{"id":"https://openalex.org/W2033197622","doi":"https://doi.org/10.1109/ias.2014.6978358","title":"Characteristics of contact discharge using 6GHz current probe","display_name":"Characteristics of contact discharge using 6GHz current probe","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2033197622","doi":"https://doi.org/10.1109/ias.2014.6978358","mag":"2033197622"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2014.6978358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2014.6978358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Industry Application Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037686407","display_name":"Y. Soda","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Yutaka Soda","raw_affiliation_strings":["Probetek, Atsugi-shi, Kanagawa-ken, Japan","Probetek, 2170-45 Iiyama, Atsugi-shi, Kanagawa-ken, Japan"],"affiliations":[{"raw_affiliation_string":"Probetek, Atsugi-shi, Kanagawa-ken, Japan","institution_ids":[]},{"raw_affiliation_string":"Probetek, 2170-45 Iiyama, Atsugi-shi, Kanagawa-ken, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102429077","display_name":"Tetsuji Oda","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuji Oda","raw_affiliation_strings":["University of Tokyo, Tokyo, Japan","The University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5037686407"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0867765,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.7953647375106812},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7246602773666382},{"id":"https://openalex.org/keywords/shield","display_name":"Shield","score":0.6170973777770996},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5868473052978516},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5855962634086609},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5419043898582458},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5145184397697449},{"id":"https://openalex.org/keywords/signal-edge","display_name":"Signal edge","score":0.4225432872772217},{"id":"https://openalex.org/keywords/peak-current","display_name":"Peak current","score":0.4142727553844452},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40867334604263306},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.39093124866485596},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.28169018030166626},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18613478541374207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1296168565750122},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.0825698971748352},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07306811213493347}],"concepts":[{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.7953647375106812},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7246602773666382},{"id":"https://openalex.org/C138081364","wikidata":"https://www.wikidata.org/wiki/Q852013","display_name":"Shield","level":2,"score":0.6170973777770996},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5868473052978516},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5855962634086609},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5419043898582458},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5145184397697449},{"id":"https://openalex.org/C117525741","wikidata":"https://www.wikidata.org/wiki/Q775654","display_name":"Signal edge","level":4,"score":0.4225432872772217},{"id":"https://openalex.org/C2982819079","wikidata":"https://www.wikidata.org/wiki/Q1185136","display_name":"Peak current","level":4,"score":0.4142727553844452},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40867334604263306},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.39093124866485596},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.28169018030166626},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18613478541374207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1296168565750122},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0825698971748352},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07306811213493347},{"id":"https://openalex.org/C5900021","wikidata":"https://www.wikidata.org/wiki/Q163082","display_name":"Petrology","level":1,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2014.6978358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2014.6978358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Industry Application Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1499341596","https://openalex.org/W1983814218","https://openalex.org/W2057188328","https://openalex.org/W2104225776","https://openalex.org/W2117451274","https://openalex.org/W2177301198","https://openalex.org/W2571765512"],"related_works":["https://openalex.org/W191020423","https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W2386454880","https://openalex.org/W3204740974","https://openalex.org/W2168957792","https://openalex.org/W3093527782","https://openalex.org/W2156137449","https://openalex.org/W2112391601"],"abstract_inverted_index":{"New":[0],"shield-type":[1,123],"current-probe":[2,9,124],"was":[3,35,125],"compared":[4],"to":[5,39,95,108,112,120],"a":[6],"conventional":[7],"type":[8,19],"by":[10],"measuring":[11,128],"frequency":[12],"response":[13],"and":[14,25,57,70],"TLP":[15],"pulse.":[16],"The":[17,32,42,60,79,122],"shield":[18],"current-probe,":[20],"which":[21],"provided":[22],"low":[23],"distortion":[24],"6GHz":[26],"BW,":[27],"approximated":[28],"the":[29,47,50,54,65,72,76,84,101,104,115,129],"input":[30],"waveform.":[31],"contact":[33,130],"discharge":[34],"investigated":[36],"using":[37],"4pF":[38,48,85,102],"20pF":[40,66,87],"capacitances.":[41],"current":[43,61,81],"waveforms":[44,62],"discharging":[45,63,82],"from":[46,64,83,91,110,118],"reached":[49,71],"peak":[51,73,80],"value":[52,74],"at":[53,93,98],"leading":[55,77],"edge":[56],"decayed":[58],"rapidly.":[59],"rose":[67],"up":[68],"slowly":[69],"after":[75],"edge.":[78],"or":[86],"increased":[88],"almost":[89],"proportionally":[90],"40mA":[92],"10V":[94],"over":[96],"300mA":[97],"70V.":[99],"At":[100],"capacitance":[103],"rise":[105],"time":[106],"tended":[107],"increase":[109],"50ps":[111],"150ps":[113],"as":[114],"voltage":[116],"decreased":[117],"70V":[119],"10V.":[121],"useful":[126],"for":[127],"discharge.":[131]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}