{"id":"https://openalex.org/W4412963990","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079177","title":"Black-box conformity tests on regulated measuring instruments: A machine learning approach","display_name":"Black-box conformity tests on regulated measuring instruments: A machine learning approach","publication_year":2025,"publication_date":"2025-05-19","ids":{"openalex":"https://openalex.org/W4412963990","doi":"https://doi.org/10.1109/i2mtc62753.2025.11079177"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc62753.2025.11079177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079177","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065648936","display_name":"Levin Chee Xian Ho","orcid":"https://orcid.org/0000-0002-7560-5456"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Levin Chee Xian Ho","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030905363","display_name":"Marko Esche","orcid":"https://orcid.org/0009-0001-7110-5665"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marko Esche","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003132721","display_name":"Martin Nischwitz","orcid":"https://orcid.org/0009-0002-5488-5820"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Nischwitz","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt,Dep. Metrological IT,Berlin,Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017296585","display_name":"Sabine Glesner","orcid":"https://orcid.org/0009-0003-6946-3257"},"institutions":[{"id":"https://openalex.org/I4210145666","display_name":"Embedded Systems (United States)","ror":"https://ror.org/04742eh45","country_code":"US","type":"company","lineage":["https://openalex.org/I4210145666"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sabine Glesner","raw_affiliation_strings":["Software and Embedded Systems Engineering Technische Universität Berlin,Berlin,Germany"],"affiliations":[{"raw_affiliation_string":"Software and Embedded Systems Engineering Technische Universität Berlin,Berlin,Germany","institution_ids":["https://openalex.org/I4210145666"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5065648936"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":6.2637,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.96131477,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12072","display_name":"Machine Learning and Algorithms","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12072","display_name":"Machine Learning and Algorithms","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/conformity","display_name":"Conformity","score":0.6878196001052856},{"id":"https://openalex.org/keywords/black-box","display_name":"Black box","score":0.675288200378418},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5874578356742859},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5006504058837891},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45475637912750244},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.119060218334198},{"id":"https://openalex.org/keywords/social-psychology","display_name":"Social psychology","score":0.07116332650184631}],"concepts":[{"id":"https://openalex.org/C142172996","wikidata":"https://www.wikidata.org/wiki/Q221284","display_name":"Conformity","level":2,"score":0.6878196001052856},{"id":"https://openalex.org/C94966114","wikidata":"https://www.wikidata.org/wiki/Q29256","display_name":"Black box","level":2,"score":0.675288200378418},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5874578356742859},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5006504058837891},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45475637912750244},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.119060218334198},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.07116332650184631}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc62753.2025.11079177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11079177","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1989445634","https://openalex.org/W1994584977","https://openalex.org/W2062143900","https://openalex.org/W2064689414","https://openalex.org/W2075773711","https://openalex.org/W4297094130","https://openalex.org/W4312268502","https://openalex.org/W4387608608","https://openalex.org/W4390503624","https://openalex.org/W4398234076","https://openalex.org/W4400114394"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W4387369504","https://openalex.org/W4394896187","https://openalex.org/W3170094116","https://openalex.org/W4386462264","https://openalex.org/W3107602296","https://openalex.org/W4364306694","https://openalex.org/W4312192474","https://openalex.org/W4283697347"],"abstract_inverted_index":{"The":[0],"conformity":[1,34,144],"of":[2,40,72,79,114,127],"modern":[3],"measuring":[4,25,128],"instruments":[5,26,129],"regulated":[6,66],"with":[7,120],"legal":[8],"requirements":[9],"is":[10,48],"usually":[11],"demonstrated":[12],"by":[13,96],"verifying":[14],"software":[15,93,132,141],"version":[16],"numbers":[17],"and":[18,45,60,98,117,134],"cryptographic":[19],"hashes":[20],"over":[21],"executable":[22],"binaries.":[23],"Regulated":[24],"in":[27,42,63,82,106],"Legal":[28],"Metrology":[29],"could":[30,130],"also":[31,110],"pass":[32],"this":[33,87],"test,":[35],"if":[36],"the":[37,43,54,70,77,112,115,140],"functional":[38],"behavior":[39],"devices":[41,73],"field":[44],"certified":[46],"prototype":[47],"identical,":[49],"thereby":[50],"giving":[51],"rise":[52],"to":[53],"need":[55],"for":[56,142],"more":[57],"efficient":[58],"monitoring":[59,94],"identification":[61],"methods":[62],"many":[64],"legally":[65],"industries,":[67],"especially":[68],"when":[69],"functionalities":[71],"remain":[74],"hidden":[75],"from":[76],"view":[78],"authorities,":[80],"i.e.,":[81],"black":[83],"box":[84],"scenarios.":[85],"In":[86],"paper,":[88],"we":[89],"extend":[90],"a":[91,100],"risk-based":[92],"algorithm":[95,103,116],"developing":[97],"integrating":[99],"model":[101],"learning":[102],"that":[104],"works":[105],"quasi-black-box":[107],"settings.":[108],"We":[109],"analyze":[111],"performance":[113],"compare":[118],"it":[119],"state-of-the-art":[121],"approaches.":[122],"If":[123],"successfully":[124],"implemented,":[125],"manufacturers":[126],"introduce":[131],"updates":[133],"monitor":[135],"potential":[136],"abnormalities,":[137],"without":[138],"resubmitting":[139],"new":[143],"assessment":[145],"or":[146],"certification.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}