{"id":"https://openalex.org/W4403678474","doi":"https://doi.org/10.1109/icac61394.2024.10718829","title":"Computer Vision-enhanced In-situ Surface Topography Measurement with Focus Variation Microscopy for Material Extrusion-based Additive Manufacturing","display_name":"Computer Vision-enhanced In-situ Surface Topography Measurement with Focus Variation Microscopy for Material Extrusion-based Additive Manufacturing","publication_year":2024,"publication_date":"2024-08-28","ids":{"openalex":"https://openalex.org/W4403678474","doi":"https://doi.org/10.1109/icac61394.2024.10718829"},"language":"en","primary_location":{"id":"doi:10.1109/icac61394.2024.10718829","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icac61394.2024.10718829","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 29th International Conference on Automation and Computing (ICAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014323962","display_name":"Kexin Yin","orcid":"https://orcid.org/0009-0006-2323-272X"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Kexin Yin","raw_affiliation_strings":["SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK"],"affiliations":[{"raw_affiliation_string":"SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK","institution_ids":["https://openalex.org/I133837150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065294218","display_name":"Shan Lou","orcid":"https://orcid.org/0000-0002-8426-5596"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Shan Lou","raw_affiliation_strings":["SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK"],"affiliations":[{"raw_affiliation_string":"SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK","institution_ids":["https://openalex.org/I133837150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064890446","display_name":"Yuchu Qin","orcid":"https://orcid.org/0000-0002-5723-5519"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yuchu Qin","raw_affiliation_strings":["SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK"],"affiliations":[{"raw_affiliation_string":"SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK","institution_ids":["https://openalex.org/I133837150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019207615","display_name":"Paul J. Scott","orcid":"https://orcid.org/0000-0002-6092-3101"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Paul Scott","raw_affiliation_strings":["SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK"],"affiliations":[{"raw_affiliation_string":"SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK","institution_ids":["https://openalex.org/I133837150"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052852912","display_name":"Xiangqian Jiang","orcid":"https://orcid.org/0000-0001-7949-8507"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Xiangqian Jiang","raw_affiliation_strings":["SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK"],"affiliations":[{"raw_affiliation_string":"SCE University of Huddersfield,Future Metrology Hub,Huddersfield,UK","institution_ids":["https://openalex.org/I133837150"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5014323962"],"corresponding_institution_ids":["https://openalex.org/I133837150"],"apc_list":null,"apc_paid":null,"fwci":0.2366,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.50375541,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extrusion","display_name":"Extrusion","score":0.7603280544281006},{"id":"https://openalex.org/keywords/in-situ","display_name":"In situ","score":0.7105309963226318},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.638984203338623},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.5936983227729797},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.545353353023529},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5151361227035522},{"id":"https://openalex.org/keywords/optical-microscope","display_name":"Optical microscope","score":0.5017914772033691},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.47030705213546753},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.313567578792572},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2787078619003296},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.14285805821418762},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.09932327270507812},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.08549803495407104},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06736409664154053}],"concepts":[{"id":"https://openalex.org/C2778958987","wikidata":"https://www.wikidata.org/wiki/Q139143","display_name":"Extrusion","level":2,"score":0.7603280544281006},{"id":"https://openalex.org/C2777822432","wikidata":"https://www.wikidata.org/wiki/Q216681","display_name":"In