{"id":"https://openalex.org/W3127518623","doi":"https://doi.org/10.1109/ias44978.2020.9334797","title":"Power loop busbars design and experimental validation of 1 kV, 5 kA Solid State Circuit Breaker using parallel connected RB-IGCTs","display_name":"Power loop busbars design and experimental validation of 1 kV, 5 kA Solid State Circuit Breaker using parallel connected RB-IGCTs","publication_year":2020,"publication_date":"2020-10-10","ids":{"openalex":"https://openalex.org/W3127518623","doi":"https://doi.org/10.1109/ias44978.2020.9334797","mag":"3127518623"},"language":"en","primary_location":{"id":"doi:10.1109/ias44978.2020.9334797","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias44978.2020.9334797","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065434830","display_name":"Rostan Rodrigues","orcid":"https://orcid.org/0000-0001-7148-8013"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rostan Rodrigues","raw_affiliation_strings":["US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048855051","display_name":"Utkarsh Raheja","orcid":"https://orcid.org/0009-0000-6546-279X"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Utkarsh Raheja","raw_affiliation_strings":["US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100657059","display_name":"Yuzhi Zhang","orcid":"https://orcid.org/0000-0003-3335-3120"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuzhi Zhang","raw_affiliation_strings":["US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022503984","display_name":"Pietro Cairoli","orcid":"https://orcid.org/0000-0002-2557-5594"},"institutions":[{"id":"https://openalex.org/I2948539688","display_name":"AbbVie (United States)","ror":"https://ror.org/02g5p4n58","country_code":"US","type":"company","lineage":["https://openalex.org/I2948539688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pietro Cairoli","raw_affiliation_strings":["US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"US Corporate Research Center, ABB Inc., Raleigh, North Carolina, USA","institution_ids":["https://openalex.org/I2948539688"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061368166","display_name":"Antonello Antoniazzi","orcid":"https://orcid.org/0009-0002-8540-7995"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Antonello Antoniazzi","raw_affiliation_strings":["Electrification Products Smart Power, ABB S.p.A, Bergamo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrification Products Smart Power, ABB S.p.A, Bergamo, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2081,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54127042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/busbar","display_name":"Busbar","score":0.8867567181587219},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.8052787184715271},{"id":"https://openalex.org/keywords/integrated-gate-commutated-thyristor","display_name":"Integrated gate-commutated thyristor","score":0.6681596040725708},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.548957347869873},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48708462715148926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4356377124786377},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4303939938545227},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.41402214765548706},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4137251079082489},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3968490660190582},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35730183124542236},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.3349260687828064},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14583438634872437},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1280890703201294}],"concepts":[{"id":"https://openalex.org/C192690417","wikidata":"https://www.wikidata.org/wiki/Q1030817","display_name":"Busbar","level":2,"score":0.8867567181587219},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.8052787184715271},{"id":"https://openalex.org/C194777113","wikidata":"https://www.wikidata.org/wiki/Q1066563","display_name":"Integrated gate-commutated thyristor","level":4,"score":0.6681596040725708},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.548957347869873},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48708462715148926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4356377124786377},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4303939938545227},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.41402214765548706},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4137251079082489},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3968490660190582},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35730183124542236},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.3349260687828064},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14583438634872437},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1280890703201294},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias44978.2020.9334797","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias44978.2020.9334797","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1511158764","https://openalex.org/W1980721129","https://openalex.org/W2178795263","https://openalex.org/W2247991283","https://openalex.org/W2766166370","https://openalex.org/W2769825649","https://openalex.org/W2918459517","https://openalex.org/W2975279310","https://openalex.org/W2976490525","https://openalex.org/W2990925732","https://openalex.org/W2994351044"],"related_works":["https://openalex.org/W1830300994","https://openalex.org/W2099191517","https://openalex.org/W2378476669","https://openalex.org/W2571003122","https://openalex.org/W2107671007","https://openalex.org/W2393611170","https://openalex.org/W2902864868","https://openalex.org/W2393255129","https://openalex.org/W1862948778","https://openalex.org/W2365275120"],"abstract_inverted_index":{"This":[0],"paper":[1,49],"investigates":[2],"the":[3,30,52,109,147],"design":[4,55,81],"of":[5,18,33,47,59,62,82],"1":[6],"kV,":[7],"5":[8],"kA":[9,126,136],"solid":[10],"state":[11],"circuit":[12],"breaker":[13,25],"by":[14,88],"using":[15],"parallel":[16,31,60,110,131,141],"connection":[17,32,61],"Reverse":[19],"Blocking":[20],"IGCTs":[21],"(RB-IGCT).":[22],"The":[23,45,104],"presented":[24],"topology":[26,111],"is":[27,50,112],"based":[28,80],"on":[29,51,69],"low":[34],"conduction":[35],"loss":[36],"RB-IGCTs":[37,66],"which":[38],"delivers":[39],"efficiency":[40],"as":[41,43,76,149,151],"high":[42],"99.9%.":[44],"focus":[46],"this":[48],"power":[53,83],"loop":[54,84],"and":[56,64,120,132],"experimental":[57,105],"validation":[58],"two":[63,128],"three":[65,138],"with":[67,143],"emphasis":[68],"current":[70,96,116,144],"sharing":[71,97],"during":[72,118],"dynamic":[73,95],"events":[74],"such":[75],"short-circuits.":[77],"A":[78],"3D-CAD":[79],"busbars":[85],"was":[86],"verified":[87],"several":[89],"simulation":[90],"test":[91],"cases":[92],"to":[93,114,124,134],"represent":[94],"under":[98],"variations":[99],"in":[100,130,140],"RB-IGCT":[101],"package":[102],"impedances.":[103],"results":[106],"confirm":[107],"that":[108],"able":[113],"perform":[115],"interruption":[117],"overload":[119],"short-circuit":[121],"situations":[122],"up":[123,133],"10":[125],"for":[127,137],"devices":[129,139],"14":[135],"-":[142],"deviation":[145],"from":[146],"mean":[148],"little":[150],"6%.":[152]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
