{"id":"https://openalex.org/W3126530558","doi":"https://doi.org/10.1109/ias44978.2020.9334802","title":"Rail Surface Inspection System Using Differential Topographic Images","display_name":"Rail Surface Inspection System Using Differential Topographic Images","publication_year":2020,"publication_date":"2020-10-10","ids":{"openalex":"https://openalex.org/W3126530558","doi":"https://doi.org/10.1109/ias44978.2020.9334802","mag":"3126530558"},"language":"en","primary_location":{"id":"doi:10.1109/ias44978.2020.9334802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias44978.2020.9334802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027444378","display_name":"Francisco J. delaCalle","orcid":"https://orcid.org/0000-0002-5546-2005"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F. J. delaCalle","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088793009","display_name":"Daniel F. Garc\u00eda","orcid":"https://orcid.org/0000-0001-8499-9744"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Daniel F. Garcia","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain","institution_ids":["https://openalex.org/I165339363"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031476067","display_name":"Rub\u00e9n Usamentiaga","orcid":"https://orcid.org/0000-0003-0551-3203"},"institutions":[{"id":"https://openalex.org/I165339363","display_name":"Universidad de Oviedo","ror":"https://ror.org/006gksa02","country_code":"ES","type":"education","lineage":["https://openalex.org/I165339363"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Ruben Usamentiaga","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Oviedo, Gij\u00f3n, Asturias, Spain","institution_ids":["https://openalex.org/I165339363"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I165339363"],"apc_list":null,"apc_paid":null,"fwci":0.7652,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.70482792,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.7435460686683655},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.676630973815918},{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.6455546617507935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.55878084897995},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5292600393295288},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5096392631530762},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.5017795562744141},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.4732145369052887},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.46350234746932983},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3529929220676422},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2081330120563507},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.1019444465637207}],"concepts":[{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.7435460686683655},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.676630973815918},{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.6455546617507935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.55878084897995},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5292600393295288},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5096392631530762},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.5017795562744141},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.4732145369052887},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.46350234746932983},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3529929220676422},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2081330120563507},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.1019444465637207},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias44978.2020.9334802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias44978.2020.9334802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309990","display_name":"Arcelor","ror":"https://ror.org/02bez8p50"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1975089519","https://openalex.org/W1978289332","https://openalex.org/W1987102866","https://openalex.org/W2012085014","https://openalex.org/W2017672812","https://openalex.org/W2019115728","https://openalex.org/W2042448728","https://openalex.org/W2045450279","https://openalex.org/W2091250708","https://openalex.org/W2102219944","https://openalex.org/W2119029826","https://openalex.org/W2187098286","https://openalex.org/W2206739865","https://openalex.org/W2390240749","https://openalex.org/W2406968003","https://openalex.org/W2444611651","https://openalex.org/W2503931548","https://openalex.org/W2510357152","https://openalex.org/W2536297875","https://openalex.org/W2536936371","https://openalex.org/W2742694207","https://openalex.org/W2749684264","https://openalex.org/W2757221183","https://openalex.org/W2764067741","https://openalex.org/W2767325150","https://openalex.org/W2769326495","https://openalex.org/W2799061466","https://openalex.org/W2800079217","https://openalex.org/W2808310813","https://openalex.org/W2908884717","https://openalex.org/W4285719527","https://openalex.org/W6686778916","https://openalex.org/W6713957486","https://openalex.org/W6743529231"],"related_works":["https://openalex.org/W2318290115","https://openalex.org/W581462317","https://openalex.org/W2204095332","https://openalex.org/W2360061061","https://openalex.org/W2582763622","https://openalex.org/W2094063693","https://openalex.org/W2349836732","https://openalex.org/W2011477640","https://openalex.org/W587195877","https://openalex.org/W1964555073"],"abstract_inverted_index":{"In":[0],"this":[1,90],"paper":[2,91],"a":[3,33,67,93,135,153,180,185,200],"surface":[4,26,125,148],"inspection":[5,27,43,83],"system":[6,84,87,118,173],"for":[7,29],"rails":[8,30,183],"is":[9,132,157],"presented.":[10],"Rails":[11],"must":[12,49],"meet":[13],"the":[14,38,58,74,79,82,98,101,112,124,127,139,147,150,164,168,194],"strict":[15],"requirements":[16,99],"of":[17,35,42,57,81,95,100,114,126,138,146,149,182],"international":[18,102,169],"quality":[19,170],"standards,":[20],"however":[21],"there":[22],"are":[23],"few":[24,59],"commercial":[25,60],"systems":[28,44,53,64,197],"and":[31,40,70,97,177,184],"also,":[32],"lack":[34],"publications":[36],"describing":[37],"design":[39],"configuration":[41,72,109],"in":[45,89,167,199],"detail.":[46],"Therefore,":[47],"manufacturers":[48],"develop":[50],"their":[51],"own":[52],"or":[54],"buy":[55],"one":[56],"ones":[61],"available.":[62],"These":[63],"also":[65],"need":[66],"long,":[68],"cumbersome":[69],"expensive":[71],"process":[73,110],"manufacturer":[75],"cannot":[76],"perform":[77],"without":[78],"assistance":[80],"provider.":[85],"The":[86,117,129,172],"proposed":[88],"needs":[92],"set":[94,181],"samples":[96],"standards":[103],"to":[104,122,134,141,159],"carry":[105],"out":[106],"an":[107],"automatic":[108],"avoiding":[111],"cost":[113],"manual":[115],"configuration.":[116],"uses":[119],"four":[120],"profilometers":[121],"acquire":[123],"rail.":[128,151],"acquired":[130],"data":[131],"compared":[133],"mathematical":[136],"model":[137],"rail":[140,186],"generate":[142],"differential":[143],"topographic":[144],"images":[145],"Then":[152],"computer":[154],"vision":[155],"algorithm":[156],"used":[158],"detect":[160],"defects":[161],"based":[162],"on":[163],"tolerances":[165],"established":[166],"standards.":[171],"has":[174],"been":[175],"tested":[176],"validated":[178],"using":[179],"pattern":[187],"from":[188],"ArcelorMittal,":[189],"with":[190],"better":[191],"results":[192],"than":[193],"other":[195],"two":[196],"installed":[198],"factory.":[201]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}