situ","level":2,"score":0.7105309963226318},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.638984203338623},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5936983227729797},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.545353353023529},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5151361227035522},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.5017914772033691},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.47030705213546753},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.313567578792572},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2787078619003296},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14285805821418762},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.09932327270507812},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08549803495407104},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06736409664154053},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icac61394.2024.10718829","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icac61394.2024.10718829","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 29th International Conference on Automation and Computing (ICAC)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.atira.dk:publications/345424b3-1fd7-47b5-8005-560ba4a6bd8a","is_oa":false,"landing_page_url":"https://pure.hud.ac.uk/en/publications/345424b3-1fd7-47b5-8005-560ba4a6bd8a","pdf_url":null,"source":{"id":"https://openalex.org/S4306402508","display_name":"Huddersfield Research Portal (University of Huddersfield)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I133837150","host_organization_name":"University of Huddersfield","host_organization_lineage":["https://openalex.org/I133837150"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Yin, K, Lou, S, Qin, Y, Scott, P & Jiang, J 2024, Computer Vision-enhanced In-situ Surface Topography Measurement with Focus Variation Microscopy for Material Extrusion-based Additive Manufacturing. in ICAC 2024 - 29th International Conference on Automation and Computing., 10718829, Institute of Electrical and Electronics Engineers Inc., 29th International Conference on Automation and Computing, Sunderland, United Kingdom, 28/08/24. https://doi.org/10.1109/ICAC61394.2024.10718829","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1389858441","display_name":null,"funder_award_id":"EP/P006930/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2072927026","https://openalex.org/W2116973876","https://openalex.org/W2194775991","https://openalex.org/W2734078634","https://openalex.org/W2782559101","https://openalex.org/W2797504351","https://openalex.org/W2901298848","https://openalex.org/W2998176839","https://openalex.org/W3155154039","https://openalex.org/W3180196270","https://openalex.org/W3198741602","https://openalex.org/W4282011443","https://openalex.org/W4287851412","https://openalex.org/W6637373629","https://openalex.org/W6763136721","https://openalex.org/W6790472028","https://openalex.org/W6847671982"],"related_works":["https://openalex.org/W2001655186","https://openalex.org/W2028722617","https://openalex.org/W2467322845","https://openalex.org/W2947993427","https://openalex.org/W1572519595","https://openalex.org/W2914257852","https://openalex.org/W4297897531","https://openalex.org/W3094092511","https://openalex.org/W2793462084","https://openalex.org/W4232503613"],"abstract_inverted_index":{"The":[0,150],"focus":[1,171],"variation":[2,172],"microscopy":[3],"like":[4],"Alicona":[5,68,88],"G5":[6,69,89],"performs":[7],"surpassingly":[8],"in":[9,21,147],"as-built":[10],"surface":[11,33,108,134,141],"quality":[12],"analysis":[13],"for":[14,55,179,182],"material":[15,183],"extrusion-based":[16,184],"additive":[17,185],"manufacturing":[18],"yet":[19],"fails":[20],"in-situ":[22,71,180],"scenarios.":[23],"To":[24],"enable":[25],"cheaper":[26,177],"and":[27,58,79,91,94,126,167],"more":[28],"accessible":[29],"cameras":[30],"to":[31,37,63,70,83,160],"obtain":[32],"topography":[34],"measurements":[35],"similar":[36],"those":[38],"of":[39,67,102,115,120,124,129,140,144,169],"Alincona":[40],"G5,":[41],"this":[42],"study":[43,101],"proposes":[44],"a":[45,50,176],"computer":[46],"vision-enhanced":[47],"method":[48,156],"with":[49,137],"refined":[51],"window":[52],"sliding":[53],"technique":[54],"2D":[56],"image":[57],"3D":[59],"point":[60,92,135],"cloud":[61,136],"registration":[62],"transfer":[64],"the":[65,85,132,154,158,162,165],"ability":[66],"applications.":[72],"Deep":[73],"learning":[74],"models":[75],"based":[76],"on":[77],"VGG11":[78],"ResNet18":[80],"were":[81],"proposed":[82,155],"establish":[84],"relationship":[86],"between":[87,164],"images":[90],"clouds":[93],"XIMEA":[95],"CCD":[96],"camera":[97],"images.":[98],"A":[99],"case":[100],"Fused":[103],"Deposit":[104],"Modelling":[105],"manufactured":[106],"PLA":[107],"predictions":[109],"showed":[110],"an":[111,138],"average":[112],"Chamfer":[113],"Distance":[114,119],"0.012,":[116],"Earth":[117],"Mover":[118],"1.002,":[121],"Pearson":[122],"Correlation":[123],"0.985,":[125],"relative":[127],"error":[128,139],"0.012":[130],"against":[131],"real":[133],"roughness":[142],"prediction":[143],"was":[145],"17.7%":[146],"19.8":[148],"seconds.":[149],"results":[151],"proved":[152],"that":[153],"held":[157],"feasibility":[159],"narrow":[161],"gap":[163],"effectiveness":[166],"efficiency":[168],"applying":[170],"microscopy,":[173],"pointing":[174],"out":[175],"way":[178],"measurement":[181],"manufacturing.":[186]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}