{"id":"https://openalex.org/W2210585422","doi":"https://doi.org/10.1109/ias.2015.7356920","title":"Value of insulated bus bars in reducing arcing fault duration in low voltage systems","display_name":"Value of insulated bus bars in reducing arcing fault duration in low voltage systems","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W2210585422","doi":"https://doi.org/10.1109/ias.2015.7356920","mag":"2210585422"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2015.7356920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2015.7356920","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019557925","display_name":"Rahul Rajvanshi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Rahul Rajvanshi","raw_affiliation_strings":["Siemens Industry, Inc., TX, USA"],"affiliations":[{"raw_affiliation_string":"Siemens Industry, Inc., TX, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109160380","display_name":"Tom Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tom Hawkins","raw_affiliation_strings":["Siemens Industry, Inc., TX, USA"],"affiliations":[{"raw_affiliation_string":"Siemens Industry, Inc., TX, USA","institution_ids":["https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5019557925"],"corresponding_institution_ids":["https://openalex.org/I4210137693"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09526541,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switchgear","display_name":"Switchgear","score":0.9709827899932861},{"id":"https://openalex.org/keywords/electric-arc","display_name":"Electric arc","score":0.7409876585006714},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5705633759498596},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.547829806804657},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.5219023823738098},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.512089729309082},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.4656098186969757},{"id":"https://openalex.org/keywords/busbar","display_name":"Busbar","score":0.46309590339660645},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4596203863620758},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4291118383407593},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.4282355010509491},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4180837869644165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3567692041397095},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.35569971799850464},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.21828296780586243},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.2180401086807251},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.1118205189704895}],"concepts":[{"id":"https://openalex.org/C93893174","wikidata":"https://www.wikidata.org/wiki/Q1273786","display_name":"Switchgear","level":2,"score":0.9709827899932861},{"id":"https://openalex.org/C114375839","wikidata":"https://www.wikidata.org/wiki/Q207456","display_name":"Electric arc","level":3,"score":0.7409876585006714},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5705633759498596},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.547829806804657},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.5219023823738098},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.512089729309082},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.4656098186969757},{"id":"https://openalex.org/C192690417","wikidata":"https://www.wikidata.org/wiki/Q1030817","display_name":"Busbar","level":2,"score":0.46309590339660645},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4596203863620758},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4291118383407593},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.4282355010509491},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4180837869644165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3567692041397095},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.35569971799850464},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.21828296780586243},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.2180401086807251},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.1118205189704895},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2015.7356920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2015.7356920","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2185545316","https://openalex.org/W4236226457","https://openalex.org/W4256489157"],"related_works":["https://openalex.org/W2143690715","https://openalex.org/W3035955964","https://openalex.org/W2369614122","https://openalex.org/W1584083074","https://openalex.org/W2371141411","https://openalex.org/W2543873567","https://openalex.org/W2371989629","https://openalex.org/W1936397948","https://openalex.org/W2083510330","https://openalex.org/W2377348163"],"abstract_inverted_index":{"Power":[0],"distribution":[1,27],"equipment":[2,61,83],"is":[3,32,45,100],"the":[4,15,21,25,43,57,60,82,92,120],"backbone":[5],"of":[6,24,36,46,107,124],"any":[7],"Industrial":[8],"process":[9],"infrastructure.":[10],"Safety":[11],"and":[12,68,78,89,139,153],"reliability":[13],"are":[14],"two":[16],"most":[17],"important":[18,34],"criteria":[19],"in":[20,42,81,116,134],"proper":[22],"functioning":[23],"power":[26,37],"system.":[28],"Low":[29,96],"voltage":[30],"switchgear":[31,44],"an":[33,104],"part":[35],"distribution.":[38],"Minimizing":[39],"arcing":[40,151],"faults":[41,55],"utmost":[47],"importance":[48],"to":[49,102,119],"enable":[50],"a":[51],"safe":[52],"environment.":[53],"Arcing":[54],"increase":[56],"temperatures":[58],"inside":[59],"beyond":[62],"20,000":[63],"K,":[64],"rapidly":[65],"heating":[66],"air":[67],"vaporizing":[69],"metal":[70],"parts.":[71],"This":[72],"expanding":[73],"plasma":[74],"creates":[75],"severe":[76],"mechanical":[77],"thermal":[79],"stress":[80],"which":[84],"can":[85],"blow":[86],"open":[87],"doors":[88],"fragment/burn":[90],"through":[91],"enclosure.":[93],"Arc":[94,131],"Resistant":[95,132],"Voltage":[97],"Switchgear":[98],"(LVS)":[99],"designed":[101],"provide":[103],"additional":[105],"degree":[106],"protection":[108],"for":[109],"operating":[110,114],"personnel":[111],"performing":[112],"normal":[113],"duties":[115],"close":[117],"proximity":[118],"equipment.":[121],"A":[122],"series":[123],"arc":[125],"flash":[126],"simulations":[127],"were":[128],"performed":[129],"on":[130],"LVS":[133],"both":[135],"Bare":[136],"Bus":[137,141,147],"(Non-Insulated)":[138],"Insulated/Isolated":[140,146],"configurations.":[142],"In":[143],"all":[144],"simulations,":[145],"had":[148],"significantly":[149],"shorter":[150],"duration":[152],"lower":[154],"energy":[155],"emitted.":[156]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}