{"id":"https://openalex.org/W4400114674","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561243","title":"A 3D Reconstruction Method for Complex Defects Based on MFD and Multidirectional MFL","display_name":"A 3D Reconstruction Method for Complex Defects Based on MFD and Multidirectional MFL","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114674","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561243"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10561243","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc60896.2024.10561243","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060601026","display_name":"Shenaping Li","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shenaping Li","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China"],"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100436785","display_name":"Jie Zhang","orcid":"https://orcid.org/0000-0002-6547-1570"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Zhang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China"],"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101797887","display_name":"Xu Zhang","orcid":"https://orcid.org/0009-0006-0447-0474"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Zhang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China"],"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033029938","display_name":"Chunrui Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunrui Feng","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China"],"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063242124","display_name":"Libing Bai","orcid":"https://orcid.org/0000-0001-8906-0576"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Libing Bai","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China"],"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5060601026"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.2246,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45866043,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5556716322898865},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3707563281059265}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5556716322898865},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3707563281059265}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10561243","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc60896.2024.10561243","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.6000000238418579,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1674003814","https://openalex.org/W1974735879","https://openalex.org/W1975096300","https://openalex.org/W1989832318","https://openalex.org/W2001645194","https://openalex.org/W2058441197","https://openalex.org/W2071804921","https://openalex.org/W2108321865","https://openalex.org/W2113986425","https://openalex.org/W2335106240","https://openalex.org/W2892897334","https://openalex.org/W2893958823","https://openalex.org/W2911654308","https://openalex.org/W3038309809","https://openalex.org/W3127596366","https://openalex.org/W4307388620","https://openalex.org/W4309456745"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109"],"abstract_inverted_index":{"Magnetic":[0],"flux":[1],"leakage":[2],"(MFL)":[3],"detection":[4],"is":[5,23,37,50,81,98,111],"a":[6,68,128,140],"widely":[7],"used":[8],"non-destructive":[9],"testing":[10],"method":[11,72,84,110,160],"for":[12,179],"ferromagnetic":[13],"materials.":[14],"In":[15,30,65],"the":[16,26,32,54,59,95,114,121,133,146,149,154,159,163],"field":[17,76],"of":[18,25,35,124,148,166],"research,":[19],"3D":[20,55,69,164],"profile":[21,34,56,61,70,90,97,116,151,165],"reconstruction":[22,174],"one":[24],"most":[27],"important":[28],"concerns.":[29],"practice,":[31],"opening":[33,60,89,150],"de-fects":[36],"complex":[38],"and":[39,46,62,79,152,168],"can":[40,131,143,161],"easily":[41],"lead":[42],"to":[43,52,170],"information":[44],"loss":[45],"signal":[47],"distortion.":[48],"It":[49,119],"difficult":[51],"reconstruct":[53,162],"without":[57],"considering":[58],"magnetization":[63],"directions.":[64],"this":[66],"paper,":[67],"inversion":[71,117,122],"that":[73,130,158],"combines":[74,120],"magnetic":[75],"disturbance":[77],"(MFD)":[78],"MFL":[80,101,136],"proposed.":[82],"This":[83],"obtains":[85],"an":[86],"accurate":[87],"defect":[88],"by":[91],"using":[92,100],"MFD.":[93],"Then,":[94],"depth":[96,115],"reconstructed":[99],"signals":[102,137],"acquired":[103],"from":[104],"two":[105,125,135],"orthogonal":[106],"magnetizations.":[107],"The":[108],"pseudo-inverse":[109],"applied":[112],"as":[113],"algorithm.":[118],"equation":[123],"directions,":[126],"finding":[127],"solution":[129],"fulfill":[132],"inputted":[134],"simultaneously.":[138],"Such":[139],"two-step":[141],"process":[142],"help":[144],"consider":[145],"influence":[147],"complete":[153],"information.":[155],"Experiments":[156],"show":[157],"defects":[167],"reach":[169],"minimal":[171],"0.307":[172],"in":[173],"error.":[175],"Which":[176],"exhibits":[177],"potential":[178],"nractical":[180],"applications,":[181]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}