{"id":"https://openalex.org/W4400114591","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561022","title":"Accelerated Aging Quantification of XL-ETFE Wires in Low Pressure Aircraft Environments","display_name":"Accelerated Aging Quantification of XL-ETFE Wires in Low Pressure Aircraft Environments","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114591","doi":"https://doi.org/10.1109/i2mtc60896.2024.10561022"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10561022","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10561022","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://upcommons.upc.edu/bitstreams/d22dddfd-3004-4008-a9e8-e12bdc8d176c/download","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016029051","display_name":"Pau Bas-Calopa","orcid":"https://orcid.org/0000-0002-7373-4609"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pau Bas-Calopa","raw_affiliation_strings":["Universitat Politècnica de Catalunya,Electrical Engineering Department,Terrassa,Spain"],"affiliations":[{"raw_affiliation_string":"Universitat Politècnica de Catalunya,Electrical Engineering Department,Terrassa,Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005977069","display_name":"Jordi\u2010Roger Riba","orcid":"https://orcid.org/0000-0001-8774-2389"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jordi-Roger Riba","raw_affiliation_strings":["Universitat Politècnica de Catalunya,Electrical Engineering Department,Terrassa,Spain"],"affiliations":[{"raw_affiliation_string":"Universitat Politècnica de Catalunya,Electrical Engineering Department,Terrassa,Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034856013","display_name":"Manuel Moreno\u2010Eguilaz","orcid":"https://orcid.org/0000-0001-6086-7034"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Manuel Moreno-Eguilaz","raw_affiliation_strings":["Universitat Politècnica de Catalunya,Electronics Engineering Department,Terrassa,Spain"],"affiliations":[{"raw_affiliation_string":"Universitat Politècnica de Catalunya,Electronics Engineering Department,Terrassa,Spain","institution_ids":["https://openalex.org/I9617848"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034856013"],"corresponding_institution_ids":["https://openalex.org/I9617848"],"apc_list":null,"apc_paid":null,"fwci":0.1156,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.37947244,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/etfe","display_name":"ETFE","score":0.8272240161895752},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.46706515550613403},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.43960827589035034},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4161505103111267},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3517334461212158},{"id":"https://openalex.org/keywords/aeronautics","display_name":"Aeronautics","score":0.34154197573661804},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3045266270637512},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16231921315193176}],"concepts":[{"id":"https://openalex.org/C2776221354","wikidata":"https://www.wikidata.org/wiki/Q144893","display_name":"ETFE","level":3,"score":0.8272240161895752},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.46706515550613403},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.43960827589035034},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4161505103111267},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3517334461212158},{"id":"https://openalex.org/C178802073","wikidata":"https://www.wikidata.org/wiki/Q8421","display_name":"Aeronautics","level":1,"score":0.34154197573661804},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3045266270637512},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16231921315193176},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10561022","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10561022","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:upcommons.upc.edu:2117/411606","is_oa":true,"landing_page_url":"https://hdl.handle.net/2117/411606","pdf_url":"https://upcommons.upc.edu/bitstreams/d22dddfd-3004-4008-a9e8-e12bdc8d176c/download","source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:upcommons.upc.edu:2117/411606","is_oa":true,"landing_page_url":"https://hdl.handle.net/2117/411606","pdf_url":"https://upcommons.upc.edu/bitstreams/d22dddfd-3004-4008-a9e8-e12bdc8d176c/download","source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1650125035","display_name":null,"funder_award_id":"B-I00","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G2988851988","display_name":null,"funder_award_id":"2021 SGR 00392","funder_id":"https://openalex.org/F4320321505","funder_display_name":"Generalitat de Catalunya"},{"id":"https://openalex.org/G5805502524","display_name":null,"funder_award_id":"PID2020","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G6589649124","display_name":null,"funder_award_id":"PID2020-","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G6728378316","display_name":null,"funder_award_id":"PID2020-114240RB-I00","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"}],"funders":[{"id":"https://openalex.org/F4320321505","display_name":"Generalitat de Catalunya","ror":"https://ror.org/01bg62x04"},{"id":"https://openalex.org/F4320322930","display_name":"Ministerio de Ciencia e Innovaci\u00f3n","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4400114591.pdf"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W2061576461","https://openalex.org/W2098557600","https://openalex.org/W2107561116","https://openalex.org/W2112050963","https://openalex.org/W2120011698","https://openalex.org/W2145016276","https://openalex.org/W2373859878","https://openalex.org/W2896920949","https://openalex.org/W2990413877","https://openalex.org/W2993236495","https://openalex.org/W3112277878","https://openalex.org/W3134882313","https://openalex.org/W4206757511","https://openalex.org/W4213457625","https://openalex.org/W4214545100","https://openalex.org/W4293415126","https://openalex.org/W6987793739"],"related_works":["https://openalex.org/W2549118279","https://openalex.org/W2755808684","https://openalex.org/W4366436561","https://openalex.org/W3088889394","https://openalex.org/W2085583019","https://openalex.org/W3138134523","https://openalex.org/W2357567358","https://openalex.org/W2053734929","https://openalex.org/W791062247","https://openalex.org/W4293428542"],"abstract_inverted_index":{"Most":[0],"international":[1],"standards":[2],"for":[3,9,116,184],"the":[4,43,55,74,79,83,86,90,93,97,121,125,133,136,139,157,160,169,193],"qualification":[5],"of":[6,38,76,78,89,107,135,159,172,181,189],"insulated":[7,161],"wires":[8,24,56],"aerospace":[10,194],"applications":[11],"are":[12,70],"based":[13],"on":[14,45],"degradation":[15,77,88,158],"tests":[16],"performed":[17],"under":[18,61],"standard":[19],"pressure":[20,28,63,170],"conditions.":[21,64],"However,":[22],"some":[23],"must":[25],"withstand":[26],"low":[27,62],"conditions":[29],"in":[30,42,141,168,192],"unpressurized":[31],"areas,":[32],"and":[33,40,57,92,119,145,186,196],"there":[34],"is":[35,202],"a":[36,51,104,178],"lack":[37],"data":[39],"experience":[41],"literature":[44],"this":[46,100,117],"subject.":[47],"This":[48],"paper":[49],"proposes":[50],"method":[52],"to":[53,72,103,131,155],"test":[54],"evaluate":[58,156],"their":[59],"performance":[60],"In":[65],"addition,":[66],"two":[67,150],"optical":[68,111,151,182],"methods":[69],"evaluated":[71],"quantify":[73],"degree":[75],"insulation.":[80,137],"By":[81],"analyzing":[82],"relationship":[84],"between":[85],"electrical":[87],"insulation":[91,190,200],"light":[94,122,146],"emitted":[95,123],"by":[96,124,149],"surface":[98,126],"discharges,":[99],"study":[101],"contributes":[102],"better":[105],"understanding":[106],"how":[108,120],"commercially":[109],"available":[110],"sensors":[112,152,183],"can":[113,128],"be":[114,129],"used":[115,130,154],"purpose":[118],"discharges":[127],"determine":[132],"condition":[134],"Specifically,":[138],"change":[140],"corona":[142],"inception":[143],"voltage":[144],"intensity":[147],"detected":[148],"was":[153],"wire":[162],"samples":[163],"analyzed.":[164],"The":[165],"results":[166],"presented":[167],"range":[171],"100":[173],"-":[174],"16":[175],"kPa":[176],"indicate":[177],"potential":[179],"application":[180],"inspection":[185],"predictive":[187],"maintenance":[188],"systems":[191],"industry":[195],"other":[197],"sectors":[198],"where":[199],"integrity":[201],"critical.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}