{"id":"https://openalex.org/W2189454441","doi":"https://doi.org/10.1109/ic3.2015.7346729","title":"Characterizing impacts of multi-Vt routers on power and reliability of Network-on-Chip","display_name":"Characterizing impacts of multi-Vt routers on power and reliability of Network-on-Chip","publication_year":2015,"publication_date":"2015-08-01","ids":{"openalex":"https://openalex.org/W2189454441","doi":"https://doi.org/10.1109/ic3.2015.7346729","mag":"2189454441"},"language":"en","primary_location":{"id":"doi:10.1109/ic3.2015.7346729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ic3.2015.7346729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 Eighth International Conference on Contemporary Computing (IC3)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061036592","display_name":"Ruby Ansar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126659","display_name":"Poornima University","ror":"https://ror.org/03gnqp653","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210126659"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Ruby Ansar","raw_affiliation_strings":["Poornima College Of Engg, Jaipur, India"],"affiliations":[{"raw_affiliation_string":"Poornima College Of Engg, Jaipur, India","institution_ids":["https://openalex.org/I4210126659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049183527","display_name":"Prachi Upadhyay","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126659","display_name":"Poornima University","ror":"https://ror.org/03gnqp653","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210126659"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Prachi Upadhyay","raw_affiliation_strings":["Poornima College Of Engg, Jaipur, India"],"affiliations":[{"raw_affiliation_string":"Poornima College Of Engg, Jaipur, India","institution_ids":["https://openalex.org/I4210126659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033627353","display_name":"Manish Singhal","orcid":"https://orcid.org/0009-0004-5487-2936"},"institutions":[{"id":"https://openalex.org/I4210126659","display_name":"Poornima University","ror":"https://ror.org/03gnqp653","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210126659"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Singhal","raw_affiliation_strings":["Poornima College Of Engg, Jaipur, India"],"affiliations":[{"raw_affiliation_string":"Poornima College Of Engg, Jaipur, India","institution_ids":["https://openalex.org/I4210126659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100701437","display_name":"Ashish Sharma","orcid":"https://orcid.org/0000-0001-6636-4219"},"institutions":[{"id":"https://openalex.org/I83205935","display_name":"Malaviya National Institute of Technology Jaipur","ror":"https://ror.org/0077k1j32","country_code":"IN","type":"education","lineage":["https://openalex.org/I83205935"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ashish Sharma","raw_affiliation_strings":["Malviya National Institute Of Technology, Jaipur, India"],"affiliations":[{"raw_affiliation_string":"Malviya National Institute Of Technology, Jaipur, India","institution_ids":["https://openalex.org/I83205935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028420263","display_name":"Manoj Singh Gaur","orcid":"https://orcid.org/0000-0002-0497-721X"},"institutions":[{"id":"https://openalex.org/I83205935","display_name":"Malaviya National Institute of Technology Jaipur","ror":"https://ror.org/0077k1j32","country_code":"IN","type":"education","lineage":["https://openalex.org/I83205935"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manoj Singh Gaur","raw_affiliation_strings":["Malviya National Institute Of Technology, Jaipur, India"],"affiliations":[{"raw_affiliation_string":"Malviya National Institute Of Technology, Jaipur, India","institution_ids":["https://openalex.org/I83205935"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061036592"],"corresponding_institution_ids":["https://openalex.org/I4210126659"],"apc_list":null,"apc_paid":null,"fwci":0.3328,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66307095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"14","issue":null,"first_page":"476","last_page":"480"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.78802090883255},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7692664861679077},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6267492771148682},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5951761603355408},{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.509914755821228},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5038723349571228},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.43517470359802246},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3400060832500458},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3351406455039978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21224942803382874},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18971508741378784},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18538013100624084},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08544841408729553}],"concepts":[{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.78802090883255},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7692664861679077},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6267492771148682},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5951761603355408},{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.509914755821228},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5038723349571228},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.43517470359802246},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3400060832500458},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3351406455039978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21224942803382874},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18971508741378784},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18538013100624084},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08544841408729553},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ic3.2015.7346729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ic3.2015.7346729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 Eighth International Conference on Contemporary Computing (IC3)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2049247044","https://openalex.org/W2077505860","https://openalex.org/W2095267534","https://openalex.org/W2102387714","https://openalex.org/W2124141725","https://openalex.org/W2144658863","https://openalex.org/W2145765936","https://openalex.org/W2165071510","https://openalex.org/W2170382128","https://openalex.org/W2247166899","https://openalex.org/W4235990555"],"related_works":["https://openalex.org/W3083898685","https://openalex.org/W1973754976","https://openalex.org/W189075692","https://openalex.org/W4220847856","https://openalex.org/W4220801072","https://openalex.org/W2113227311","https://openalex.org/W2804662986","https://openalex.org/W2889670096","https://openalex.org/W2009404102","https://openalex.org/W4360908782"],"abstract_inverted_index":{"Prolong":[0],"advancements":[1],"in":[2,32,54],"technology":[3],"scaling":[4],"over":[5],"the":[6,13,43,55,59,87,113,117,163,167,173,203],"past":[7],"few":[8],"years":[9],"eventually":[10],"leads":[11,72],"to":[12,27,73,85,197],"development":[14],"of":[15,46,67,89,119,175],"multi":[16,35],"core":[17,36],"processors.":[18],"Network":[19],"On":[20],"Chip":[21],"architecture":[22],"is":[23,50,83,124,205],"a":[24,125],"promising":[25],"paradigm":[26],"attain":[28],"higher":[29],"network":[30,56],"density":[31,49],"high":[33,137],"performance":[34],"computing":[37],"systems.":[38],"In":[39,77],"today's":[40],"scenario,":[41],"with":[42,166],"growing":[44],"number":[45],"transistors,":[47],"power":[48,69,114,127,170],"becoming":[51],"prominent":[52],"issue":[53],"design.":[57],"Therefore,":[58],"researchers":[60],"are":[61,104],"constantly":[62],"focusing":[63],"on":[64,96,116,172],"accurate":[65,107],"estimation":[66],"system":[68,74,97],"which":[70,123],"ultimately":[71],"reliability":[75,108,142,184],"enhancement.":[76],"this":[78],"paper,":[79],"an":[80],"experimental":[81],"setup":[82],"formulated":[84],"analyze":[86],"working":[88],"multi-Vt":[90],"NoC":[91],"routers":[92,140,191,199],"and":[93,136,141,152,154,180,200],"their":[94,157],"impacts":[95],"power.":[98],"Different":[99],"life":[100,147],"time":[101,148],"distribution":[102,188],"schemes":[103],"adopted":[105],"for":[106,189,201],"estimation.":[109],"We":[110,159],"have":[111,155,160],"done":[112,162],"analysis":[115,143,165],"basis":[118,174],"multi-threshold":[120],"voltage":[121],"cells":[122],"low":[126,130],"technique":[128],"i.e.":[129,150],"Vt":[131,134,138],"(LVT),":[132],"normal":[133],"(NVT)":[135],"(HVT)":[139],"by":[144,186],"using":[145],"two":[146],"distributions":[149],"lognormal":[151,202],"weibull":[153,187],"compared":[156,196],"results.":[158],"also":[161],"comparative":[164],"previous":[168],"integrated":[169],"model":[171],"reliability,":[176],"transistor":[177],"performance,":[178],"architectural":[179],"technological":[181],"parameters.":[182],"The":[183],"results":[185],"LVT":[190],"shows":[192],"35%":[193],"degradation":[194],"as":[195],"HVT":[198],"difference":[204],"56%.":[206]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}