{"id":"https://openalex.org/W2175833387","doi":"https://doi.org/10.1109/ias.2010.5616786","title":"Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents","display_name":"Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents","publication_year":2010,"publication_date":"2010-10-01","ids":{"openalex":"https://openalex.org/W2175833387","doi":"https://doi.org/10.1109/ias.2010.5616786","mag":"2175833387"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2010.5616786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2010.5616786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107051156","display_name":"Xiang Luo","orcid":"https://orcid.org/0000-0002-8969-2212"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiang Luo","raw_affiliation_strings":["Shanghai Jiaotong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031051415","display_name":"Yaping Du","orcid":"https://orcid.org/0000-0003-0649-4649"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Y. Du","raw_affiliation_strings":["Hong Kong Polytechnic University, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079740901","display_name":"X. H. Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"X. H. Wong","raw_affiliation_strings":["Hong Kong Polytechnic University, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025729846","display_name":"Mingli Chen","orcid":"https://orcid.org/0000-0002-1746-0172"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"M. L. Chen","raw_affiliation_strings":["Hong Kong Polytechnic University, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5107051156"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.5773,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73968128,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9656000137329102,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tripping","display_name":"Tripping","score":0.926241397857666},{"id":"https://openalex.org/keywords/surge","display_name":"Surge","score":0.7803250551223755},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.759416937828064},{"id":"https://openalex.org/keywords/residual-current-device","display_name":"Residual-current device","score":0.7501039505004883},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.4917590916156769},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4800637662410736},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4370661675930023},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4358293116092682},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36987149715423584},{"id":"https://openalex.org/keywords/marine-engineering","display_name":"Marine engineering","score":0.3325449228286743},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15580624341964722},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.11784350872039795},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.10499966144561768},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.09647274017333984}],"concepts":[{"id":"https://openalex.org/C2779733308","wikidata":"https://www.wikidata.org/wiki/Q17146464","display_name":"Tripping","level":3,"score":0.926241397857666},{"id":"https://openalex.org/C154108245","wikidata":"https://www.wikidata.org/wiki/Q287381","display_name":"Surge","level":2,"score":0.7803250551223755},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.759416937828064},{"id":"https://openalex.org/C15116251","wikidata":"https://www.wikidata.org/wiki/Q337716","display_name":"Residual-current device","level":3,"score":0.7501039505004883},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.4917590916156769},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4800637662410736},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4370661675930023},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4358293116092682},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36987149715423584},{"id":"https://openalex.org/C199104240","wikidata":"https://www.wikidata.org/wiki/Q118291","display_name":"Marine engineering","level":1,"score":0.3325449228286743},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15580624341964722},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11784350872039795},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.10499966144561768},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.09647274017333984},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2010.5616786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2010.5616786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322598","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1793813988","https://openalex.org/W2065802861","https://openalex.org/W2123942829","https://openalex.org/W2147545053","https://openalex.org/W2406392983","https://openalex.org/W6638384804"],"related_works":["https://openalex.org/W3023415834","https://openalex.org/W4310071618","https://openalex.org/W4205923613","https://openalex.org/W2181617150","https://openalex.org/W3112690980","https://openalex.org/W2512798488","https://openalex.org/W2053947327","https://openalex.org/W3013796309","https://openalex.org/W2355823402","https://openalex.org/W2371508487"],"abstract_inverted_index":{"This":[0],"paper":[1],"presented":[2],"an":[3,12],"experimental":[4],"investigation":[5],"into":[6],"operating":[7],"characteristics":[8],"of":[9,42,80],"RCDs":[10,88,116,131],"under":[11,59],"unbalanced":[13,16,82],"current.":[14,27,83,122],"The":[15],"current":[17,44,104,127],"included":[18],"the":[19,36,39,43,77,81,101,106],"harmonic":[20],"current,":[21,24],"ground":[22,86],"fault":[23,87],"and":[25,38],"surge":[26,114,126],"A":[28],"testing":[29,55],"system":[30],"was":[31],"first":[32],"set":[33],"up":[34],"in":[35,90,105],"laboratory,":[37],"minimum":[40],"value":[41,79],"causing":[45],"RCD":[46,57,71],"samples":[47,58],"to":[48,64,99,108,132],"trip":[49],"were":[50,61],"recorded.":[51],"To":[52],"obtain":[53],"consistent":[54],"results,":[56],"test":[60],"demagnetized":[62],"prior":[63],"each":[65],"test.":[66],"It":[67,95],"is":[68,73],"found":[69],"that":[70],"tripping":[72],"primarily":[74],"determined":[75],"by":[76],"peak":[78],"Under":[84,113],"a":[85,119,124],"installed":[89],"healthy":[91],"circuits":[92,107],"may":[93],"trip.":[94,133],"would":[96],"be":[97],"necessary":[98],"limit":[100],"maximum":[102],"leakage":[103],"avoid":[109],"such":[110],"nuisance":[111],"tripping.":[112],"conditions":[115],"could":[117],"withstand":[118],"large":[120],"short-duration":[121],"However,":[123],"long-duration":[125],"can":[128],"easily":[129],"cause":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}