{"id":"https://openalex.org/W4205144591","doi":"https://doi.org/10.1109/ias48185.2021.9677250","title":"Fault Analysis of An IPRB Microgrid with Multiple Grid Forming Inverter-based Sources","display_name":"Fault Analysis of An IPRB Microgrid with Multiple Grid Forming Inverter-based Sources","publication_year":2021,"publication_date":"2021-10-10","ids":{"openalex":"https://openalex.org/W4205144591","doi":"https://doi.org/10.1109/ias48185.2021.9677250"},"language":"en","primary_location":{"id":"doi:10.1109/ias48185.2021.9677250","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias48185.2021.9677250","pdf_url":null,"source":{"id":"https://openalex.org/S4363605335","display_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100764936","display_name":"Li Qi","orcid":"https://orcid.org/0000-0002-4679-0795"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li Lisa Qi","raw_affiliation_strings":["Research Center, ABB Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center, ABB Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100657059","display_name":"Yuzhi Zhang","orcid":"https://orcid.org/0000-0003-3335-3120"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuzhi Zhang","raw_affiliation_strings":["Research Center, ABB Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center, ABB Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050598626","display_name":"Taosha Jiang","orcid":"https://orcid.org/0009-0004-4746-1434"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Taosha Jiang","raw_affiliation_strings":["Research Center, ABB Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center, ABB Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025719885","display_name":"Harish Suryanarayana","orcid":"https://orcid.org/0000-0002-2453-0677"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Harish Suryanarayana","raw_affiliation_strings":["Research Center, ABB Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center, ABB Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049826855","display_name":"S. Colombi","orcid":null},"institutions":[{"id":"https://openalex.org/I885143765","display_name":"ABB (Switzerland)","ror":"https://ror.org/00ks5vt51","country_code":"CH","type":"company","lineage":["https://openalex.org/I885143765"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Silvio Colombi","raw_affiliation_strings":["Electrification Smart Power, ABB Ltd., Quartino, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrification Smart Power, ABB Ltd., Quartino, Switzerland","institution_ids":["https://openalex.org/I885143765"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021583657","display_name":"Harry Handlin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Harry Handlin","raw_affiliation_strings":["Electrification Distribution Solutions, ABB Inc., Birmingham, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrification Distribution Solutions, ABB Inc., Birmingham, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.306,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77537023,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.8768149614334106},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.7782901525497437},{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.6933273673057556},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6891685724258423},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.4975884258747101},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.48984047770500183},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.4418072998523712},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.43164291977882385},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.40940895676612854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4018326699733734},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35693269968032837},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3493114113807678},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2988775372505188},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.29645276069641113},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.16875070333480835},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15865039825439453},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05032142996788025}],"concepts":[{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.8768149614334106},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.7782901525497437},{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.6933273673057556},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6891685724258423},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.4975884258747101},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.48984047770500183},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.4418072998523712},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.43164291977882385},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40940895676612854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4018326699733734},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35693269968032837},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3493114113807678},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2988775372505188},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.29645276069641113},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.16875070333480835},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15865039825439453},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05032142996788025},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias48185.2021.9677250","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias48185.2021.9677250","pdf_url":null,"source":{"id":"https://openalex.org/S4363605335","display_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.5899999737739563,"display_name":"Reduced inequalities"},{"id":"https://metadata.un.org/sdg/16","score":0.4399999976158142,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1990109128","https://openalex.org/W1995153586","https://openalex.org/W2016073067","https://openalex.org/W2073283302","https://openalex.org/W2095998107","https://openalex.org/W2155058494","https://openalex.org/W2162739864","https://openalex.org/W2176250420","https://openalex.org/W2238280276","https://openalex.org/W2515377559","https://openalex.org/W2540015763","https://openalex.org/W2765725028","https://openalex.org/W2909427109","https://openalex.org/W3001643620","https://openalex.org/W4205876966","https://openalex.org/W6725789730"],"related_works":["https://openalex.org/W3034608034","https://openalex.org/W2896710163","https://openalex.org/W3094463948","https://openalex.org/W1973117816","https://openalex.org/W1586801069","https://openalex.org/W3159420259","https://openalex.org/W1989451277","https://openalex.org/W2808698631","https://openalex.org/W1548783648","https://openalex.org/W2036302375"],"abstract_inverted_index":{"This":[0],"paper":[1,104],"studies":[2],"fault":[3,30,43,57,70,73,86,90,100],"characteristics":[4],"of":[5,29],"an":[6],"isolated":[7],"parallel":[8],"ring":[9],"bus":[10],"(IPRB)":[11],"microgrid":[12],"with":[13,55,66],"multiple":[14],"inverter-based":[15,109],"sources.":[16],"The":[17,99],"system":[18],"is":[19,61],"used":[20],"for":[21,36],"critical":[22,37],"power":[23,34],"applications,":[24],"such":[25],"as":[26],"datacenters,":[27],"because":[28],"isolation":[31],"and":[32,68,81,92,94],"good":[33],"quality":[35],"or":[38],"sensitive":[39],"loads.":[40],"Inverters":[41],"apply":[42],"current":[44],"limiting":[45],"(FCL)":[46],"control":[47],"to":[48,63,107],"protect":[49],"their":[50],"semiconductors.":[51],"Inverter":[52],"semiconductor":[53],"protection":[54,65,97],"restricted":[56],"currents":[58],"by":[59],"FCL":[60,83],"contrary":[62],"overcurrent":[64],"high":[67],"discriminative":[69],"currents.":[71],"Distinguished":[72],"features":[74,87],"arise":[75],"from":[76],"the":[77],"unique":[78],"IPRB":[79],"configuration":[80],"inverter":[82],"control.":[84],"These":[85],"may":[88],"support":[89],"detection":[91],"location,":[93],"thus":[95],"improve":[96],"speed.":[98],"analysis":[101],"in":[102],"this":[103],"provides":[105],"references":[106],"other":[108],"microgrids.":[110]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}