{"id":"https://openalex.org/W2924461368","doi":"https://doi.org/10.1109/icaiic.2019.8669005","title":"Deep learning based 3D defect detection system using photometric stereo illumination","display_name":"Deep learning based 3D defect detection system using photometric stereo illumination","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2924461368","doi":"https://doi.org/10.1109/icaiic.2019.8669005","mag":"2924461368"},"language":"en","primary_location":{"id":"doi:10.1109/icaiic.2019.8669005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icaiic.2019.8669005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100613202","display_name":"Jong Hyuk Lee","orcid":"https://orcid.org/0000-0002-9594-683X"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jong Hyuk Lee","raw_affiliation_strings":["School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112329343","display_name":"Hyun Min Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun Min Oh","raw_affiliation_strings":["School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100447997","display_name":"Min Young Kim","orcid":"https://orcid.org/0000-0001-7263-3403"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min Young Kim","raw_affiliation_strings":["School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, KYUNGPOOK NATIONAL UNIVERSITY, Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100613202"],"corresponding_institution_ids":["https://openalex.org/I31419693"],"apc_list":null,"apc_paid":null,"fwci":3.4807,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.93315702,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"484","last_page":"487"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.8189456462860107},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7376748323440552},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.7175278663635254},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5793411135673523},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5296385288238525},{"id":"https://openalex.org/keywords/photometric-stereo","display_name":"Photometric stereo","score":0.5067413449287415},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.500190019607544},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.44161704182624817},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.439964234828949},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.43807727098464966},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4237297773361206},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3824513554573059},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.20893988013267517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14563053846359253}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.8189456462860107},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7376748323440552},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.7175278663635254},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5793411135673523},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5296385288238525},{"id":"https://openalex.org/C44365914","wikidata":"https://www.wikidata.org/wiki/Q17120636","display_name":"Photometric stereo","level":3,"score":0.5067413449287415},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.500190019607544},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.44161704182624817},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.439964234828949},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.43807727098464966},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4237297773361206},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3824513554573059},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.20893988013267517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14563053846359253},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icaiic.2019.8669005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icaiic.2019.8669005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1975089519","https://openalex.org/W2112796928","https://openalex.org/W2138334472","https://openalex.org/W2183182206","https://openalex.org/W2570343428","https://openalex.org/W2963037989","https://openalex.org/W6731892127"],"related_works":["https://openalex.org/W2071501285","https://openalex.org/W2118082161","https://openalex.org/W1904220063","https://openalex.org/W4210268023","https://openalex.org/W2122468143","https://openalex.org/W2042906516","https://openalex.org/W2068149630","https://openalex.org/W2182270966","https://openalex.org/W1590955951","https://openalex.org/W3159376255"],"abstract_inverted_index":{"Part":[0],"inspection":[1,42,47,154],"machines":[2,13,155,198],"of":[3,18,24,31,82,90,98,152,171,194],"industrial":[4],"manufacturing":[5],"systems":[6,27],"are":[7],"being":[8],"newly":[9],"evolved":[10],"as":[11,185],"intelligent":[12],"with":[14,49,159,199],"the":[15,22,29,88,91,95,148,168,172,191],"technology":[16,68,188],"innovation":[17],"artificial":[19,70],"intelligence.":[20],"Especially,":[21],"automation":[23],"defect":[25,61,149],"detection":[26,62,103,150,169,192],"in":[28,69],"field":[30],"casting":[32,157],"industry":[33],"has":[34],"been":[35],"widely":[36],"studied,":[37],"applying":[38],"deep":[39,66,161,200],"learning":[40,67,162],"based":[41,64],"algorithms":[43],"due":[44],"to":[45,76,87,127,137,146,182,189],"its":[46,129],"difficulties":[48],"2D":[50,78,101],"and":[51,79,111,116,132],"3D":[52,80],"detects.":[53],"In":[54],"this":[55,121],"paper,":[56],"we":[57],"proposed":[58,173,178],"an":[59],"automatic":[60,153],"system":[63,104,126,179],"on":[65],"intelligence":[71],"using":[72],"fused":[73],"illumination":[74,109],"images":[75],"get":[77],"information":[81,134],"target":[83],"objects":[84],"simultaneously.":[85],"Due":[86],"characteristics":[89],"cast":[92],"product":[93],"surfaces,":[94],"success":[96],"rate":[97],"a":[99,123,160,186],"conventional":[100],"detect":[102],"is":[105,135,144,175,180],"easily":[106],"affected":[107],"by":[108],"location":[110],"angle":[112],"for":[113,156],"uneven":[114],"surfaces":[115],"small":[117],"defects.":[118],"To":[119],"solve":[120],"problem,":[122],"photometric":[124],"stereo":[125],"generate":[128,138],"reflectance,":[130],"roughness":[131],"slope":[133],"used":[136,145,184],"feature":[139],"fusion":[140],"data.":[141],"This":[142],"dataset":[143],"improve":[147,190],"performance":[151,193],"products":[158],"model.":[163],"Experiment":[164],"results":[165],"show":[166],"that":[167],"accuracy":[170],"method":[174],"62.58%.":[176],"The":[177],"expected":[181],"be":[183],"new":[187],"AOI(Automated":[195],"Optical":[196],"Inspection)":[197],"learning.":[201]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}