{"id":"https://openalex.org/W4391422635","doi":"https://doi.org/10.1109/ias54024.2023.10406615","title":"Primary Admittance Based Fault Detection for Inter-Turn Short Circuit in 3-Phase Power Transformers","display_name":"Primary Admittance Based Fault Detection for Inter-Turn Short Circuit in 3-Phase Power Transformers","publication_year":2023,"publication_date":"2023-10-29","ids":{"openalex":"https://openalex.org/W4391422635","doi":"https://doi.org/10.1109/ias54024.2023.10406615"},"language":"en","primary_location":{"id":"doi:10.1109/ias54024.2023.10406615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias54024.2023.10406615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100355512","display_name":"Zhuo Liu","orcid":"https://orcid.org/0000-0001-5030-9231"},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhuo Liu","raw_affiliation_strings":["Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","Shanghai Research Center Rockwell Automation, Inc., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","institution_ids":[]},{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc., Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087354892","display_name":"Hao Yang","orcid":"https://orcid.org/0000-0002-5763-5934"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hao Yang","raw_affiliation_strings":["Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","Shanghai Research Center Rockwell Automation, Inc., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","institution_ids":[]},{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc., Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055153364","display_name":"Haihui Lu","orcid":"https://orcid.org/0000-0002-4567-2631"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Haihui Lu","raw_affiliation_strings":["Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","Shanghai Research Center Rockwell Automation, Inc., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","institution_ids":[]},{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc., Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109918788","display_name":"Yujia Cui","orcid":null},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yujia Cui","raw_affiliation_strings":["Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA","Intelligent Devices Rockwell Automation, Inc., Mequon, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Intelligent Devices Rockwell Automation, Inc., Mequon, WI, USA","institution_ids":["https://openalex.org/I57053284"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087991194","display_name":"Kadir Liano","orcid":null},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kadir Liano","raw_affiliation_strings":["Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I57053284"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100425937","display_name":"Zhijun Liu","orcid":"https://orcid.org/0009-0006-7054-7652"},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhijun Liu","raw_affiliation_strings":["Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China","institution_ids":[]},{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I57053284"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113887810","display_name":"Zhongyuan Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhongyuan Cheng","raw_affiliation_strings":["Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA","Intelligent Devices Rockwell Automation, Inc., Mequon, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Intelligent Devices Rockwell Automation, Inc., Mequon, WI, USA","institution_ids":["https://openalex.org/I57053284"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064797684","display_name":"B. Sayyarrodsari","orcid":null},"institutions":[{"id":"https://openalex.org/I57053284","display_name":"Rockwell Automation (United States)","ror":"https://ror.org/01sx1pm50","country_code":"US","type":"company","lineage":["https://openalex.org/I57053284"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bijan SayyarRodsari","raw_affiliation_strings":["Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA","institution_ids":["https://openalex.org/I57053284"]},{"raw_affiliation_string":"Advanced Analytics Rockwell Automation, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I57053284"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3681,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61168263,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.612212061882019},{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.6002604365348816},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5920828580856323},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5788332223892212},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5591800212860107},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5562470555305481},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.48964840173721313},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.42925554513931274},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.35485541820526123},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33556854724884033},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32910823822021484},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27354127168655396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26129984855651855},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.11828097701072693},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08010056614875793}],"concepts":[{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.612212061882019},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.6002604365348816},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5920828580856323},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5788332223892212},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5591800212860107},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5562470555305481},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.48964840173721313},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.42925554513931274},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.35485541820526123},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33556854724884033},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32910823822021484},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27354127168655396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26129984855651855},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.11828097701072693},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08010056614875793},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias54024.2023.10406615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias54024.2023.10406615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1992434668","https://openalex.org/W2050124321","https://openalex.org/W2050367260","https://openalex.org/W2149693114","https://openalex.org/W2473227053","https://openalex.org/W2795341831","https://openalex.org/W2811266418","https://openalex.org/W2898671425","https://openalex.org/W2969109018","https://openalex.org/W3047145943","https://openalex.org/W3092289133","https://openalex.org/W3141562218","https://openalex.org/W3155258793","https://openalex.org/W3196944050","https://openalex.org/W4200050566","https://openalex.org/W4210608681","https://openalex.org/W4230948665","https://openalex.org/W4254090226"],"related_works":["https://openalex.org/W2544222762","https://openalex.org/W2575775159","https://openalex.org/W2577233154","https://openalex.org/W3186790058","https://openalex.org/W2350226881","https://openalex.org/W190707418","https://openalex.org/W2169757786","https://openalex.org/W2380803702","https://openalex.org/W2164489324","https://openalex.org/W2371797194"],"abstract_inverted_index":{"Various":[0],"faults":[1],"can":[2,25,97,110],"occur":[3],"in":[4,8,59],"3-phase":[5],"power":[6,9],"transformers":[7],"conversion":[10],"systems,":[11],"among":[12],"which":[13],"inter-turn":[14],"short":[15],"circuit":[16],"fault":[17,24,41,81,127],"is":[18,32,50],"critical":[19],"since":[20],"this":[21],"type":[22],"of":[23,40,80,95],"escalate":[26],"rapidly.":[27],"An":[28],"innovative":[29],"detection":[30],"strategy":[31],"proposed":[33,108],"for":[34],"ITSC":[35],"fault.":[36],"This":[37],"method":[38,109],"consists":[39],"indicator":[42,49,82],"extraction":[43],"and":[44,62,72,87,93],"region":[45],"based":[46,76],"decision-making.":[47],"Fault":[48],"formulated":[51],"with":[52],"primary":[53],"side":[54],"admittance":[55],"at":[56],"fundamental":[57],"frequency":[58],"\u0251\u00df":[60],"frame":[61],"mapped":[63],"onto":[64],"a":[65],"2-dimension":[66,85],"plane.":[67],"Three":[68],"regions":[69],"(Health,":[70],"Transition":[71,103],"Fault)":[73],"are":[74],"determined":[75],"on":[77,83],"the":[78,102,107],"distribution":[79],"aforementioned":[84],"plane":[86],"predetermined":[88],"confidence":[89],"levels.":[90],"False":[91],"alarming":[92],"promptness":[94],"diagnostics":[96],"be":[98],"balanced":[99],"by":[100],"introducing":[101],"region.":[104],"In":[105],"addition,":[106],"robustly":[111],"work":[112],"under":[113],"varying":[114],"operation":[115],"conditions":[116],"-":[117],"line":[118],"voltage":[119],"fluctuation,":[120],"shared":[121],"nonlinear":[122],"load":[123,125],"variation,":[124],"change,":[126],"severity,":[128],"etc.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}