{"id":"https://openalex.org/W2151123676","doi":"https://doi.org/10.1109/ias.2009.5325175","title":"The Low Voltage Electrostatic Discharge on the Contacting Point","display_name":"The Low Voltage Electrostatic Discharge on the Contacting Point","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W2151123676","doi":"https://doi.org/10.1109/ias.2009.5325175","mag":"2151123676"},"language":"en","primary_location":{"id":"doi:10.1109/ias.2009.5325175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2009.5325175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102429077","display_name":"Tetsuji Oda","orcid":null},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tetsuji Oda","raw_affiliation_strings":["Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083500333","display_name":"Hiraku Miyasaka","orcid":null},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiraku Miyasaka","raw_affiliation_strings":["Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048597080","display_name":"Yuto Ono","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuto Ono","raw_affiliation_strings":["Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022699919","display_name":"Ryo Ono","orcid":"https://orcid.org/0000-0003-0105-5399"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryo Ono","raw_affiliation_strings":["Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102429077"],"corresponding_institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":0.2991,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65381385,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9815999865531921,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.7899186611175537},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6981692910194397},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6509220004081726},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5698395371437073},{"id":"https://openalex.org/keywords/brush-discharge","display_name":"Brush discharge","score":0.568851113319397},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5673086047172546},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5427643656730652},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.529442310333252},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4835331439971924},{"id":"https://openalex.org/keywords/electric-discharge","display_name":"Electric discharge","score":0.4379664659500122},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.43566423654556274},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.42686188220977783},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.4151581823825836},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3942551612854004},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.34026145935058594},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.33892619609832764},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2253473699092865},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11122402548789978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09594264626502991}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.7899186611175537},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6981692910194397},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6509220004081726},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5698395371437073},{"id":"https://openalex.org/C180768130","wikidata":"https://www.wikidata.org/wiki/Q4979712","display_name":"Brush discharge","level":4,"score":0.568851113319397},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5673086047172546},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5427643656730652},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.529442310333252},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4835331439971924},{"id":"https://openalex.org/C89508514","wikidata":"https://www.wikidata.org/wiki/Q488071","display_name":"Electric discharge","level":3,"score":0.4379664659500122},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.43566423654556274},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.42686188220977783},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.4151581823825836},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3942551612854004},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.34026145935058594},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.33892619609832764},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2253473699092865},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11122402548789978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09594264626502991},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ias.2009.5325175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2009.5325175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Industry Applications Society Annual Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/6","display_name":"Clean water and sanitation","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2057188328","https://openalex.org/W2109377868","https://openalex.org/W2132017935"],"related_works":["https://openalex.org/W2979278589","https://openalex.org/W2241977190","https://openalex.org/W2358483761","https://openalex.org/W4285524982","https://openalex.org/W2326050169","https://openalex.org/W2388687571","https://openalex.org/W1945855309","https://openalex.org/W2135552027","https://openalex.org/W2062472234","https://openalex.org/W2005248981"],"abstract_inverted_index":{"A":[0],"very":[1],"low":[2],"voltage":[3,47],"electrostatic":[4,53,74],"discharge":[5,24,54,59,75],"phenol-menon":[6],"is":[7,27,55],"analyzed":[8,28],"by":[9],"using":[10],"a":[11,19],"small":[12,20],"storage":[13],"capacitor":[14],"of":[15,48,68],"2.2":[16],"pF":[17],"and":[18,29,38,60,77],"relay.":[21],"The":[22,65],"contact":[23,34,52,70],"current":[25,62,76],"waveform":[26],"equivalent":[30],"parameters":[31],"such":[32],"as":[33,57],"resistance,":[35],"line":[36],"inductance":[37],"total":[39],"capacitance,":[40],"are":[41,81],"estimated.":[42],"By":[43],"changing":[44],"the":[45,49,51,69,73,78],"charging":[46],"capacitor,":[50],"identified":[56],"gas-ionization":[58],"tunnel":[61],"discharge,":[63],"experimentally.":[64],"corrosion":[66],"effect":[67],"electrodes":[71],"on":[72],"optical":[79],"emission":[80],"also":[82],"examined.":[83]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}