{"id":"https://openalex.org/W4412964219","doi":"https://doi.org/10.1109/i2mtc62753.2025.11078996","title":"Impact of Flange Offsets in Clamped Rectangular and Clamped Circular Waveguide Measurement Methods","display_name":"Impact of Flange Offsets in Clamped Rectangular and Clamped Circular Waveguide Measurement Methods","publication_year":2025,"publication_date":"2025-05-19","ids":{"openalex":"https://openalex.org/W4412964219","doi":"https://doi.org/10.1109/i2mtc62753.2025.11078996"},"language":null,"primary_location":{"id":"doi:10.1109/i2mtc62753.2025.11078996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11078996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111242136","display_name":"Trent Moritz","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Trent Moritz","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080014915","display_name":"Matthew Dvorsky","orcid":"https://orcid.org/0000-0001-7522-092X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matthew Dvorsky","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5056331912","display_name":"Mohammad Tayeb Al Qaseer","orcid":"https://orcid.org/0000-0001-6003-5078"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mohammad Tayeb Al Qaseer","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111242136"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7386,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.75044164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flange","display_name":"Flange","score":0.8231317400932312},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5293099880218506},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.47471439838409424},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4441503584384918},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.35662782192230225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2559832036495209},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16967186331748962},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16932600736618042},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.16117316484451294}],"concepts":[{"id":"https://openalex.org/C2778417280","wikidata":"https://www.wikidata.org/wiki/Q955957","display_name":"Flange","level":2,"score":0.8231317400932312},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5293099880218506},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.47471439838409424},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4441503584384918},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.35662782192230225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2559832036495209},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16967186331748962},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16932600736618042},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.16117316484451294}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc62753.2025.11078996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc62753.2025.11078996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1559802847","https://openalex.org/W2014087254","https://openalex.org/W2101189020","https://openalex.org/W2314480183","https://openalex.org/W3085643842","https://openalex.org/W4225334642","https://openalex.org/W4400114648"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2069276162","https://openalex.org/W2330046996","https://openalex.org/W2385970752","https://openalex.org/W2360270064","https://openalex.org/W2065444166","https://openalex.org/W2358998696","https://openalex.org/W3046042600","https://openalex.org/W2369499744","https://openalex.org/W2379515021"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-08-05T00:00:00"}