{"id":"https://openalex.org/W2767725937","doi":"https://doi.org/10.1109/ias.2017.8101868","title":"Energy storage to improve reliability of wind integrated systems under frequency security constraint","display_name":"Energy storage to improve reliability of wind integrated systems under frequency security constraint","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2767725937","doi":"https://doi.org/10.1109/ias.2017.8101868","mag":"2767725937"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2017.8101868","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2017.8101868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070436771","display_name":"Nga Nguyen","orcid":"https://orcid.org/0000-0001-7833-5538"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nga Nguyen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041568013","display_name":"Atri Bera","orcid":"https://orcid.org/0000-0003-0388-8773"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Atri Bera","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035972401","display_name":"Joydeep Mitra","orcid":"https://orcid.org/0000-0001-9287-0983"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joydeep Mitra","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.263,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80964448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wind-power","display_name":"Wind power","score":0.7474364638328552},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7241844534873962},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7232064008712769},{"id":"https://openalex.org/keywords/energy-storage","display_name":"Energy storage","score":0.6183905005455017},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5547997951507568},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.552049458026886},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4791814088821411},{"id":"https://openalex.org/keywords/computer-data-storage","display_name":"Computer data storage","score":0.4695846438407898},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.33277440071105957},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2859639823436737},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19377878308296204}],"concepts":[{"id":"https://openalex.org/C78600449","wikidata":"https://www.wikidata.org/wiki/Q43302","display_name":"Wind power","level":2,"score":0.7474364638328552},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7241844534873962},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7232064008712769},{"id":"https://openalex.org/C73916439","wikidata":"https://www.wikidata.org/wiki/Q837718","display_name":"Energy storage","level":3,"score":0.6183905005455017},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5547997951507568},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.552049458026886},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4791814088821411},{"id":"https://openalex.org/C194739806","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Computer data storage","level":2,"score":0.4695846438407898},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.33277440071105957},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2859639823436737},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19377878308296204},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2017.8101868","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2017.8101868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1486460655","https://openalex.org/W1584518961","https://openalex.org/W1965165583","https://openalex.org/W1974690503","https://openalex.org/W1980489488","https://openalex.org/W1980723399","https://openalex.org/W1990886506","https://openalex.org/W1991181079","https://openalex.org/W1992055833","https://openalex.org/W1992601661","https://openalex.org/W1992766013","https://openalex.org/W1994252937","https://openalex.org/W2000685472","https://openalex.org/W2001860597","https://openalex.org/W2033225140","https://openalex.org/W2039795555","https://openalex.org/W2043512749","https://openalex.org/W2046869866","https://openalex.org/W2096429242","https://openalex.org/W2098385222","https://openalex.org/W2102501485","https://openalex.org/W2105653794","https://openalex.org/W2114661994","https://openalex.org/W2118312569","https://openalex.org/W2125326080","https://openalex.org/W2126809563","https://openalex.org/W2128239368","https://openalex.org/W2140281103","https://openalex.org/W2146689117","https://openalex.org/W2151833083","https://openalex.org/W2162331448","https://openalex.org/W2170812317","https://openalex.org/W2176477548","https://openalex.org/W2197662544","https://openalex.org/W2213315527","https://openalex.org/W2313298879","https://openalex.org/W2534887834","https://openalex.org/W2551291260","https://openalex.org/W2560102248","https://openalex.org/W2560619822","https://openalex.org/W2602237370","https://openalex.org/W2618516343"],"related_works":["https://openalex.org/W2557657611","https://openalex.org/W4211120176","https://openalex.org/W1986587019","https://openalex.org/W4386688818","https://openalex.org/W2108466866","https://openalex.org/W4307690338","https://openalex.org/W2159468497","https://openalex.org/W2001580136","https://openalex.org/W2347801455","https://openalex.org/W2373425142"],"abstract_inverted_index":{"The":[0,86,132],"integration":[1],"of":[2,56,89,134],"wind":[3,26,45,103],"power":[4,27],"into":[5],"the":[6,36,40,49,54,57,67,118,123,128,135,140],"grid":[7],"causes":[8],"numerous":[9],"stability":[10],"and":[11,19,104],"reliability":[12,55,125],"issues":[13],"due":[14],"to":[15,30,65,113,121],"its":[16],"low":[17],"inertia":[18],"intermittent":[20],"nature.":[21],"To":[22],"ensure":[23],"system":[24,37,59,68,120,124,129],"stability,":[25],"production":[28],"has":[29],"be":[31,73,95],"restricted,":[32],"which":[33,75],"implies":[34],"that":[35],"cannot":[38],"absorb":[39],"entire":[41],"output":[42,50],"available":[43],"from":[44],"generation,":[46],"especially":[47],"if":[48,97],"is":[51,60,76,99,137],"high.":[52],"Consequently,":[53],"integrated":[58],"adversely":[61],"affected.":[62],"In":[63],"order":[64],"improve":[66,122],"reliability,":[69],"energy":[70,91,115],"storage":[71,92,116],"can":[72,94],"used,":[74],"emerging":[77],"as":[78],"a":[79,110],"prominent":[80],"solution":[81],"for":[82],"enhancing":[83],"supply":[84],"continuity.":[85],"complete":[87],"utilization":[88],"an":[90],"device":[93],"achieved":[96],"it":[98],"properly":[100],"coordinated":[101],"with":[102,117],"conventional":[105],"generation.":[106],"This":[107],"paper":[108],"proposes":[109],"new":[111],"method":[112],"coordinate":[114],"existing":[119],"while":[126],"maintaining":[127],"frequency":[130],"security.":[131],"effectiveness":[133],"model":[136],"demonstrated":[138],"on":[139],"IEEE":[141],"RTS-79":[142],"system.":[143]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}