117,124,144],"Ba":[8,73,83,97,118],"in":[9],"glass":[10,44],"are":[11],"measured":[12,142],"by":[13,47],"a":[14],"method":[15],"of":[16,67,84,91,94,112,115],"laser-induced":[17],"breakdown":[18],"spectroscopy.":[19],"Q":[20],"using":[21],"pulsed":[22],"Nd:YAG":[23],"laser,":[24],"sample":[26,86],"stage,":[27],"digital":[28],"delay":[29],"controller,":[30],"echelle":[31],"spectrometer,":[32],"ICCD":[33],"detector":[34],"computer":[36],"components":[37],"consist":[38],"LIBS":[40,55],"system.":[41],"Choosing":[42],"four":[43],"samples":[45],"made":[46],"manufacturing":[48],"enterprises":[49],"as":[50],"standard":[52,110],"to":[53,101,106,122,127],"obtain":[54],"spectra.":[56],"Combining":[57],"with":[58],"free":[60],"calibration":[61],"analysis":[62],"method,":[63],"Boltzmann":[65],"curves":[66],"main":[69],"were":[74],"established,":[75],"which":[76],"can":[77],"calculate":[78],"accurately.":[87],"The":[88,109],"relative":[89],"error":[90],"contents":[93,114],"ranged":[98,119],"from":[99,104,120,125],"4.96%":[100],"10.12%":[102],"4.07%":[105],"9.62%,":[107],"respectively.":[108,129],"deviation":[111],"0.38%":[121],"1.29%":[123],"0.54%":[126],"1.70%,":[128],"T":[130],"test":[131],"results":[132],"showed":[133],"that":[134],"there":[135],"was":[136],"no":[137],"significant":[138],"difference":[139],"between":[140],"values":[143],"actual":[146],"values.":[147]},"counts_by_year":[],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}