{"id":"https://openalex.org/W2213965079","doi":"https://doi.org/10.1109/ias.2015.7356748","title":"Static elimination in Vacuum","display_name":"Static elimination in Vacuum","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W2213965079","doi":"https://doi.org/10.1109/ias.2015.7356748","mag":"2213965079"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2015.7356748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2015.7356748","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079275606","display_name":"Takashi Ikehata","orcid":"https://orcid.org/0000-0002-1181-446X"},"institutions":[{"id":"https://openalex.org/I6178835","display_name":"Ibaraki University","ror":"https://ror.org/00sjd5653","country_code":"JP","type":"education","lineage":["https://openalex.org/I6178835"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Ikehata","raw_affiliation_strings":["Ibaraki University, Ibaraki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibaraki University, Ibaraki, Japan","institution_ids":["https://openalex.org/I6178835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028645339","display_name":"Daisuke Nemoto","orcid":null},"institutions":[{"id":"https://openalex.org/I6178835","display_name":"Ibaraki University","ror":"https://ror.org/00sjd5653","country_code":"JP","type":"education","lineage":["https://openalex.org/I6178835"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Nemoto","raw_affiliation_strings":["Ibaraki University, Ibaraki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibaraki University, Ibaraki, Japan","institution_ids":["https://openalex.org/I6178835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058230716","display_name":"Wan\u2010Ting He","orcid":"https://orcid.org/0000-0001-5501-298X"},"institutions":[{"id":"https://openalex.org/I6178835","display_name":"Ibaraki University","ror":"https://ror.org/00sjd5653","country_code":"JP","type":"education","lineage":["https://openalex.org/I6178835"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wanting He","raw_affiliation_strings":["Ibaraki University, Ibaraki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibaraki University, Ibaraki, Japan","institution_ids":["https://openalex.org/I6178835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108625376","display_name":"Takeshi Matsuo","orcid":null},"institutions":[{"id":"https://openalex.org/I6178835","display_name":"Ibaraki University","ror":"https://ror.org/00sjd5653","country_code":"JP","type":"education","lineage":["https://openalex.org/I6178835"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Matsuo","raw_affiliation_strings":["Ibaraki University, Ibaraki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibaraki University, Ibaraki, Japan","institution_ids":["https://openalex.org/I6178835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109150156","display_name":"Naoyuki Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I6178835","display_name":"Ibaraki University","ror":"https://ror.org/00sjd5653","country_code":"JP","type":"education","lineage":["https://openalex.org/I6178835"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoyuki Sato","raw_affiliation_strings":["Ibaraki University, Ibaraki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibaraki University, Ibaraki, Japan","institution_ids":["https://openalex.org/I6178835"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112008924","display_name":"Kazuo Okano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120584","display_name":"The Polytechnic University of Japan","ror":"https://ror.org/02f0psx94","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210120584"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuo Okano","raw_affiliation_strings":["The Polytechnic University, Kodaira, japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Polytechnic University, Kodaira, japan","institution_ids":["https://openalex.org/I4210120584"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4118,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55350803,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"32","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3414757251739502},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33391863107681274}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3414757251739502},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33391863107681274}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2015.7356748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2015.7356748","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6299999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1970727981","https://openalex.org/W1979793111","https://openalex.org/W1990439855","https://openalex.org/W2003698744","https://openalex.org/W2006045406","https://openalex.org/W2030681671","https://openalex.org/W2030980030","https://openalex.org/W2068370426","https://openalex.org/W2101957225","https://openalex.org/W3025003181"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"Static":[0],"elimination":[1,31,46],"characteristics":[2],"of":[3,20,26],"an":[4],"AC":[5],"corona":[6],"ionizer":[7,59],"in":[8],"N2-CF3I":[9],"and":[10,23,57],"N2-O2gases":[11],"at":[12],"reduced":[13],"pressure":[14,56],"have":[15],"been":[16],"explored.":[17],"The":[18],"amplitude":[19],"neutralizing":[21],"current":[22],"voltage":[24],"ripple":[25],"the":[27,36,43,54,58],"object":[28],"during":[29],"static":[30,45],"rapidly":[32],"increase":[33],"with":[34],"decreasing":[35],"gas":[37,55],"pressure.":[38],"It":[39],"is":[40],"found":[41],"that":[42],"best":[44],"performance":[47],"can":[48],"be":[49],"attained":[50],"if":[51],"we":[52],"choose":[53],"frequency":[60],"adequately.":[61]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}