{"id":"https://openalex.org/W2990269825","doi":"https://doi.org/10.1109/ias.2019.8911927","title":"Remote PMU Testing using Low-cost FPGA Platform and PPA following IEEE TSS","display_name":"Remote PMU Testing using Low-cost FPGA Platform and PPA following IEEE TSS","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2990269825","doi":"https://doi.org/10.1109/ias.2019.8911927","mag":"2990269825"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2019.8911927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2019.8911927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032464575","display_name":"Chuan Qin","orcid":"https://orcid.org/0000-0001-7804-3690"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chuan Qin","raw_affiliation_strings":["Washington State University, Pullman, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025967064","display_name":"Jacob Greig-Prine","orcid":null},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob Greig-Prine","raw_affiliation_strings":["Washington State University, Pullman, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059807664","display_name":"Zhijie Nie","orcid":"https://orcid.org/0000-0003-2171-3416"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhijie Nie","raw_affiliation_strings":["Washington State University, Pullman, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018792364","display_name":"P. Banerjee","orcid":"https://orcid.org/0000-0002-9629-7157"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Banerjee","raw_affiliation_strings":["Washington State University, Pullman, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028171150","display_name":"Anurag K. Srivastava","orcid":"https://orcid.org/0000-0003-3518-8018"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anurag K. Srivastava","raw_affiliation_strings":["Washington State University, Pullman, WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I72951846"],"apc_list":null,"apc_paid":null,"fwci":0.7438,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75593774,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"21","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12216","display_name":"Network Time Synchronization Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12216","display_name":"Network Time Synchronization Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8271013498306274},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5741884112358093},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5456245541572571},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.356295108795166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2629976272583008}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8271013498306274},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5741884112358093},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5456245541572571},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.356295108795166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2629976272583008}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2019.8911927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2019.8911927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1843873423","https://openalex.org/W2033362550","https://openalex.org/W2038510226","https://openalex.org/W2149087321","https://openalex.org/W2149581370","https://openalex.org/W2152597055","https://openalex.org/W2485441206","https://openalex.org/W2576253142","https://openalex.org/W2583708305","https://openalex.org/W4231796025","https://openalex.org/W4242508569"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2111241003","https://openalex.org/W2390279801","https://openalex.org/W4200391368","https://openalex.org/W2358668433","https://openalex.org/W2355315220","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"Enhanced":[0],"automation":[1,29],"and":[2,30,43,84,120,130,182,197],"control":[3,31],"requires":[4],"advanced":[5,28],"sensors":[6,21],"in":[7,33,47,141,156,219],"the":[8,20,23,34,48,60,142,163,179,183,194,213],"smart":[9],"electric":[10,35],"power":[11],"grid.":[12,36],"Phasor":[13],"Measurement":[14,63],"Unit":[15],"(PMU)":[16],"is":[17,74,153,166,190,216],"one":[18],"of":[19,72,133,178,188,204],"with":[22,88,94],"fastest":[24],"streaming":[25],"data":[26],"enabling":[27],"algorithms":[32],"After":[37],"PMUs":[38],"are":[39,51,85],"initially":[40],"tested,":[41],"installed,":[42],"brought":[44],"into":[45],"service":[46],"field,":[49],"there":[50],"no":[52],"established":[53],"procedure":[54],"for":[55,111,171,208],"in-field":[56,69,112],"calibration":[57],"testing":[58,71,115],"following":[59],"IEEE":[61],"Synchrophasor":[62],"Test":[64],"Suite":[65],"Specification":[66],"(TSS).":[67],"Hence,":[68],"remote":[70,113],"PMU":[73,79,114,136,172,207],"necessary":[75],"to":[76,168],"guarantee":[77],"that":[78,92,99],"performs":[80],"accurately":[81],"when":[82],"needed":[83],"not":[86,101],"affected":[87],"any":[89],"software/hardware":[90],"error":[91],"develops":[93],"time":[95],"or":[96],"hidden":[97],"failure":[98],"was":[100],"captured":[102],"before":[103],"commissioning.":[104],"This":[105],"paper":[106],"proposes":[107],"a":[108,134,146,205],"feasible":[109],"architecture":[110,129],"using":[116,145,162,212],"an":[117,128],"FPGA":[118,143],"platform":[119,144],"PPA":[121],"software":[122],"platform,":[123],"as":[124,126],"well":[125],"presents":[127],"accuracy":[131,177],"requirement":[132],"typical":[135],"calibrator.":[137],"An":[138],"algorithm":[139],"implemented":[140],"low-cost":[147],"National":[148],"Instrument":[149],"compact":[150],"RIO":[151],"(NI-cRIO)":[152],"also":[154,217],"proposed":[155,164,180,214],"this":[157,220],"paper.":[158,221],"The":[159,176,201],"generated":[160],"signal":[161,185],"method":[165,181,215],"demonstrated":[167],"be":[169],"suitable":[170],"static":[173,209],"test":[174,210],"cases.":[175],"in-built":[184],"generation":[186],"module":[187],"NI-cRIO":[189],"compared":[191],"based":[192],"on":[193],"frequency":[195],"uncertainty":[196],"total":[198],"harmonic":[199],"distortion.":[200],"compliance":[202],"results":[203],"sample":[206],"cases":[211],"presented":[218]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}