{"id":"https://openalex.org/W4412966234","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079191","title":"Anomaly Detection of Shielded Cable via Time\u2013Frequency-based Greedy Search Algorithm","display_name":"Anomaly Detection of Shielded Cable via Time\u2013Frequency-based Greedy Search Algorithm","publication_year":2025,"publication_date":"2025-05-19","ids":{"openalex":"https://openalex.org/W4412966234","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079191"},"language":null,"primary_location":{"id":"doi:10.1109/i2mtc62753.2025.11079191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063770674","display_name":"Hobin Lim","orcid":"https://orcid.org/0000-0003-2385-7413"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hobin Lim","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jaeyong Ahn","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyong Ahn","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044448641","display_name":"Kang-Hyun Jo","orcid":"https://orcid.org/0000-0002-4937-7082"},"institutions":[{"id":"https://openalex.org/I2802978839","display_name":"Korea Naval Academy","ror":"https://ror.org/0491qwe57","country_code":"KR","type":"education","lineage":["https://openalex.org/I2802978839"]},{"id":"https://openalex.org/I60922564","display_name":"Naver (South Korea)","ror":"https://ror.org/04nzrnx83","country_code":"KR","type":"company","lineage":["https://openalex.org/I60922564"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungyoon Jo","raw_affiliation_strings":["Republic of Korea Navy,Jinhae,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Republic of Korea Navy,Jinhae,Republic of Korea","institution_ids":["https://openalex.org/I2802978839","https://openalex.org/I60922564"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041578979","display_name":"Yong\u2013June Shin","orcid":"https://orcid.org/0000-0001-8567-2567"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-June Shin","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5063770674"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16959466,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9830999970436096,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shielded-cable","display_name":"Shielded cable","score":0.8623744249343872},{"id":"https://openalex.org/keywords/greedy-algorithm","display_name":"Greedy algorithm","score":0.5827552080154419},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.553420901298523},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5140610933303833},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.4476739168167114},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21183070540428162},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18502160906791687}],"concepts":[{"id":"https://openalex.org/C77590175","wikidata":"https://www.wikidata.org/wiki/Q3506009","display_name":"Shielded cable","level":2,"score":0.8623744249343872},{"id":"https://openalex.org/C51823790","wikidata":"https://www.wikidata.org/wiki/Q504353","display_name":"Greedy algorithm","level":2,"score":0.5827552080154419},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.553420901298523},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5140610933303833},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.4476739168167114},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21183070540428162},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18502160906791687}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc62753.2025.11079191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2050551055","https://openalex.org/W2116148865","https://openalex.org/W2151693816","https://openalex.org/W2157060392","https://openalex.org/W2158937277","https://openalex.org/W2166252671","https://openalex.org/W2188563164","https://openalex.org/W3016541735","https://openalex.org/W3029307258","https://openalex.org/W3178964350"],"related_works":["https://openalex.org/W4387497383","https://openalex.org/W3183948672","https://openalex.org/W3173606202","https://openalex.org/W3110381201","https://openalex.org/W2948807893","https://openalex.org/W2899084033","https://openalex.org/W2778153218","https://openalex.org/W2758277628","https://openalex.org/W2748952813","https://openalex.org/W1531601525"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-08-05T00:00:00"}