{"id":"https://openalex.org/W4206782102","doi":"https://doi.org/10.1109/ias48185.2021.9677366","title":"A Methodology for Characterizing Voltage Disturbances in Distribution Systems With DG Based on Neural Networks","display_name":"A Methodology for Characterizing Voltage Disturbances in Distribution Systems With DG Based on Neural Networks","publication_year":2021,"publication_date":"2021-10-10","ids":{"openalex":"https://openalex.org/W4206782102","doi":"https://doi.org/10.1109/ias48185.2021.9677366"},"language":"en","primary_location":{"id":"doi:10.1109/ias48185.2021.9677366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias48185.2021.9677366","pdf_url":null,"source":{"id":"https://openalex.org/S4363605335","display_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019461977","display_name":"Sergio Turizo","orcid":"https://orcid.org/0000-0003-1483-3161"},"institutions":[{"id":"https://openalex.org/I162096671","display_name":"Universidad de Los Andes","ror":"https://ror.org/02mhbdp94","country_code":"CO","type":"education","lineage":["https://openalex.org/I162096671"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Sergio Turizo","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Universidad de los Andes, Bogot\u00e1, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Universidad de los Andes, Bogot\u00e1, Colombia","institution_ids":["https://openalex.org/I162096671"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010743848","display_name":"Gustavo Ramos","orcid":"https://orcid.org/0000-0003-2240-7875"},"institutions":[{"id":"https://openalex.org/I162096671","display_name":"Universidad de Los Andes","ror":"https://ror.org/02mhbdp94","country_code":"CO","type":"education","lineage":["https://openalex.org/I162096671"]}],"countries":["CO"],"is_corresponding":false,"raw_author_name":"Gustavo Ramos","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Universidad de los Andes, Bogot\u00e1, Colombia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Universidad de los Andes, Bogot\u00e1, Colombia","institution_ids":["https://openalex.org/I162096671"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I162096671"],"apc_list":null,"apc_paid":null,"fwci":1.3004,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78535935,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"7","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-sag","display_name":"Voltage sag","score":0.6294806003570557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5712901949882507},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5547567009925842},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5496616363525391},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5435507297515869},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5331873893737793},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45587414503097534},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.44291016459465027},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3954227864742279},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3905925154685974},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.37548840045928955},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.34803056716918945},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33355259895324707},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.321471244096756},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17684811353683472},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1297488510608673},{"id":"https://openalex.org/keywords/power-quality","display_name":"Power quality","score":0.08864066004753113}],"concepts":[{"id":"https://openalex.org/C2781134633","wikidata":"https://www.wikidata.org/wiki/Q14945479","display_name":"Voltage sag","level":4,"score":0.6294806003570557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5712901949882507},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5547567009925842},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5496616363525391},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5435507297515869},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5331873893737793},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45587414503097534},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44291016459465027},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3954227864742279},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3905925154685974},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.37548840045928955},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.34803056716918945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33355259895324707},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.321471244096756},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17684811353683472},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1297488510608673},{"id":"https://openalex.org/C2779665505","wikidata":"https://www.wikidata.org/wiki/Q1780079","display_name":"Power quality","level":3,"score":0.08864066004753113},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias48185.2021.9677366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias48185.2021.9677366","pdf_url":null,"source":{"id":"https://openalex.org/S4363605335","display_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W309776399","https://openalex.org/W1576238711","https://openalex.org/W1977336398","https://openalex.org/W2059852979","https://openalex.org/W2074020780","https://openalex.org/W2562519430","https://openalex.org/W2625861096","https://openalex.org/W2769219461","https://openalex.org/W2906973030","https://openalex.org/W2989985438","https://openalex.org/W4206126283","https://openalex.org/W4247780662","https://openalex.org/W6610984688"],"related_works":["https://openalex.org/W3035563736","https://openalex.org/W3035889754","https://openalex.org/W1956246598","https://openalex.org/W1974719707","https://openalex.org/W2507979646","https://openalex.org/W2576844470","https://openalex.org/W2359435744","https://openalex.org/W2607678066","https://openalex.org/W2147463953","https://openalex.org/W2077021924"],"abstract_inverted_index":{"Voltage":[0],"sag":[1],"characteristics":[2],"are":[3],"subject":[4],"to":[5,8,17,35,91,101,106,113],"change":[6],"owing":[7],"system":[9,42,63,110],"short-circuit":[10],"rating":[11],"in":[12,29,60,70],"situations":[13],"where":[14],"DG\u2019s":[15],"contribution":[16],"power":[18,109],"injection":[19],"during":[20],"fault":[21],"events":[22],"is":[23,68],"considered.":[24],"Therefore,":[25],"the":[26,30],"fast":[27],"growth":[28],"deployment":[31],"of":[32,38,52],"DG":[33],"leads":[34],"an":[36],"analysis":[37],"its":[39],"impact":[40],"on":[41],"operation":[43],"and":[44,50,55,81],"reliability.":[45],"A":[46],"methodology":[47,97],"for":[48],"characterization":[49],"identification":[51],"voltage":[53,114],"sags":[54],"swells":[56],"caused":[57],"by":[58],"faults":[59],"a":[61,82,87,99,108],"distribution":[62],"with":[64],"distributed":[65],"generation":[66],"(DG)":[67],"presented":[69],"this":[71],"paper.":[72],"The":[73],"proposed":[74],"methodology,":[75],"involving":[76],"Wavelet":[77],"transform":[78],"processing":[79],"technique":[80],"neural":[83],"network":[84],"classifier,":[85],"yields":[86],"computational":[88],"tool":[89],"applied":[90],"IEEE":[92],"13-Node":[93],"Test":[94],"Feeder.":[95],"This":[96],"provides":[98],"way":[100],"handle":[102],"high":[103],"data":[104],"stream":[105],"obtain":[107],"response":[111],"generalization":[112],"disturbances.":[115]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}